PROBE CARD CONFIGURATION FOR LOW MECHANICAL FLEXURAL STRENGTH ELECTRICAL ROUTING SUBSTRATES
    3.
    发明申请
    PROBE CARD CONFIGURATION FOR LOW MECHANICAL FLEXURAL STRENGTH ELECTRICAL ROUTING SUBSTRATES 审中-公开
    低机械强度电气路由基板的探针卡配置

    公开(公告)号:WO2005069914A2

    公开(公告)日:2005-08-04

    申请号:PCT/US2005001551

    申请日:2005-01-18

    CPC classification number: G01R31/2889 G01R1/07378

    Abstract: A mechanical support configuration for a probe card of a wafer test system is provided to increase support for a very low flexural strength substrate that supports spring probes. Increased mechanical support is provided by: (1) a frame around the periphery of the substrate having an increased sized horizontal extension over the surface of the substrate; (2) leaf springs with a bend enabling the leaf springs to extend vertically and engage the inner frame closer to the spring probes; (3) an insulating flexible membrane, or load support member machined into the inner frame, to engage the low flexural strength substrate farther away from its edge; (4) a support structure, such as support pins, added to provide support to counteract probe loading near the center of the space transformer substrate; and/or (5) a highly rigid interface

    Abstract translation: 提供了用于晶片测试系统的探针卡的机械支撑结构,以增加对支撑弹簧探针的极低弯曲强度基底的支撑。 通过以下方式提供增加的机械支撑:(1)围绕基板的周边的框架,在基板的表面上具有增大尺寸的水平延伸; (2)具有弯曲的板簧,使得板簧能够垂直延伸并使内框架接近弹簧探针; (3)绝缘柔性膜或加工到内框架中的负载支撑构件,使低弯曲强度基板与其边缘更远地接合; (4)加载支撑结构,例如支撑销,以提供支撑以抵消在空间变压器基板的中心附近的探针负载; 和/或(5)高刚性界面

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