PATTERN FORMING METHOD, ACTINIC RAY-SENSITIVE OR RADIATION-SENSITIVE RESIN COMPOSITION AND RESIST FILM USED THEREFOR, AND ELECTRONIC DEVICE MANUFACTURING METHOD AND ELECTRONIC DEVICE USING THE SAMEDEVICE MANUFACTURING METHOD AND ELECTRONIC DEVICE USING THE SAME
    21.
    发明申请
    PATTERN FORMING METHOD, ACTINIC RAY-SENSITIVE OR RADIATION-SENSITIVE RESIN COMPOSITION AND RESIST FILM USED THEREFOR, AND ELECTRONIC DEVICE MANUFACTURING METHOD AND ELECTRONIC DEVICE USING THE SAMEDEVICE MANUFACTURING METHOD AND ELECTRONIC DEVICE USING THE SAME 审中-公开
    图案形成方法,使用其的紫外线敏感性或辐射敏感性树脂组合物和耐腐蚀膜,以及使用SAMEDEVICE制造方法的电子设备制造方法和电子设备以及使用该装置的电子设备

    公开(公告)号:US20150093692A1

    公开(公告)日:2015-04-02

    申请号:US14567468

    申请日:2014-12-11

    Inventor: Shuhei YAMAGUCHI

    Abstract: There is provided a pattern forming method including: (a) forming a film by an actinic ray-sensitive or radiation-sensitive resin composition containing (A) to (C), (A) a resin capable of increasing polarity by the action of an acid to decrease solubility in a developer containing an organic solvent, (B) a compound capable of generating acid upon irradiation with an actinic ray or radiation, and (C) a salt having a conjugate base structure of an acid having a pKa of −2 or more in a molecule thereof and substantially not capable of decomposing by an actinic ray or radiation, (b) exposing the film, and (c) developing the exposed film using a developer containing an organic solvent to form a negative pattern.

    Abstract translation: 提供了一种图案形成方法,其包括:(a)通过光化射线敏感或辐射敏感性树脂组合物形成膜,所述组合物含有(A)至(C),(A)能够通过 酸,以降低在含有机溶剂的显影剂中的溶解性,(B)在用光化射线或辐射照射时能够产生酸的化合物,和(C)具有pKa为-2的酸的共轭碱结构的盐 或更多,并且基本上不能通过光化射线或辐射分解,(b)曝光该膜,和(c)使用含有有机溶剂的显影剂显影曝光的膜以形成负型图案。

    PATTERN FORMING METHOD, ACTINIC RAY-SENSITIVE OR RADIATION-SENSITIVE RESIN COMPOSITION, ACTINIC RAY-SENSITIVE OR RADIATION-SENSITIVE FILM, MANUFACTURING METHOD OF ELECTRONIC DEVICE, AND ELECTRONIC DEVICE
    22.
    发明申请
    PATTERN FORMING METHOD, ACTINIC RAY-SENSITIVE OR RADIATION-SENSITIVE RESIN COMPOSITION, ACTINIC RAY-SENSITIVE OR RADIATION-SENSITIVE FILM, MANUFACTURING METHOD OF ELECTRONIC DEVICE, AND ELECTRONIC DEVICE 有权
    图案形成方法,丙烯酸敏感或辐射敏感性树脂组合物,丙烯酸敏感或辐射敏感膜,电子设备的制造方法和电子设备

    公开(公告)号:US20140242505A1

    公开(公告)日:2014-08-28

    申请号:US14272034

    申请日:2014-05-07

    Abstract: A pattern forming method including: (i) a process of forming a film using an actinic ray-sensitive or radiation-sensitive resin composition containing a Resin (P) including a non-acid-decomposable Repeating Unit (b1) represented by a following General Formula (b1) and a repeating unit including a group capable of being decomposed by acid and generating a polar group, and a Compound (B) capable of generating an acid through irradiation of actinic rays or irradiation; (ii) a process of exposing the film using actinic rays or radiation with a wavelength of equal to or less than 200 nm; and (iii) a process of developing the exposed film using a developer including an organic solvent containing a hetero atom and carbon atoms having 7 or more carbon atoms to forming a negative tone pattern.

