Abstract:
A microelectronic package (100) can include a plurality of vertically stacked semiconductor chips 632, 637, the front face of at least one chip facing away from a first substrate surface (108), one or more columns (138, 143) of contacts (132) extending in a first direction (142) along surface (108). Columns (104A, 107B, 109A, 109B) of terminals (105 107) exposed at a second substrate surface (110) extend in the first direction. First terminals (105) disposed in a central region (112) of surface (110) which has width (152) not more than three and one-half times a minimum pitch (150) of the columns of terminals can be configured to carry address information usable to determine an addressable memory location. An axial plane of the at least one semiconductor chip can intersect the central region.
Abstract:
A microelectronic element (101) having memory storage array function has a front face (105) facing away from a substrate (102) of a microelectronic package (100), and is electrically connected with the substrate through conductive structure (112) extending above the front face (105). First terminals (104) are disposed at locations within first and second sets (114, 124) thereof disposed on respective first and second opposite sides of a theoretical axis (132). The first terminals of each set are configured to carry address information usable to determine an addressable memory location of a memory storage array of the microelectronic element. The first terminals in the first set (114) have signal assignments which are a mirror image of the signal assignments of the first terminals in the second set (124).
Abstract:
A microelectronic package (100) can include a substrate (102) and a microelectronic element (130) having a face (134) and one or more columns (138, 140) of contacts (132) exposed thereat which face and are joined to corresponding contacts exposed at a surface (120) of the substrate. An axial plane (140) may intersect the face along a line in a first direction (142) and centered relative to the columns of element contacts (132). Columns (104A, 105B) of package terminals can extend in the first direction. First terminals exposed at a central region (112) of the second surface can be configured to carry address information usable to determine an addressable memory location within the microelectronic element. The central region (112) may have a width (152) not more than three and one-half times a minimum pitch (150) between the columns of package terminals. The axial plane can intersect the central region.
Abstract:
A microelectronic package 100 includes a microelectronic element 101 having a memory storage array. Terminals 104 on a surface 110 of a substrate 102 are configured for connection to an external component. Substrate contacts 121 exposed at an opposite surface 108 of the substrate 102 face and are joined to element contacts 111 of the microelectronic element 101. The terminals can include first terminals 104 arranged at positions within first and second sets 114, 124 thereof disposed on respective opposite sides of a theoretical axis 132. Each set of first terminals 104 can be configured to carry address information usable by circuitry within the microelectronic package 100 to determine an addressable memory location in the memory storage array. The signal assignments of the first terminals 104 in the first set 114 can be a mirror image of the signal assignments of the first terminals in the second set 124.
Abstract:
A microelectronic package (10) can include a substrate (20) having first and second opposed surfaces (21, 22), first, second, third, and fourth microelectronic elements (30a, 30b, 30c, 30d), and terminals (25) exposed at the second surface. Each microelectronic element (30) can have a front surface (31) facing the first surface (21) of the substrate (20) and a plurality of contacts (35) at the front surface. The front surfaces (31) of the microelectronic elements (30) can be arranged in a single plane parallel to and overlying the first surface (21). Each microelectronic element (30) can have a column of contacts (35) exposed at the front surface and arranged along respective first, second, third, and fourth axes (29a, 29b, 29c, 29d). The first and third axes (29a, 29c) can be parallel to one another. The second and fourth axes (29b, 29d) can be transverse to the first and third axes (29a, 29c).
Abstract:
A microelectronic device may include a substrate, a first chip on the substrate, and a second chip on the substrate. A plurality of pillars may be located between the first chip and the second chip, wherein a first end of each pillar of the plurality of pillars is adjacent to the substrate. A spacing among the plurality of pillars is at least equal to a distance sufficient to block electromagnetic interference (EMI) and/or radio frequency interference (RFI) between the first chip and the second chip. The microelectronic device may also include a cover over at least the first chip, the second chip, and the plurality of pillars, wherein a second end of each pillar of the plurality of pillars is at least adjacent to a trench defined within the cover. The trench may include a conductive material therein.
Abstract:
Techniques and mechanisms for coupling chiplets to microchips utilizing active bridges. The active bridges include circuits that provide various functions and capabilities that previously may have been located on the microchips and/or the chiplets. Furthermore, the active bridges may be coupled to the microchips and the chiplets via "native interconnects" utilizing direct bonding techniques. Utilizing the active bridges and the direct bonding techniques of the active bridges to the microchips and the chiplets, the pitch for the interconnects can be greatly reduced going from a pitch in the millimeters to a fine pitch that may be in a range of less than one micron to approximately five microns.
Abstract:
Techniques are disclosed herein for connecting multiple chips using an interconnect device. In some configurations, one or more interconnect areas on a chip can be located adjacent to each other such that at least a portion of an edge of a first interconnect area is located adjacent to an edge of a second interconnect area. For example, an interconnect area can be located at a corner of a chip such that one or more edges of the interconnect area lines up with one or more edges of an interconnect area of another chip. The chip including at least one interconnect area can also be positioned and directly bonded to the interconnect device using other layouts, such as but not limited to a pinwheel layout. In some configurations more than one interconnect area can be included on a chip.
Abstract:
The technology relates to a system on chip (SoC). The SoC may include a plurality of network layers which may assist electrical communications either horizontally or vertically among components from different device layers. In one embodiment, a system on chip (SoC) includes a plurality of network layers, each network layer including one or more routers, and more than one device layers, each of the plurality of network layers respectively bonded to one of the device layers. In another embodiment, a method for forming a system on chip (SoC) includes forming a plurality of network layers in an interconnect, wherein each network layer is bonded to an active surface of a respective device layer in a plurality of device layer.
Abstract:
A stacked, multi-layer transmission line is provided. The stacked transmission line includes at least a pair of conductive traces, each conductive trace having a plurality of conductive stubs electrically coupled thereto. The stubs are disposed in one or more separate spatial layers from the conductive traces.