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公开(公告)号:US11080440B2
公开(公告)日:2021-08-03
申请号:US15634737
申请日:2017-06-27
Applicant: International Business Machines Corporation
IPC: G06F17/18 , G01N11/08 , G06F111/10 , G06F113/08 , G06F30/20
Abstract: An apparatus to perform tests on fluid flow and configured to operate at field conditions includes one or more vessels and one or more sets of fluid injecting devices corresponding to respective ones of the one or more vessels. Each set of fluid injecting devices includes one or more fluid injecting devices each configured to inject a respective fluid through its respective vessel. The apparatus further includes one or more measurement devices operatively coupled to respective ones of the one or more vessels and configured to measure data associated with fluid flow of the one or more fluids injected into its respective vessel. The measured data comprises one or more of pressure gradient data and flow rate data. The apparatus is in communication with at least one processor configured to calculate a model based on the measured data. In calculating the model, the at least one processor is configured to infer one or more parameters for the model from the measured data.
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22.
公开(公告)号:US10388805B2
公开(公告)日:2019-08-20
申请号:US16030035
申请日:2018-07-09
Applicant: INTERNATIONAL BUSINESS MACHINES CORPORATION
Inventor: Michael Engel , Mathias B. Steiner
IPC: H01L31/02 , H01L31/0232 , H01L31/109 , H01L31/0384 , H01L31/18 , H01L31/0216 , H01L31/101
Abstract: A method of forming a wavelength detector that includes forming a first transparent material layer having a uniform thickness on a first mirror structure, and forming an active element layer including a plurality of nanomaterial sections and electrodes in an alternating sequence atop the first transparent material layer. A second transparent material layer is formed having a plurality of different thickness portions atop the active element layer, wherein each thickness portion correlates to at least one of the plurality of nanomaterials. A second mirror structure is formed on the second transparent material layer.
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公开(公告)号:US10276698B2
公开(公告)日:2019-04-30
申请号:US14919312
申请日:2015-10-21
Applicant: INTERNATIONAL BUSINESS MACHINES CORPORATION
Inventor: Michael Engel , Mathias B. Steiner
IPC: H01L21/336 , H01L21/8234 , H01L29/66 , H01L29/16 , H01L29/786 , H01L29/417 , H01L29/775 , H01L29/778 , H01L51/05 , H01L51/00 , H01L29/24
Abstract: A method of forming an electrical device that includes forming a gate dielectric layer over a gate electrode, forming source and drain electrodes on opposing sides of the gate electrode, wherein one end of the source and drain electrodes provides a coplanar surface with the gate dielectric, and positioning a 1D or 2D nanoscale material on the coplanar surface to provide the channel region of the electrical device.
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24.
公开(公告)号:US10069028B2
公开(公告)日:2018-09-04
申请号:US15358783
申请日:2016-11-22
Applicant: INTERNATIONAL BUSINESS MACHINES CORPORATION
Inventor: Michael Engel , Mathias B. Steiner
IPC: H01L31/10 , H01L31/109 , H01L31/0232 , H01L31/0384 , H01L31/18
Abstract: A method of forming a wavelength detector that includes forming a first transparent material layer having a uniform thickness on a first mirror structure, and forming an active element layer including a plurality of nanomaterial sections and electrodes in an alternating sequence atop the first transparent material layer. A second transparent material layer is formed having a plurality of different thickness portions atop the active element layer, wherein each thickness portion correlates to at least one of the plurality of nanomaterials. A second mirror structure is formed on the second transparent material layer.
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25.
公开(公告)号:US09899547B2
公开(公告)日:2018-02-20
申请号:US15137252
申请日:2016-04-25
Applicant: INTERNATIONAL BUSINESS MACHINES CORPORATION
Inventor: Michael Engel , Mathias B. Steiner
IPC: H01L31/18 , H01L31/0232
CPC classification number: H01L31/109 , H01L31/02162 , H01L31/0232 , H01L31/02327 , H01L31/0384 , H01L31/03845 , H01L31/1013 , H01L31/18
Abstract: A method of forming a wavelength detector that includes forming a first transparent material layer having a uniform thickness on a first mirror structure, and forming an active element layer including a plurality of nanomaterial sections and electrodes in an alternating sequence atop the first transparent material layer. A second transparent material layer is formed having a plurality of different thickness portions atop the active element layer, wherein each thickness portion correlates to at least one of the plurality of nanomaterials. A second mirror structure is formed on the second transparent material layer.
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26.
