公开(公告)号：US10119991B2

公开(公告)日：2018-11-06

申请号：US14668374

申请日：2015-03-25

Applicant: MPI CORPORATION

Inventor： Tsung-Yi Chen ,  Horng-Kuang Fan ,  Ching-Hung Yang ,  Chung-Tse Lee ,  Chia-Yuan Kuo ,  Tien-Chia Li ,  Ting-Ju Wu ,  Shang-Jung Hsieh

IPC: G01R31/00 ,  G01R31/02 ,  G01R31/28 ,  G01R1/04 ,  G01R1/067 ,  H01R12/00 ,  H01R13/00 ,  G01R1/073

Abstract: A vertical probe device includes a lower die having engaging holes and needle holes, a positioning film having limiting holes and needle holes, probe needles inserted through the needle holes, and supporters having at least an upper stopping surface and at least a lower stopping surface for moveably limiting the positioning film therebetween. Each supporter has a head, a neck passing through the limiting hole and having a length longer than the thickness of the positioning film, a body, and a tail inserted into the engaging hole, which are connected in order, and at least one of the upper and lower stopping surfaces. The supporters can prevent the positioning film from being lifted and flipped over and enables the positioning film to move so that the probe needles are reliable.

公开(公告)号：US09823272B2

公开(公告)日：2017-11-21

申请号：US14162766

申请日：2014-01-24

Applicant: MPI Corporation

Inventor： Ming-Chi Chen ,  Tien-Chia Li ,  Dai-Jin Yeh ,  Tsung-Yi Chen ,  Chien-Kuei Wang

IPC: G01R31/02 ,  G01R1/073 ,  G01R1/067

CPC classification number: G01R1/0735 ,  G01R1/06733 ,  G01R1/07314

Abstract: A wafer testing probe card includes a printed circuit board, a flexible circuit board, an elastic piece, and a probe unit. The flexible circuit board is electrically connected to the printed circuit board. The elastic piece is disposed between the printed circuit board and the flexible circuit board. The probe unit includes a probe head and a plurality of probes. The probe head is fixed on the printed circuit board and has a plurality of through holes. The probes respectively pass through the through holes and move up and down relative to the probe head.

公开(公告)号：US09746495B2

公开(公告)日：2017-08-29

申请号：US14628622

申请日：2015-02-23

Applicant: MPI CORPORATION

Inventor： Chien-Chou Wu ,  Tsung-Yi Chen

IPC: G01R1/067 ,  G01R1/073 ,  G01R3/00

CPC classification number: G01R1/06722 ,  G01R1/06705 ,  G01R1/07342 ,  G01R3/00

Abstract: A probe device includes a spring probe and a probe seat. The spring probe includes a needle and a spring sleeve sleeved onto the needle and provided with at least one spring section and at least one non-spring section. The probe seat includes a plurality of dies stacked together and at least one guiding hole through which the spring probe is inserted. An upper edge and a lower edge of the guiding hole of the probe seat are arranged corresponding in position to the non-spring section of the spring sleeve. As a result, the spring probe is prevented from getting jammed due to the contact of the spring section of the spring sleeve with the upper and lower edges of the guiding hole.

公开(公告)号：US09651578B2

公开(公告)日：2017-05-16

申请号：US14515537

申请日：2014-10-16

Applicant: MPI Corporation

Inventor： Chien-Chou Wu ,  Ming-Chi Chen ,  Tsung-Yi Chen ,  Chung-Che Li

IPC: G01R3/00 ,  G01R31/28 ,  B23K103/00

CPC classification number: G01R3/00 ,  B23K2103/42 ,  G01R31/2853 ,  G01R31/2887 ,  G01R31/2889 ,  Y10T29/49004 ,  Y10T29/49128 ,  Y10T29/49155 ,  Y10T29/49204 ,  Y10T29/49208 ,  Y10T29/49222

Abstract: An assembly method of direct-docking probing device is provided. First, a space transforming plate made by back-end-of-line semiconductor manufacturing process is provided, so the thickness of the space transforming plate is predetermined by the client of probe card manufacturer. Then a reinforcing plate in which a plurality of circuits disposed is provided, which has larger mechanical strength than the space transforming plate. After that the reinforcing plate and the space transforming plate are joined and electrically connected by a plurality of solders so as to form a space transformer. Then, a conductive elastic member and a probe interface board are provided. Thereafter, the space transformer and the conductive elastic member are mounted on the probe interface board. After that, at least one vertical probe assembly having a plurality of vertical probes is mounted on the space transforming plate, and the vertical probes is electrically connected with the space transforming plate.

