公开(公告)号：US20060109519A1

公开(公告)日：2006-05-25

申请号：US10994862

申请日：2004-11-22

Applicant: Ronald Beselt ,  Frank Haran ,  John Harjula ,  Ulysse Dos Santos

Inventor： Ronald Beselt ,  Frank Haran ,  John Harjula ,  Ulysse Dos Santos

IPC: H04N1/32

CPC classification number: G01N21/89 ,  G01N21/3554 ,  G01N21/3559 ,  G01N21/8806 ,  G01N2201/103

Abstract: A scanning system includes a cable take-up mechanism that uses a series of pulleys that determine the bend diameters of a scanning system. The mechanism is particularly suited for a spectrometric, e.g., infrared, scanning system where moving scanner or sensor head essentially houses only the optical elements while essentially of all the other electronic and optical components associated with the measurement are housed in an easily accessible compartment that is remote from the moving scanner head. Light is transmitted through optical fiber cables. The cable take-up mechanism maintains the fiber optic cable at essentially constant total bend length and bend diameter thereby minimizing any dynamic changes to spectral bend losses as the optical head is scanned. The light weight construction of the sensor head further reduces vibrations associated with the moving scanner head.

公开(公告)号：US5298963A

公开(公告)日：1994-03-29

申请号：US842073

申请日：1992-02-26

Applicant: Kazuo Moriya ,  Takayuki Tsuzura

Inventor： Kazuo Moriya ,  Takayuki Tsuzura

IPC: G01N21/88 ,  G01N21/95

CPC classification number: G01N21/9501 ,  G01N21/8806 ,  G01N2021/8838 ,  G01N2021/8845 ,  G01N2021/8887 ,  G01N2201/0696 ,  G01N2201/103

Abstract: An apparatus for inspecting the surface of a sheet-like object has a movable stage with an object mounted thereon; a source for lighting the object on the stage, particularly by making a plurality of illumination lights respectively having different wavelengths incident on the surface of the object from respective predetermined directions; image pickup device for fetching the image of the object under illumination of the light as image data or the images of parts of the object as image data obtained on the respective different wavelengths; image data processing device for inspecting the image data for defects; and a device for synchronizing control either for flashing the light at a predetermined time interval just after the stage commences its movement, synchronously with fetching the image data or for flashing the light and simultaneously fetching the image data obtained on the respective different wavelengths, synchronously with the object on the stage reaching respective predetermined positions while moving the stage.

Abstract translation: 用于检查片状物体的表面的装置具有安装在其上的物体的可移动台; 特别是通过从各个预定方向制造分别具有入射到物体表面上的不同波长的多个照明光源，用于点亮舞台上的物体的源; 图像拾取装置，用于在照明光下取出对象的图像作为图像数据或对象的部分的图像作为在各个不同波长上获得的图像数据; 图像数据处理装置，用于检查图像数据的缺陷; 以及用于同步控制的装置，用于在阶段开始其移动之后的预定时间间隔闪光，同步获取图像数据或闪烁光，同时取出在各个不同波长上获得的图像数据，与 舞台上的物体在移动舞台时达到相应的预定位置。

公开(公告)号：US5038035A

公开(公告)日：1991-08-06

申请号：US376664

申请日：1989-07-06

Applicant: Nobuhiko Nishimura ,  Fujimitsu Masuyama ,  Akira Kaneko

Inventor： Nobuhiko Nishimura ,  Fujimitsu Masuyama ,  Akira Kaneko

IPC: G01N21/88 ,  G01N15/14 ,  G01N21/17 ,  G02B21/00 ,  G06T1/00

CPC classification number: G02B21/002 ,  G01N15/1475 ,  G01N2021/8887 ,  G01N2201/103

Abstract: An automatic structure analyzing/processing apparatus for surface structure of material includes a structure observing device for observing structure of a surface of material to produce an electrical image signal thereof, a sample stage disposed opposite to the observing means an image processing device for converting the image signal from the structure observing device to digital signal and expanding or contracting a desired image reproduced from a memory means or combining a plurality of images reproduced from the memory means to produce an image signal, the memory device storing the digital signal processed by the image processing device, and a display device for displaying the image signal produced from the image processing device as an image, whereby the structure of the surface of material is stored in the memory as the image and examination of the structure can be made readily in a short time.

公开(公告)号：US09909997B2

公开(公告)日：2018-03-06

申请号：US14422081

申请日：2013-08-23

Applicant: LUOYANG LANDGLASS TECHNOLOGY CO., LTD.

