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公开(公告)号:US11466364B2
公开(公告)日:2022-10-11
申请号:US16670555
申请日:2019-10-31
Applicant: Applied Materials, Inc.
Inventor: Kenichi Ohno , Eric H. Liu , Sukti Chatterjee , Yuriy Melnik , Thomas Knisley , David Alexander Britz , Lance A. Scudder , Pravin K. Narwankar
IPC: C23C16/455 , C23C16/02 , C23C16/56 , C23C16/40
Abstract: Embodiments of the present disclosure generally relate to protective coatings on substrates and methods for depositing the protective coatings. In one or more embodiments, a method of forming a protective coating on a substrate includes depositing a chromium oxide layer containing amorphous chromium oxide on a surface of the substrate during a first vapor deposition process and heating the substrate containing the chromium oxide layer comprising the amorphous chromium oxide to convert at least a portion of the amorphous chromium oxide to crystalline chromium oxide during a first annealing process. The method also includes depositing an aluminum oxide layer containing amorphous aluminum oxide on the chromium oxide layer during a second vapor deposition process and heating the substrate containing the aluminum oxide layer disposed on the chromium oxide layer to convert at least a portion of the amorphous aluminum oxide to crystalline aluminum oxide during a second annealing process.
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公开(公告)号:US11976002B2
公开(公告)日:2024-05-07
申请号:US17141813
申请日:2021-01-05
Applicant: Applied Materials, Inc.
Inventor: Alexia Adilene Portillo Rivera , Andrew Ceballos , Kenichi Ohno , Rami Hourani , Karl J. Armstrong , Brian Alexander Cohen
CPC classification number: C03C17/3615 , C03C17/3626 , C03C17/3642 , C03C17/3644 , C03C17/3663 , C23C14/0652 , C23C14/08 , C23C14/18 , C23C14/3407 , C03C2218/154
Abstract: Embodiments of the present disclosure generally relate to encapsulated optical devices and methods for fabricating the encapsulated optical devices. In one or more embodiments, a method for encapsulating an optical device includes depositing a metallic silver layer on a substrate, depositing a barrier layer on the metallic silver layer, where the barrier layer contains silicon nitride, a metallic element, a metal nitride, or any combination thereof, and depositing an encapsulation layer containing silicon oxide on the barrier layer.
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公开(公告)号:US20220028660A1
公开(公告)日:2022-01-27
申请号:US17498231
申请日:2021-10-11
Applicant: Applied Materials, Inc.
Inventor: Tsutomu Tanaka , John C. Forster , Ran Liu , Kenichi Ohno , Ning Li , Mihaela A. Balseanu , Keiichi Tanaka , Li-Qun Xia
IPC: H01J37/32
Abstract: Apparatus and methods to control the phase of power sources for plasma process regions in a batch process chamber. A master exciter controls the phase of the power sources during the process sequence based on feedback from the match circuits of the respective plasma sources.
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公开(公告)号:US20180130642A1
公开(公告)日:2018-05-10
申请号:US15805466
申请日:2017-11-07
Applicant: Applied Materials, Inc.
Inventor: Tsutomu Tanaka , John C. Forster , Ran Liu , Kenichi Ohno , Ning Li , Mihaela Balseanu , Keiichi Tanaka , Li-Qun Xia
IPC: H01J37/32 , C23C16/50 , C23C16/455 , C23C16/52 , C23C16/458 , C23C16/34 , C23C16/40
CPC classification number: H01J37/32449 , C23C16/345 , C23C16/401 , C23C16/4554 , C23C16/45544 , C23C16/45551 , C23C16/458 , C23C16/4583 , C23C16/50 , C23C16/505 , C23C16/52 , H01J37/32082 , H01J37/32137 , H01J37/32183 , H01J37/3244 , H01J37/32935
Abstract: Apparatus and methods to control the phase of power sources for plasma process regions in a batch process chamber. A master exciter controls the phase of the power sources during the process sequence based on feedback from the match circuits of the respective plasma sources.
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公开(公告)号:US10994991B2
公开(公告)日:2021-05-04
申请号:US16792861
申请日:2020-02-17
Applicant: Applied Materials, Inc.
Inventor: Joseph R. Johnson , Kenichi Ohno
IPC: B82B3/00 , G01N33/487 , B82B1/00 , B81C1/00
Abstract: Methods are provided for manufacturing well-controlled, solid-state nanopores and arrays of well-controlled, solid-state nanopores by a cyclic process including atomic layer deposition (ALD), or chemical vapor deposition (CVD), and etching. One or more features are formed in a thin film deposited on a topside of a substrate. A dielectric material is deposited over the substrate having the one or more features in the thin film. An etching process is then used to etch a portion of the dielectric material deposited over the substrate having the one or more features in the thin film. The dielectric material deposition and etching processes are optionally repeated to reduce the size of the features until a well-controlled nanopore is formed through the thin film on the substrate.
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公开(公告)号:US10830756B2
公开(公告)日:2020-11-10
申请号:US16122171
申请日:2018-09-05
Applicant: Applied Materials, Inc.
Inventor: Ankit Vora , Kenichi Ohno , Philip Allan Kraus , Zohreh Hesabi , Joseph R. Johnson
IPC: G01N27/447 , G01N33/487 , B82B3/00 , B82B1/00 , B81C1/00
Abstract: Methods of manufacturing well-controlled nanopores using directed self-assembly and methods of manufacturing free-standing membranes using selective etching are disclosed. In one aspect, one or more nanopores are formed by directed self-assembly with block co-polymers to shrink the critical dimension of a feature which is then transferred to a thin film. In another aspect, a method includes providing a substrate having a thin film over a highly etchable layer thereof, forming one or more nanopores through the thin film over the highly etchable layer, for example, by a pore diameter reduction process, and then selectively removing a portion of the highly etchable layer under the one or more nanopores to form a thin, free-standing membrane.
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公开(公告)号:US20190189400A1
公开(公告)日:2019-06-20
申请号:US16220833
申请日:2018-12-14
Applicant: Applied Materials, Inc.
Inventor: Kenichi Ohno , Keiichi Tanaka , Li-Qun Xia , Tsutomu Tanaka , Dmitry A. Dzilno , Mario D. Silvetti , John C. Forster , Rakesh Ramadas , Mike Murtagh , Alexander V. Garachtchenko
IPC: H01J37/32 , C23C16/455 , C23C16/507 , C23C16/56
CPC classification number: H01J37/32385 , C23C16/45519 , C23C16/45544 , C23C16/507 , C23C16/56 , H01J37/32091 , H01J37/3244 , H01J37/32568 , H01J2237/332 , H01J2237/3341
Abstract: Apparatus and methods for depositing and treating or etching a film are described. A batch processing chamber includes a plurality of processing regions with at least one plasma processing region. A low frequency bias generator is connected to a susceptor assembly to intermittently apply a low frequency bias to perform a directional treatment or etching the deposited film.
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