Abstract:
An electronic device includes an integrated circuit chip mounted to a heat slug. The heat slug has a peripheral region having first thickness along a first direction, the peripheral region surrounding a recess region (having a second, smaller, thickness along the first direction) that defines a chip mounting surface along a second direction perpendicular to the first direction. The recess region defines side borders and a nook extends into the heat slug along the side borders. An insulating body embeds the integrated circuit one chip and heat slug. Material of the insulating body fills the nook.
Abstract:
A packaged device, wherein at least one sensitive portion of a chip is enclosed in a chamber formed by a package. The package has an air-permeable area having a plurality of holes and a liquid-repellent structure so as to enable passage of air between an external environment and the chamber and block the passage of liquids.
Abstract:
A Voltage regulator includes a first input terminal configured to receive an input supply voltage, includes a second input terminal configured to receive a regulated output supply voltage as a function of the input supply voltage or to receive a test supply voltage and comprises a power transistor including an input terminal configured to receive the input supply voltage and including an output terminal configured to generate the regulated output supply voltage. The Voltage regulator is configured, during a start-up phase of a test operation mode, to receive a control signal equal to the input supply voltage, is configured to receive the input supply voltage having a substantially increasing trend, detect that the input supply voltage is equal to a first voltage threshold and generate, as a function of the detected signal and of the control signal, a by-pass signal having a transition from a first logic value to a second logic value for indicating a by-pass status of the Voltage regulator, and is configured to receive the by-pass signal having the second logic value and open the power transistor. The second input terminal is configured, during the test operation mode, to receive the test supply voltage having a test value different from a nominal value of the regulated output supply voltage.
Abstract:
A probe card includes a number probes. Each probe is adapted to contact a corresponding terminal of a circuit integrated in at least one die of a semiconductor material wafer during a test phase of the wafer. The probes include at least one probe adapted to provide and/or receive a radio frequency test signal to/from the corresponding terminal during the test phase. The probe card further includes at least one electromagnetic shield structure corresponding to the at least one probe adapted to provide and/or receive the radio frequency test signal for the at least partial shielding of an electromagnetic field irradiated by such at least one probe adapted to provide and/or receive the radio frequency test signal.
Abstract:
Indexing a plurality of die obtainable from a material wafer comprising a plurality of stacked material layers. Each die is obtained in a respective position of the wafer. A manufacturing stage comprises at least two steps for treating a respective superficial portion of the material wafer that corresponds to a subset of said plurality of dies using the at least one lithographic mask through the exposition to the proper radiation in temporal succession. The method may include providing a die index on each die which is indicative of the position of the respective die by forming an external index indicative of the position of the superficial portion of the material wafer corresponding to the subset of the plurality of dies including said die and may comprise a plurality of electronic components electrically coupled to each other by means of a respective common control line.
Abstract:
A multilevel interconnect structure for a semiconductor device includes an intermetal dielectric layer with funnel-shaped connecting vias. The funnel-shaped connecting vias are provided in connection with systems exhibiting submicron spacings. The architecture of the multilevel interconnect structure provides a low resistance connecting via.
Abstract:
An oscillator circuit includes first and second oscillators arranged in a series configuration between a supply voltage node and a reference voltage node. The first and second oscillators are configured to receive a synchronizing signal for controlling synchronization in frequency and phase. An electromagnetic network provided to couple the first and the second oscillators includes a transformer with a primary circuit and a secondary circuit. The primary circuit includes a first portion coupled to the first oscillator and second portion coupled to the second oscillator. The first and second portions are connected by a circuit element for reuse of current between the first and second oscillators. The oscillator circuit is fabricated as an integrated circuit device wherein the electromagnetic network is formed in metallization layers of the device. The secondary circuit generates an output power combining power provided from the first and second portions of the primary circuit.
Abstract:
An embodiment for manufacturing electronic devices is proposed. The embodiment includes the following phases: a) forming a plurality of chips in a semiconductor material wafer including a main surface; each chip includes respective integrated electronic components and respective contact pads facing the main surface; said contact pads are electrically coupled to the integrated electronic components; b) attaching at least one conductive ribbon to at least one contact pad of each chip; c) covering the main surface of the semiconductor material wafer and the at least one conductive ribbon with a layer of plastic material; d) lapping an exposed surface of the layer of plastic material to remove a portion of the plastic material layer at least to uncover portions of the at least one conductive ribbon, and e) sectioning the semiconductor material wafer to separate the chips.
Abstract:
A system, such as a System-on-Chip includes an interface component or PLUG which generates transactions over an IP block, such as an interconnect serving one or more clients via virtual channels. The client or clients are mapped onto the virtual channels via client/virtual channel mappings. The virtual channels are provided as a first set of virtual channels in the interface component which cooperate with a second set of virtual channels in the IP block. First and second client/virtual channel mappings for the first set of virtual channels and the second set of virtual channels are provided. The first and second client/virtual channel mappings are separately programmable and mutually decoupled from one another.
Abstract:
Applicant has recognized and appreciated the desirability of powering an actuator using power drawn from one or both of an energy storage device and a spindle motor. In some embodiments, following a loss of external power to a hard disk drive, the hard disk drive (or one or more components thereof) determines whether to provide the actuator with power drawn from the spindle motor or to provide the actuator with power drawn from the spindle motor and from the energy storage device. In some embodiments, the hard disk drive (or the component(s) thereof) may additionally or alternatively determine whether to charge the energy storage device using power drawn from the spindle motor. In some embodiments, the drive may make the determinations based on an amount of power that the actuator is to consume at a time and an amount of power that the spindle motor can provide at the time.