    Abstract translation: 一种图案形成方法,包括:(i)使用含有由以下通式表示的非酸可分解重复单元(b1)的树脂(P)的光化射线敏感性或辐射敏感性树脂组合物形成膜的方法 式(b1)和包含能够被酸分解并产生极性基团的基团的重复单元和能够通过光化射线照射或照射而产生酸的化合物(B); (ii)使用光化射线或波长等于或小于200nm的辐射使膜曝光的方法; 和(iii)使用包含含有杂原子的有机溶剂和具有7个或更多个碳原子的碳原子的显影剂显影曝光的膜以形成负色调图案的方法。

    ACTINIC RAY-SENSITIVE OR RADIATION-SENSITIVE RESIN COMPOSITION, RESIST FILM, PATTERN FORMING METHOD, AND METHOD FOR MANUFACTURING ELECTRONIC DEVICES

    公开(公告)号:US20230393473A1

    公开(公告)日:2023-12-07

    申请号:US18449475

    申请日:2023-08-14

    CPC classification number: G03F7/039

    Abstract: An object of the present invention is to provide an actinic ray-sensitive or radiation-sensitive resin composition having excellent sensitivity to exposure. Another object of the present invention is to provide a resist film, a pattern forming method, and a method for manufacturing an electronic device, which relate to the actinic ray-sensitive or radiation-sensitive resin composition. The actinic ray-sensitive or radiation-sensitive resin composition contains a resin which is decomposed by action of acid to increase polarity, in which at least one of a requirement that the actinic ray-sensitive or radiation-sensitive resin composition further contains a compound represented by Formula (1), or a requirement that the resin which is decomposed by action of acid to increase polarity has a residue formed by removing one hydrogen atom from the compound represented by Formula (1) is satisfied.

    PATTERN FORMING METHOD, ACTIVE LIGHT SENSITIVE OR RADIATION SENSITIVE RESIN COMPOSITION, ACTIVE LIGHT SENSITIVE OR RADIATION SENSITIVE FILM, METHOD FOR MANUFACTURING ELECTRONIC DEVICE, AND ELECTRONIC DEVICE
    28.
    发明申请
    PATTERN FORMING METHOD, ACTIVE LIGHT SENSITIVE OR RADIATION SENSITIVE RESIN COMPOSITION, ACTIVE LIGHT SENSITIVE OR RADIATION SENSITIVE FILM, METHOD FOR MANUFACTURING ELECTRONIC DEVICE, AND ELECTRONIC DEVICE 审中-公开
    图案形成方法,主动感光或辐射敏感性树脂组合物,主动感光或辐射敏感膜,制造电子设备的方法和电子设备

    公开(公告)号:US20160070174A1

    公开(公告)日:2016-03-10

    申请号:US14938061

    申请日:2015-11-11

    Abstract: Disclosed is a pattern forming method including forming an active light sensitive or radiation sensitive film by coating a substrate with an active light sensitive or radiation sensitive resin composition; exposing the active light sensitive or radiation sensitive film; and forming a negative type pattern by developing the exposed active light sensitive or radiation sensitive film using a developer which includes an organic solvent, in which the active light sensitive or radiation sensitive resin composition contains a resin (A) which includes a repeating unit (a) which has an acidic group and a lactone structure and of which, due to a polarity thereof being increased by an action of an acid, a solubility decreases with respect to a developer which includes an organic solvent.

    Abstract translation: 公开了一种图案形成方法,包括通过用活性光敏或辐射敏感性树脂组合物涂布基底来形成活性光敏或辐射敏感膜; 暴露有源光敏或辐射敏感膜; 并使用包括有机溶剂的显影剂,通过显影曝光的有源光敏感或感光膜形成负型图案,其中活性光敏或辐射敏感性树脂组合物含有包含重复单元(a)的树脂(A) ),其具有酸性基团和内酯结构,并且由于其极性由于酸的作用而增加,相对于包含有机溶剂的显影剂,溶解度降低。

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