公开(公告)号:US20170309769A1
公开(公告)日:2017-10-26
申请号:US15358783
申请日:2016-11-22
Applicant: INTERNATIONAL BUSINESS MACHINES CORPORATION
Inventor: Michael Engel , Mathias B. Steiner
IPC: H01L31/109 , H01L31/0232 , H01L31/0384
CPC classification number: H01L31/109 , H01L31/02162 , H01L31/0232 , H01L31/02327 , H01L31/0384 , H01L31/03845 , H01L31/1013 , H01L31/18
Abstract: A method of forming a wavelength detector that includes forming a first transparent material layer having a uniform thickness on a first mirror structure, and forming an active element layer including a plurality of nanomaterial sections and electrodes in an alternating sequence atop the first transparent material layer. A second transparent material layer is formed having a plurality of different thickness portions atop the active element layer, wherein each thickness portion correlates to at least one of the plurality of nanomaterials. A second mirror structure is formed on the second transparent material layer.
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27.
公开(公告)号:US20170309757A1
公开(公告)日:2017-10-26
申请号:US15137252
申请日:2016-04-25
Applicant: INTERNATIONAL BUSINESS MACHINES CORPORATION
Inventor: Michael Engel , Mathias B. Steiner
IPC: H01L31/0232 , H01L31/18
CPC classification number: H01L31/109 , H01L31/02162 , H01L31/0232 , H01L31/02327 , H01L31/0384 , H01L31/03845 , H01L31/1013 , H01L31/18
Abstract: A method of forming a wavelength detector that includes forming a first transparent material layer having a uniform thickness on a first mirror structure, and forming an active element layer including a plurality of nanomaterial sections and electrodes in an alternating sequence atop the first transparent material layer. A second transparent material layer is formed having a plurality of different thickness portions atop the active element layer, wherein each thickness portion correlates to at least one of the plurality of nanomaterials. A second mirror structure is formed on the second transparent material layer.
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28.
公开(公告)号:US20170292934A1
公开(公告)日:2017-10-12
申请号:US15093816
申请日:2016-04-08
Applicant: International Business Machines Corporation
Inventor: Jaione Tirapu Azpiroz , Michael Engel , Mathias B. Steiner
IPC: G01N27/447 , G01N35/00 , B01L3/00
CPC classification number: G01N27/44773 , B01L3/502715 , B01L3/50273 , B01L3/502761 , B01L2200/0652 , B01L2200/0668 , B01L2300/023 , B01L2300/04 , B01L2300/0627 , B01L2300/0816 , B01L2300/0864 , B01L2300/12 , B01L2400/0424 , G01N15/00 , G01N27/44704 , G01N27/4473 , G01N27/44791 , G01N35/00029 , G01N35/00871 , G01N2015/0053
Abstract: Method, apparatus, and computer program product for a microfluidic channel having a cover opposite its bottom and having electrodes with patterned two-dimensional conducting materials, such as graphene sheets integrated into the top of its bottom. Using the two-dimensional conducting materials, once a fluid sample is applied into the channel, highly localized modulated electric field distributions are generated inside the channel and the fluid sample. This generated field causes the inducing of dielectrophoretic (DEP) forces. These DEP forces are the same or greater than DEP forces that would result using metallic electrodes because of the sharp edges enabled by the two-dimension geometry of the two-dimensional conducting materials. Because of the induced forces, micro/nano-particles in the fluid sample are separated into particles that respond to a negative DEP force and particles that respond to a positive DEP. Microfluidic chips with microfluidic channels can be made using standard semiconductor manufacturing technology.
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公开(公告)号:US20170244055A1
公开(公告)日:2017-08-24
申请号:US15426677
申请日:2017-02-07
Applicant: INTERNATIONAL BUSINESS MACHINES CORPORATION
Inventor: Sarunya Bangsaruntip , Michael Engel , Shu-Jen Han
IPC: H01L51/05 , H01L29/66 , H01L21/02 , H01L29/06 , H01L29/423
Abstract: A field effect transistor including a dielectric layer on a substrate, a nano-structure material (NSM) layer on the dielectric layer, a source electrode and a drain electrode formed on the NSM layer, a gate dielectric formed on at least a portion of the NSM layer between the source electrode and the drain electrode, a T-shaped gate electrode formed between the source electrode and the drain electrode, where the NSM layer forms a channel of the FET, and a doping layer on the NSM layer extending at least from the sidewall of the source electrode to a first sidewall of the gate dielectric, and from a sidewall of the drain electrode to a second sidewall of the gate dielectric.
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公开(公告)号:US20170108362A1
公开(公告)日:2017-04-20
申请号:US14944766
申请日:2015-11-18
Applicant: International Business Machines Corporation
Inventor: Michael Engel , Rodrigo Neumann Barros Ferreira , Mathias Steiner
CPC classification number: G01R33/072 , G01F1/708 , G01F1/7088 , G01N27/745 , G01R33/07 , G01R33/1269 , H01L43/04 , H01L43/06 , H01L43/10 , H01L43/14
Abstract: A method of detecting a particle comprises magnetizing a particle using an AC magnetic field; generating an AC voltage in a sensing device having a conductive substantially 2-dimensional lattice structure from the magnetized particle; superimposing a DC magnetic field on the generated AC voltage in the sensing device; and measuring an AC Hall voltage at the sensing device.
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