Apparatus and methods for supporting workpieces during plasma processing

    公开(公告)号:US10026436B2

    公开(公告)日:2018-07-17

    申请号:US12496369

    申请日:2009-07-01

    IPC分类号: C23F1/00 H01J37/32 G11B5/855

    摘要: Apparatus and methods for simultaneously supporting multiple workpieces inside a processing space of a plasma processing system for simultaneous two-sided plasma processing. The apparatus may be a fixture having a carrier plate configured to be supported inside the processing space and a plurality of first openings extending through the thickness of the carrier plate. The carrier plate is configured to contact each of the workpieces over an annular region at an outer peripheral edge so that the first and second sides of each of the workpieces is exposed to the plasma through a respective one of said plurality of first openings.

    Plasma process for removing excess molding material from a substrate
    14.
    发明授权
    Plasma process for removing excess molding material from a substrate 有权
    用于从基底去除多余成型材料的等离子体工艺

    公开(公告)号:US07842223B2

    公开(公告)日:2010-11-30

    申请号:US11021341

    申请日:2004-12-22

    摘要: A method for removing thin layers of a two-component molding material from areas on a substrate. The method includes using a plasma formed using a first gas mixture for removing one component of the molding material and a plasma formed using a different second gas mixture for removing the other component of the molding material. For filled epoxies commonly used as molding materials, the first gas mixture may be an oxygen-rich mixture of an oxygen-containing gas species and a fluorine-containing gas species, and the second gas mixture may be a fluorine-rich mixture of the same gases.

    摘要翻译: 一种从基板上的区域去除双组分成型材料薄层的方法。 该方法包括使用使用第一气体混合物形成的等离子体,以除去模制材料的一个组分,以及使用不同的第二气体混合物形成的等离子体,以除去模制材料的其它组分。 对于通常用作成型材料的填充环氧树脂,第一气体混合物可以是含氧气体物质和含氟气体物质的富氧混合物,并且第二气体混合物可以是其富含氟的混合物 气体。

    Plasma treatment system
    15.
    发明授权

    公开(公告)号:US07013834B2

    公开(公告)日:2006-03-21

    申请号:US10324436

    申请日:2002-12-20

    IPC分类号: C23C16/00 H01L21/00

    摘要: A plasma treatment system for treating a workpiece with a downstream-type plasma. The processing chamber of the plasma treatment system includes a chamber lid having a plasma cavity disposed generally between a powered electrode and a grounded plate, a processing space separated from the plasma cavity by the grounded plate, and a substrate support in the processing space for holding the workpiece. A direct plasma is generated in the plasma cavity. The grounded plate is adapted with openings that remove electrons and ions from the plasma admitted from the plasma cavity into the processing space to provide a downstream-type plasma of free radicals. The openings may also eliminate line-of-sight paths for light between the plasma cavity and processing space. In another aspect, the volume of the processing chamber may be adjusted by removing or inserting at least one removable sidewall section from the chamber lid.

    Multiple-electrode plasma processing systems with confined process chambers and interior-bussed electrical connections with the electrodes
    18.
    发明授权
    Multiple-electrode plasma processing systems with confined process chambers and interior-bussed electrical connections with the electrodes 有权
    具有密封处理室的多电极等离子体处理系统和与电极的内部总线电连接

    公开(公告)号:US08372238B2

    公开(公告)日:2013-02-12

    申请号:US12123954

    申请日:2008-05-20

    IPC分类号: H01L21/00 C23C16/00

    摘要: Apparatus for treating products with plasma generated from a source gas. The apparatus includes a vacuum chamber, a plurality of juxtaposed electrodes arranged in adjacent pairs inside the vacuum chamber, and a plasma excitation source electrically coupled with the electrodes. The apparatus may include conductive members extending into the interior of each electrode to establish a respective electrical connection with the plasma excitation source. The apparatus may include a gas distribution manifold and multiple gas delivery tubes coupled with the gas distribution manifold. Each gas delivery tube has an injection port configured to inject the source gas between each adjacent pair of electrodes. The apparatus may further include flow restricting members that operate to partially obstruct a peripheral gap between each adjacent pair of electrodes, which restricts the escape of the source gas from the process chamber between each adjacent pair of electrodes.

    摘要翻译: 用于从源气体产生的等离子体处理产品的装置。 该装置包括真空室,在真空室内相邻布置的多个并置电极以及与电极电耦合的等离子体激发源。 该装置可以包括延伸到每个电极内部的导电构件,以与等离子体激发源建立相应的电连接。 该装置可以包括气体分配歧管和与气体分配歧管连接的多个气体输送管。 每个气体输送管具有被配置为在每个相邻的一对电极之间注入源气体的注入口。 该装置还可以包括流动限制构件,其操作以部分地阻塞每对相邻电极之间的周边间隙,其限制源气体从每个相邻的一对电极之间的处理室逸出。

    Ultra high speed uniform plasma processing system
    19.
    发明授权
    Ultra high speed uniform plasma processing system 有权
    超高速均匀等离子体处理系统

    公开(公告)号:US07845309B2

    公开(公告)日:2010-12-07

    申请号:US10710457

    申请日:2004-07-13

    CPC分类号: H01J37/32834 H01J37/32633

    摘要: An apparatus for processing a substrate with a plasma. The apparatus includes first and second electrodes positioned with a spaced apart relationship. A separating ring has a vacuum-tight engagement with confronting surfaces of the first electrode and the second electrode to define an evacuatable processing region therebetween. Communicating with the processing region is a process gas port for introducing a process gas to the processing region. The processing region may be evacuated through a vacuum port defined in one of the first and second electrodes to a pressure suitable for exciting a plasma from the process gas in the processing region when the first and second electrodes are powered.

    摘要翻译: 一种用等离子体处理衬底的装置。 该装置包括以间隔开的关系定位的第一和第二电极。 分离环与第一电极和第二电极的相对表面具有真空密封接合,以在它们之间限定可抽空的处理区域。 与处理区域通信是用于将处理气体引入到处理区域的处理气体端口。 处理区域可以通过在第一和第二电极中的一个中限定的真空端口抽真空至适于在第一和第二电极通电时从处理区域中的处理气体激发等离子体的压力。

    Plasma processing apparatus and methods for removing extraneous material from selected areas on a substrate
    20.
    发明授权
    Plasma processing apparatus and methods for removing extraneous material from selected areas on a substrate 有权
    等离子体处理装置和从衬底上的选定区域去除外来材料的方法

    公开(公告)号:US07635418B2

    公开(公告)日:2009-12-22

    申请号:US11003062

    申请日:2004-12-03

    摘要: Apparatus and methods for shielding a feature projecting from a first area on a substrate to a plasma while simultaneously removing extraneous material from a different area on the substrate with the plasma. The apparatus includes at least one concavity positioned and dimensioned to receive the feature such that the feature is shielded from the plasma. The apparatus further includes a window through which the plasma removes the extraneous material. The method generally includes removing the extraneous material while shielding the feature against plasma exposure.

    摘要翻译: 用于屏蔽从衬底上的第一区域突出到等离子体的特征的装置和方法,同时使用等离子体从衬底上的不同区域去除外来材料。 该装置包括至少一个位置和尺寸以容纳特征的凹陷,使得该特征与等离子体屏蔽。 该装置还包括一个窗口,等离子体通过这个窗口去除外来材料。 该方法通常包括去除外来材料,同时屏蔽特征免受等离子体暴露。