摘要:
A PLD utilizes a heterogeneous architecture to reduce power consumption of its active resources. The PLD's programmable resources are divided into a first partition and a second partition, where the resources of the first partition are optimized for low power consumption and the resources of the second partition are optimized for high performance. Portions of a user design containing non-critical timing paths are mapped to and implemented by the resources of the power-optimized first partition, and portions of the user design containing critical timing paths are mapped to and implemented by the resources of the performance-optimized second partition.
摘要:
A three dimensional (3D) integrated circuit (IC), 3D IC chip and method of fabricating a 3D IC chip. The chip includes multiple layers of circuits, e.g., silicon insulator (SOI) CMOS IC layers, each including circuit elements. The layers may be formed in parallel and one layer attached to another to form a laminated 3D chip.
摘要:
A three dimensional (3D) integrated circuit (IC), 3D IC chip and method of fabricating a 3D IC chip. The chip includes multiple layers of circuits, e.g., silicon insulator (SOI) CMOS IC layers, each including circuit elements. The layers may be formed in parallel and one layer attached to another to form a laminated 3D chip.
摘要:
Specific ionic interactions with a sensing material that is electrically coupled with the floating gate of a floating gate-based ion sensitive field effect transistor (FGISFET) may be used to sense a target material. For example, an FGISFET can use (e.g., previously demonstrated) ionic interaction-based sensing techniques with the floating gate of floating gate field effect transistors. The floating gate can serves as a probe and an interface to convert chemical and/or biological signals to electrical signals, which can be measured by monitoring the change in the device's threshold voltage, VT.
摘要翻译:可以使用与浮置栅极离子敏感场效应晶体管(FGISFET)的浮动栅极电耦合的感测材料的特定离子相互作用来感测目标材料。 例如,FGISFET可以使用浮动栅极场效应晶体管的浮动栅极(例如,先前证明的)基于离子相互作用的感测技术。 浮动栅极可以用作探针和将化学和/或生物信号转换成电信号的接口,这可以通过监测器件的阈值电压V T T的变化来测量。
摘要:
A bank of input/output buffers are configured such that each input buffer in the bank may select from a plurality of voltage references during single-ended operation. Similarly, the pad associated with each input buffer may serve to supply one of the voltage references for other input buffers within the bank.
摘要:
A multi-chip package that includes multiple integrated circuits is provided. An integrated circuit in the multi-chip package may be mounted on an interposer. The interposer may be mounted on a package substrate. The integrated circuit may have internal power supply terminals coupled to on-package decoupling (OPD) capacitor circuitry that are formed as part of the package substrate. The power supply terminals on the integrated circuit may be coupled to conductive routing paths and through-silicon vias (TSVs) in the interposer via microbumps. The through-silicon vias in the interposer may be coupled to the OPD capacitor circuitry via flip-chip bumps. The conductive routing paths and the TSVs in the interposer may be coupled to the internal integrated circuit power supply terminals in a way that minimizes power supply resonance noise.
摘要:
Method and apparatus for programmable heterogeneous integration of stacked semiconductor die are described. In some examples, a semiconductor device includes a first integrated circuit (IC) die including through-die vias (TDVs); a second IC die vertically stacked with the first IC die, the second IC die including inter-die contacts electrically coupled to the TDVs; the first IC die including heterogeneous power supplies and a mask-programmable interconnect, the mask-programmable interconnect mask-programmed to electrically couple a plurality of the heterogeneous power supplies to the TDVs; and the second IC die including active circuitry, coupled to the inter-die contacts, configured to operate using the plurality of heterogeneous power supplies provided by the TDVs.
摘要:
A method and apparatus to test the inter-die interface between two or more semiconductor die in die stacking applications, where a mismatch exists between the number of input and output pads on a base die and the number of input and output pads on a stacked die. In a first embodiment, a number of through-die vias (TDVs) may be used to implement inter-die signal paths using standard or flexible design rules to maintain statistical TDV yield despite the lack of continuity verification of the inter-die signals paths. In alternate embodiments, programmable multiplexers may be utilized to share one or more inter-die connections between the base die and the one or more stacked die so as to facilitate testing and normal operation of each inter-die connection. In other embodiments, spare TDVs are utilized only during test operations, so as to accommodate the mismatch. In yet other embodiments, built-in-test (BIT) circuits are configured to perform logic operations using a plurality of inter-die input/output (I/O) signals to eliminate the need to implement an identical number of input and output ports between the base die and the one or more stacked die to facilitate inter-die testing.
摘要:
A packaged integrated circuit (“IC”) has a daughter IC die stacked on a backside of a parent IC die. Backside fill material is applied to the backside of the parent IC die to provide a planarized surface.
摘要:
Examples of the invention relate to a method, apparatus, and computer readable medium for designing a mother integrated circuit (IC) configured for stacking with at least one daughter IC. A layout of the mother IC includes at least one interface tile having an electrical configuration for communicating with interface logic of the daughter IC. The method includes: obtaining design rules for through die vias (TDVs) to be formed in the mother IC for implementing connections between the at least one interface tile and a physical interface of the daughter IC; defining a layout of the TDVs in the mother IC according to the design rules; and defining at least one mask for programming interconnect on the mother IC to physically connect the TDVs between the at least one interface tile and the physical interface of the daughter IC without changing the electrical configuration of the at least one interface tile.