Inventor： Yanbing Li ,  Bin Liu

IPC: H04N7/18 ,  G01N21/958 ,  G01B11/25 ,  G01N21/896 ,  C03B35/00 ,  G01B11/06 ,  G01B11/16 ,  G01N21/88 ,  H04N7/00 ,  G01N21/49

CPC classification number: G01N21/958 ,  C03B35/00 ,  G01B11/0691 ,  G01B11/167 ,  G01B11/2518 ,  G01B11/2522 ,  G01N21/49 ,  G01N21/8806 ,  G01N21/896 ,  G01N2201/06113 ,  G01N2201/103 ,  H04N7/00

Abstract: A detection system based on modulation of line structured laser image of glass includes a processing section, a control system, and roller conveying mechanisms. Detection mechanism provided over entrance of the processing section includes shell and camera with laser which emits beam on the surface of the glass in the gap between sliding rollers. Focal plane of the camera corresponds to the beam irradiation surface, and signal output terminal of the camera is connected with the control system in such a way that when glass passes the detection area, laser irradiates the glass surface and the line structured laser is modulated based on the glass to form laser modulation image with distribution of light and shade, staggered movement direction, or distorted laser lines. The camera transmits the captured glass information and parameters to the control system.

公开(公告)号：US20180045570A1

公开(公告)日：2018-02-15

申请号：US15552752

申请日：2016-03-08

Applicant: RENISHAW PLC

Inventor： Timothy SMITH ,  Richard John BLACKWELL-WHITEHEAD

IPC: G01J3/44 ,  G01J3/06 ,  G01N21/65

CPC classification number: G01J3/44 ,  G01J3/06 ,  G01J2003/064 ,  G01N21/65 ,  G01N2201/103 ,  G01N2201/1045 ,  G01N2201/1087 ,  G02B21/002

Abstract: A transmission Raman spectroscopy apparatus has a light source for generating a light profile on a sample, a photodetector having at least one photodetector element, collection optics arranged to collect Raman scattered light transmitted through the sample and direct the Raman light onto the at least one photodetector element and a support for supporting the sample. The support and light source are arranged such that the light profile can be moved relative to the sample in order that the at least one photodetector element receives Raman scattered light generated for different locations of the light profile on the sample.

公开(公告)号：US09891177B2

公开(公告)日：2018-02-13

申请号：US14506321

申请日：2014-10-03

Applicant: KLA-Tencor Corporation

Inventor： Jijen Vazhaeparambil ,  Guoheng Zhao ,  Daniel Kavaldjiev ,  Anatoly Romanovsky ,  Ivan Maleev ,  Christian Wolters ,  Stephen Biellak ,  Bret Whiteside ,  Donald Pettibone ,  Yung-Ho Alex Chuang ,  David W. Shortt

IPC: G01N21/88 ,  G01N21/95 ,  G06T7/00 ,  G01N21/956

CPC classification number: G01N21/8851 ,  G01N21/9501 ,  G01N21/956 ,  G01N2021/8887 ,  G01N2021/8896 ,  G01N2201/06113 ,  G01N2201/103 ,  G01N2201/12 ,  G06T7/0004 ,  G06T2207/10004 ,  G06T2207/30148

Abstract: A wafer scanning system includes imaging collection optics to reduce the effective spot size. Smaller spot size decreases the number of photons scattered by the surface proportionally to the area of the spot. Air scatter is also reduced. TDI is used to produce a wafer image based on a plurality of image signals integrated over the direction of linear motion of the wafer. An illumination system floods the wafer with light, and the task of creating the spot is allocated to the imaging collection optics.

公开(公告)号：US09874529B2

公开(公告)日：2018-01-23

申请号：US15116612

申请日：2015-02-04

Applicant: NSK AMERICAS, INC.

Inventor： George Morrison, III ,  Ty Alan Brown ,  Timothy Brian Rood

IPC: G01N21/00 ,  G01N21/95 ,  G01N21/952 ,  B62D65/02 ,  G01B11/00 ,  G01N21/88 ,  G01B5/00

CPC classification number: G01N21/9515 ,  B62D65/02 ,  G01B5/0025 ,  G01B11/00 ,  G01N21/952 ,  G01N2021/888 ,  G01N2201/06113 ,  G01N2201/103

Abstract: An apparatus (110) (and associated method) for inspecting a steering column assembly (10) including a motor (114a) driven drive sleeve (128) supported in a headstock (114) and having a longitudinal axis, and being adapted for receiving and engaging a portion of the steering column assembly, and at least one optical scanning device (160a, 160b, 160c) adapted to optically scan a feature of interest of the steering column assembly (10) while the shaft of the steering column assembly (10) is rotated for gathering data for identifying one or more deviations from one or more predetermined values for the feature of interest.

