摘要:
An apparatus for maintaining plant equipment incorporates an input unit to receive information on targets and ranges of plant equipment to be maintained and a failure-event tree breakdown unit to perform tree-breakdown on failures to be expected from events to be inspected. A failure-unreliability function calculation unit calculates unreliability of each item in failure-event tree breakdown and a failure-derived monetary loss calculation unit multiplies each unreliability and a cost of recovery from each event in accordance with the failure-event tree breakdown. A preventive maintenance expense calculation unit calculates preventive maintenance expenses for preventing failure events and a maintenance decision-making unit decides maintenance timing and technique through comparison between the recovery cost and the preventive maintenance expense.
摘要:
A semiconductor device allowing the manufacturing process to be simplified and fine structures therein to be readily formed and a manufacturing method thereof are provided. In the semiconductor device, a conductive layer is used as a mask during etching for forming a first opening.
摘要:
In a semiconductor device and a method of fabrication thereof, a resin film forms an interlayer film of the semiconductor device having a multilayer interconnection structure, and is formed by only one coating using coating liquid containing silicone ladder polymers represented by the chemical formula: (HO).sub.2 (R.sub.2 Si.sub.2 O.sub.3).sub.n H.sub.2. As a result, it is possible to improve long-term reliability of electric characteristics or the like, and simplify a process.
摘要:
In a semiconductor device, an impurity diffused layer serving as an active region is formed in a predetermined region of the surface of a semiconductor substrate of silicon, an underlayer insulating film is formed on the semiconductor substrate for the purpose of protecting and stabilizing the surface of the semiconductor substrate, and an interconnection electrically connected to the impurity diffused layer through a contact hole and formed on an Al-Si-Sn alloy, an Al-Si-Sb alloy or alloys having Ti added to the respective alloys, so that occurrence of an alloy pit and a silicon nodule is prevented. In addition, a completed protective film is formed on the interconnection and the underlayer insulating film and an aperture in a bonding pad region is formed in a predetermined region of the completed protective film, so that the interconnection and the bonding pad are electrically connected to each other. The proportion of silicon and other materials in the alloy are controlled to simultaneously avoid alloy pit and silicon nodule defects both at the contact hole and throughout the alloy conductor.
摘要:
The present invention is mainly characterized by providing an even surface of an interlayer insulating film for insulating and isolating an upper interconnection and a lower interconnection from each other. A lower interconnection layer is provided on a semiconductor substrate, having a pattern of stepped portions. A silicon type insulating film is provided on the semiconductor substrate so as to cover the lower interconnection layer. A silicon ladder resin film is filled in recessed portions of the surface of the silicon type insulating film for making even the surface of the silicon type insulating film. An upper interconnection layer electrically connected to the lower interconnection layer through a via hole is provided on the silicon type insulating film. The silicon ladder resin film has the structural formula: ##STR1## where R.sub.1 is at least one of a phenyl group and a lower alkyl group, R.sub.2 is at least one of a hydrogen atom and a lower alkyl group, and n is an integer of 20 to 1000.
摘要:
An apparatus for forming a thin film on a substrate has a first reaction chamber in which a thin film is formed by gaseous discharge and a second reaction chamber in which reactive atoms are generated. The first and second reaction chambers commuicate with one another through an orifice in the first reaction chamber. The first reaction chamber houses a device for generating a film on a substrate, and the second reaction chamber houses a device for generating reactive atoms. The orifice is disposed in the vicinity of both a film-forming region in the first reaction chamber and a reactive atom-generating region in the second reaction chamber so that reactive atoms from the second reaction chamber will pass through the orifice and enter the film-forming region in the first reaction chamber, combine with particles in the film-forming region to form a chemical compound, and accumulate on the substrate. In preferred embodiments, the reaction chambers are formed by a single housing having a partition which has an orifice therein and which divides the housing into two reaction chambers.
摘要:
A perimeter monitoring device for a work vehicle is configured to monitor a surrounding of the work vehicle and display a monitored result on a display device. The perimeter monitoring device includes cameras, a bird's-eye image display unit, obstacle detecting sensors, a camera image specifying unit, and a camera image displaying unit. The camera image specifying unit is configured to specify one or more camera images in which one or more of obstacles are captured when the one or more of obstacles are detected by the obstacle detecting sensors. The camera image displaying unit is configured to display a relevant camera image in alignment with the bird's-eye image on the display device when a plurality of camera images are specified by the camera image specifying unit, the relevant camera image being ranked in a high priority ranking based on a priority order set in accordance with travelling states.
摘要:
A display device includes a first measurement unit measuring information on luminance of a first image signal to output a first measurement result, a second measurement unit measuring information on a luminance of a second image signal to output a second measurement result, a comparator comparing the first measurement result with the second measurement result to output differential data, a correction amount determination unit determining a correction amount for the first image signal and/or the second image signal based on the differential data, and a correction unit correcting the luminance of the first image signal and/or the second image signal based on the correction amount.
摘要:
An image processing apparatus according to an embodiment of the present invention includes a correction interval setting unit for setting a correction interval; a correction interval dividing unit for dividing the correction interval into a black side interval and a white side interval; histogram calculating units for calculating a total number of luminance histograms of the black side interval and the white side interval, respectively; gain setting units for setting gains of a γ curve for raising the luminance and a γ curve for lowering the luminance, respectively; gamma curve generating units for generating a gamma curve for raising the luminance and a gamma curve for lowering the luminance, respectively; a gamma curve combining unit for combining the gamma curve for raising the luminance and the gamma curve for lowering the luminance; and a luminance conversion unit for performing the luminance conversion process using the combined gamma curve.
摘要:
An operation-supporting apparatus includes: an operation request input unit that inputs information relating to operation request items of plant equipment; an operating conditions setting unit that converts operation request input information to operating parameters; an operation history creation unit that creates an operation history by chronologically processing the operating parameters; a breakdown statistics database that stores an event tree of the plant equipment; an event simulator that calculates the degree of unreliability corresponding to the operating parameters, the operation request information, and the operation history information, and in compliance with the event tree; a risk-cost calculation unit that calculates risk-cost by determining the aggregate product of the degrees of unreliability and restoration costs; an operating method determination unit that determines whether operating conditions are suitable by comparing the risk-cost with profit gained by continuing operation; and an operating method specification unit that specifies specific operation conditions for the plant equipment.