公开(公告)号：US09638716B2

公开(公告)日：2017-05-02

申请号：US14558735

申请日：2014-12-03

Applicant: MPI Corporation

Inventor： Tzu-Yang Chen ,  Shang-Jung Hsieh ,  Chung-Tse Lee ,  Tsung-Yi Chen ,  Tien-Chia Li ,  Chia-Yuan Kuo ,  Che-Wei Lin

IPC: G01R1/073 ,  G01R31/28

CPC classification number: G01R1/07364 ,  G01R1/07357 ,  G01R31/2891

Abstract: A positioner and a probe head of a probe card are provided. The positioner has a main opening, a first sub-opening, a second sub-opening, a third sub-opening, a fourth sub-opening, a first positioning portion, a second positioning portion, a first elastic portion and a second elastic portion. The first sub-opening, the second sub-opening, the third sub-opening, and the fourth sub-opening are sequentially arranged at the periphery of the main opening and are communicated to the main opening. A stiffness of the first positioning portion and a stiffness of the second positioning portion are higher than a stiffness of the first elastic portion and a stiffness of the second elastic portion.

公开(公告)号：US09588141B2

公开(公告)日：2017-03-07

申请号：US14628658

申请日：2015-02-23

Applicant: MPI Corporation

Inventor： Tsung-Yi Chen ,  Chien-Chou Wu ,  Tien-Chia Li ,  Ting-Hsin Kuo

IPC: G01R1/067 ,  G01R1/073 ,  G01R3/00

CPC classification number: G01R1/06722 ,  G01R1/06705 ,  G01R1/07342 ,  G01R3/00

Abstract: A probe device includes a spring probe having a spring sleeve with at least a spring section and a connection segment fixed to a needle and having a convex portion protruding over an outer cylinder surface of the spring section, and a probe seat having stacked dies and at least a guiding hole through which the probe is inserted. The dies includes a lower die, a supporting die above the lower die and a non-circular supporting hole at the supporting die. The distance between a supporting surface and a center of the supporting hole is greater than the radius of the outer cylinder surface and smaller than the distance between a guiding surface of the supporting hole and the center, which is greater than the maximum distance between the convex portion and a needle center, thereby preventing the probe receiving external force from exceeding deflection and bending.

Abstract translation: 探针装置包括：弹簧探针，其具有至少弹簧部分的弹簧套筒和固定到针头的连接部分，并且具有突出在弹簧部分的外筒表面上的凸出部分，以及具有堆叠模具的探针座 至少一个引导孔，探针插入该引导孔。 模具包括下模，下模上方的支撑模和在支撑模处的非圆形支撑孔。 支撑面和支撑孔的中心之间的距离大于外筒表面的半径，并且小于支撑孔的引导表面和中心之间的距离，该距离大于凸起 部分和针中心，从而防止探头接收外力超过偏转和弯曲。

公开(公告)号：US09535092B2

公开(公告)日：2017-01-03

申请号：US14605776

申请日：2015-01-26

Applicant: MPI CORPORATION

Inventor： Ting-Hsin Kuo ,  Tsung-Yi Chen ,  Tien-Chia Li ,  Yi-Lung Lee ,  Chien-Chou Wu

IPC: G01R1/067 ,  G01R1/073

CPC classification number: G01R1/06722 ,  G01R1/07307

Abstract: A spring probe includes a needle, a spring sleeve sleeved onto the needle, and a protrusion. The spring sleeve has upper and lower non-spring sections, and at least a spring section therebetween. The needle has a bottom end portion protruding out from the lower non-spring section, and a top end portion located in the upper non-spring section. The protrusion is located at one of the top end portion and the upper non-spring section. The needle is movable relative to the upper non-spring section from an initial position to a connected position where the upper non-spring section is electrically connected with the needle through the protrusion when receiving an external force. As a result, the spring probe effectively prevents signals from being transmitted through the spring section, thereby improving stability of signal transmission and preventing the spring section from fracture.

