METHOD AND APPARATUS FOR TESTING ERROR CORRECTING CODE (ECC) FUNCTION OF FPGA ON-CHIP BLOCK RANDOM ACCESS MEMORY (BRAM)

    公开(公告)号:US20240275406A1

    公开(公告)日:2024-08-15

    申请号:US18438380

    申请日:2024-02-09

    IPC分类号: H03M13/11 G11C29/08 H03M13/00

    摘要: A system and method for testing Error Correcting Code (“ECC”) function of Field Programmable Gate Array (“FPGA”) on-chip block random access memory (“BRAM”) includes control modules, at least two BRAMs with ECC function and sequentially connected to form a ring, and parity bit comparison modules corresponding to each BRAM. Each parity bit comparison module is connected to its corresponding BRAM and the next adjacent BRAM. The control module is used to send data read and write test instructions to each BRAM. Each BRAM is used to read test data sequentially, write test data into next adjacent BRAM whenever the test data is read, and send the first parity bit generated during reading to the corresponding parity bit comparison module. Each parity bit comparison module is used to compare the first and second parity bits, where the second parity bit is generated during the writing of test data. The embodiments of the present invention reduce the required test stimuli and the interactions with upper computer ports, which enhances the test efficiency.

    Method and system for providing FPGA device identification via a set of embedded signature registers

    公开(公告)号:US11843377B2

    公开(公告)日:2023-12-12

    申请号:US17699043

    申请日:2022-03-18

    发明人: Jinghui Zhu

    IPC分类号: H03K19/17728 H03K19/173

    摘要: A programmable integrated circuit (“PIC”) device includes configurable logic blocks (“LBs”), routing connections, and configuration memory for performing user defined programmed logic functions. Each configurable LB, in one example, includes a set of lookup tables (“LUTs”) and associated registers. The LUTs, for example, are configured to generate one or more output signals in accordance with a set of input signals. The registers are arranged so that each register corresponds to one LUT. In one embodiment, a group of registers, instead of assigning to a group of LUTs across multiple configurable LBs, is allocated or configured as embedded signature registers in PSD. For example, a first register which corresponds or physically situated in the vicinity of first LUT can be designated as an embedded signature register for storing a fixed value or signature information for facilitating device or IC identification.

    METHOD AND SYSTEM FOR ENHANCING PROGRAMMABILITY OF A FIELD PROGRAMMABLE GATE ARRAY

    公开(公告)号:US20230297259A1

    公开(公告)日:2023-09-21

    申请号:US18203059

    申请日:2023-05-30

    IPC分类号: G06F3/06 G06F9/4401

    摘要: A programmable semiconductor system includes a programmable integrated circuit (“PIC”) and storage capable of facilitating a multi-boot with backup default configuration (“MBC”) process. The PIC, in one embodiment, includes configurable logic blocks (“LBs”), routing connections, and a configuration memory for performing logic functions. The storage includes a first and a second memory. While the first memory stores a user configuration data representing user-defined logic functions, the second memory stores a backup default page (“BDP”) containing default configuration data (“DCD”) for programming or booting PIC to its default setting when the user configuration data fails to boot or program PIC. In one aspect, the user configuration data contains the address of the second memory containing DCD.

    METHOD AND SYSTEM FOR AUTOMATIC DETECTION AND RECOGNITION OF A DIGITAL IMAGE

    公开(公告)号:US20230103119A1

    公开(公告)日:2023-03-30

    申请号:US17489749

    申请日:2021-09-29

    摘要: An automatic measuring system containing configurable integrated circuits is able to process information via captured images. The automatic measuring system includes a metering instrument, a camera, a recognition module, and a localization module. The metering instrument has at least one display for visually displaying a number and measures the amount of measurable substance or resources (i.e., electricity and water) consumed. The camera captures an image of the number representing at least a portion the amount of measurable substance. The recognition module is operable to generate a value in response to the image and the coordinates wherein the coordinates are used to decode the image via restoring captured image to the original readout counter value. The localization module is removably or remotely coupled to the camera and operable to generate the coordinates in accordance with the image captured by the camera.

    Method and Apparatus for Providing Multiple Power Domains to A Programmable Semiconductor Device

    公开(公告)号:US20220393685A1

    公开(公告)日:2022-12-08

    申请号:US17891154

    申请日:2022-08-19

    摘要: A semiconductor device, able to be selectively configured to perform one or more user defined logic functions, includes a semiconductor die and a selectable power regulator. The semiconductor die, in one aspect, includes a first region and a second region. The first region is operatable to perform a first set of logic functions based on a first power domain having a first voltage. The second region is configured to perform a second set of logic functions based on a second power domain having a second voltage. The selectable power regulator, in one embodiment, provides the second voltage for facilitating the second power domain in the second region of the semiconductor die in response to at least one enabling input from the first region of the semiconductor die.

    Method and apparatus for providing multiple power domains a programmable semiconductor device

    公开(公告)号:US11496135B2

    公开(公告)日:2022-11-08

    申请号:US17325025

    申请日:2021-05-19

    摘要: A semiconductor device, able to be selectively configured to perform one or more user defined logic functions, includes a semiconductor die and a selectable power regulator. The semiconductor die, in one aspect, includes a first region and a second region. The first region is operatable to perform a first set of logic functions based on a first power domain having a first voltage. The second region is configured to perform a second set of logic functions based on a second power domain having a second voltage. The selectable power regulator, in one embodiment, provides the second voltage for facilitating the second power domain in the second region of the semiconductor die in response to at least one enabling input from the first region of the semiconductor die.