公开(公告)号：US09839946B2

公开(公告)日：2017-12-12

申请号：US14614198

申请日：2015-02-04

Applicant: The Boeing Company

Inventor： Morteza Safai ,  Jeffrey G. Thompson

IPC: G06K9/00 ,  B08B5/02 ,  G01N21/94 ,  G01N21/88 ,  B29C70/30 ,  G01N21/84

CPC classification number: B08B5/02 ,  B29C70/30 ,  G01N21/8851 ,  G01N21/94 ,  G01N2021/8472 ,  G01N2201/103

Abstract: A system for the detection of foreign object debris material on a surface of a composite part being manufactured. A platform is configured to move over the surface. A thermal excitation source is fixed to the platform and configured to direct infrared radiation across the surface. An infrared camera is also fixed to the platform and configured to scan the surface as the platform moves over the surface to detect and output a signal proportional to infrared radiation emitted by the surface and/or by any foreign object debris material on the surface in response to the infrared radiation from the excitation source. A controller is coupled to the excitation source and to the infrared camera and is configured to compare the signal from the infrared camera with a first predetermined threshold signal to detect if any foreign object debris material is located on the surface.

公开(公告)号：US09810640B2

公开(公告)日：2017-11-07

申请号：US15006976

申请日：2016-01-26

Applicant: CHENG MEI INSTRUMENT TECHNOLOGY CO., LTD.

Inventor： Chao-Yi Yeh ,  Pin-Chuan Su ,  Shang-Iun Yang ,  Chih Yuan Liu

IPC: G01N21/00 ,  G01N21/89 ,  G01N21/88 ,  G01N21/95

CPC classification number: G01N21/8914 ,  G01N21/8806 ,  G01N2021/8841 ,  G01N2021/9513 ,  G01N2201/103

Abstract: A panel inspection apparatus is provided. The panel inspection apparatus has a support platform, a delivery platform and a panel inspection assembly. The delivery platform is disposed on the support platform, and the delivery platform has a push module for delivering the panel. The panel inspection assembly includes a plurality of light source modules and a plurality of image-taking modules corresponding to the light source modules. The light source modules include a front light source, a first horizontal light source, and a back light source. The image-taking modules include a front light image-taking module, a first horizontal light image-taking module, and a back light image-taking module. The push module delivers the panel across the support platform so that a plurality of light beams emitted from the light source modules can scan the panel to finish the panel inspection process.

公开(公告)号：US20170044588A1

公开(公告)日：2017-02-16

申请号：US15305703

申请日：2015-03-30

Applicant: Merck Patent GmbH

Inventor： Luc FELDEN ,  Marine BOUTHILLON ,  Stephane OLIVIER ,  Pierre WOEHL ,  Pierre GUEDON ,  Florian ALLARD

IPC: C12Q1/04 ,  G01N21/47 ,  C12Q1/22 ,  G01N21/55 ,  G06K9/00 ,  G06T7/00

CPC classification number: C12Q1/04 ,  C12Q1/22 ,  G01N21/47 ,  G01N21/55 ,  G01N2021/1765 ,  G01N2021/4704 ,  G01N2021/4709 ,  G01N2021/4711 ,  G01N2201/103 ,  G06K9/00134 ,  G06T7/0012 ,  G06T2207/10012 ,  G06T2207/10056 ,  G06T2207/30024

Abstract: The present invention is directed to a method and an apparatus for detecting micro-colonies growing on a membrane or an agarose medium of a sample in a closed device. According to the invention the sample is irradiated with a light incident at an angle (β) with respect to the normal to the membrane or the surface of the agarose medium from outside the device. An incident area of the light on the membrane or the surface of the agarose medium is imaged by means of a light receiving element using an imaging angle (α) different from angle (β) with respect to the normal to the membrane or the surface of the agarose medium from outside the device. The light reflected, scattered and/or diffused from the membrane or the surface of the agarose medium and/or the micro-colonies on the membrane and/or the micro-colonies on the agarose medium is detected.

Abstract translation: 本发明涉及一种用于检测在封闭装置中在样品的膜或琼脂糖培养基上生长的微菌落的方法和装置。 根据本发明，从设备外部以相对于膜的法线或琼脂糖介质的表面以角度（β）入射的光照射样品。 使用不同于角度（β）的成像角（α）相对于膜的法线或表面的受光元件使膜的膜或琼脂糖介质的表面上的光的入射面积成像 琼脂糖介质从设备外部。 检测从膜或琼脂糖介质的表面和/或膜上的微生物群和/或琼脂糖培养基上的微菌落反射，散射和/或扩散的光。