Abstract translation: 弹簧探针包括针，套在针上的弹簧套和突起。 弹簧套筒具有上下非弹簧部分，并且至少在其间具有弹簧部分。 针具有从下部非弹簧部分突出的底端部分和位于上部非弹簧部分中的顶端部分。 突起位于顶端部分和上部非弹性部分中的一个处。 针可以相对于上部非弹簧部分从初始位置移动到连接位置，在接收外部力时上部非弹簧部分通过突起与针体电连接。 结果，弹簧探针有效地防止信号通过弹簧部分传递，从而提高信号传输的稳定性并防止弹簧部分断裂。

公开(公告)号：US09470750B2

公开(公告)日：2016-10-18

申请号：US14253675

申请日：2014-04-15

Applicant: MPI CORPORATION

Inventor： Tsung-Yi Chen ,  Chung-Tse Lee ,  Shih-Shin Chen

IPC: G01R31/28 ,  G01R1/073

CPC classification number: G01R31/2889 ,  G01R1/07378

Abstract: An alignment adjusting mechanism for a probe card includes a frame, a substrate and positioning screws. The frame has an opening, an inner periphery wall surrounding around the opening, and an outer periphery wall corresponding to the inner periphery wall. The substrate is disposed in the opening and supported by a support flange extending from the inner periphery wall toward a center of the opening. The frame is provided with a plurality of positioning threaded holes each extending from the outer periphery wall to the inner periphery wall in communication with the opening. Each positioning screw is threaded into one of the positioning threaded holes and has an end stopped at a lateral side of the substrate. By turning the positioning screws, the planimetric position of the substrate on an imaginary plane is adjustable.

Abstract translation: 用于探针卡的对准调节机构包括框架，基板和定位螺钉。 框架具有开口，围绕开口的内周壁和与内周壁对应的外周壁。 基板设置在开口中并由从内周壁向开口中心延伸的支撑凸缘支撑。 框架设置有多个定位螺纹孔，每个定位螺纹孔从外周壁延伸到与开口连通的内周壁。 每个定位螺钉被拧入一个定位螺纹孔中，并且一端停在基片的侧面。 通过转动定位螺钉，基板在虚拟平面上的平面位置可调。

公开(公告)号：US09341648B2

公开(公告)日：2016-05-17

申请号：US13972930

申请日：2013-08-22

Applicant: MPI Corporation

Inventor： Chung-Tse Lee ,  Chien-Chou Wu ,  Tsung-Yi Chen ,  Ming-Chi Chen

IPC: G01R31/00 ,  G01R1/04 ,  G01R3/00 ,  G01R1/073

CPC classification number: G01R1/0491 ,  G01R1/07378 ,  G01R3/00 ,  Y10T29/49126

Abstract: The probe card includes a substrate, at least two IC boards, and a plurality of probe pads. The IC boards are located on the substrate, and a predetermined distance is formed between the IC boards. Each of the IC boards has a plurality of lead connection points. The probe pads are plated on the IC boards, and are respectively connected to the lead connection points to cover the lead connection points. A probe area is surrounded by the probe pads on each of the IC boards. The probe pads are used to abut against plural probes.

Abstract translation: 探针卡包括基板，至少两个IC板和多个探针垫。 IC板位于基板上，并且在IC板之间形成预定距离。 每个IC板具有多个引线连接点。 探针焊盘电镀在IC板上，并分别连接到引线连接点以覆盖引线连接点。 探针区域被每个IC板上的探针焊盘包围。 探针垫用于抵靠多个探针。