Test method of embedded capacitor and test system thereof
    32.
    发明申请
    Test method of embedded capacitor and test system thereof 失效
    嵌入式电容器的测试方法及其测试系统

    公开(公告)号:US20070168148A1

    公开(公告)日:2007-07-19

    申请号:US11591381

    申请日:2006-11-01

    CPC classification number: G01R31/2818 G01R31/2805 G01R31/304

    Abstract: A test method of an embedded capacitor and test system thereof are provided. The method and system are used to determine an electrical specification of the embedded capacitive component in a circuit board substrate, thereby avoiding executing a follow-up fabricating process for the circuit board substrate not satisfying the desired specification. In the method and system, a geometric size of the embedded capacitor is measured, and a relation value between the electrical parameter and the geometric size and a standard electrical parameter are obtained from a model database, to calculate the electrical parameter of the embedded capacitor. Then, the electrical parameter of the embedded capacitor is compared with the standard electrical parameter, to obtain an error value. Therefore, according to the error value, it may be acquired whether or not the circuit board substrate satisfies set electrical specifications.

    Abstract translation: 提供了一种嵌入式电容器及其测试系统的测试方法。 该方法和系统用于确定电路板基板中的嵌入式电容元件的电气规格,从而避免执行不满足期望规格的电路板基板的后续制造工艺。 在该方法和系统中,测量嵌入式电容器的几何尺寸,并从模型数据库中获得电参数和几何尺寸之间的关系值以及标准电参数,以计算嵌入式电容器的电参数。 然后,将嵌入式电容器的电气参数与标准电气参数进行比较,以获得误差值。 因此,根据误差值,可以获取电路板基板是否满足设定的电气规格。

    Composite distributed dielectric structure
    34.
    发明申请
    Composite distributed dielectric structure 失效
    复合分布介质结构

    公开(公告)号:US20060285273A1

    公开(公告)日:2006-12-21

    申请号:US11156350

    申请日:2005-06-17

    Abstract: This invention discloses a composite distributed dielectric structure. It comprises one or more conductor layers, one or more dielectric layers distributed on the conductor layers, and one or more conductor traces distributed on the dielectric layers. One or more dielectric plates can be further around the conductor traces. The dielectric layers or plates may or may not have plural dielectric materials therein, respectively described in two embodiments. Each conductor trace lies on a dielectric material without crossing two different dielectric materials. Two or more dielectric layers may be stacked on the conductor layers The invention provides a low cost and practical dielectric structure for interconnect systems to reduce dielectric loss, cross talk, and signal propagation delay and to well control the impedance matching while maintaining proper heat dissipation and noise reduction at high frequency transmission.

    Abstract translation: 本发明公开了一种复合分布介质结构。 它包括一个或多个导体层,分布在导体层上的一个或多个电介质层,以及分布在电介质层上的一个或多个导体迹线。 一个或多个电介质板可以进一步围绕导体迹线。 在两个实施例中分别描述了介电层或板可以具有或可以不具有多个电介质材料。 每个导体迹线位于介电材料上,而不会穿过两种不同的介电材料。 两个或多个电介质层可以堆叠在导体层上本发明为互连系统提供了一种低成本和实用的电介质结构,以减少介质损耗,串扰和信号传播延迟,并且在保持适当的散热的同时良好地控制阻抗匹配, 高频传输降噪。

    Apparatus and method for testing component built in circuit board
    35.
    发明申请
    Apparatus and method for testing component built in circuit board 有权
    用于测试电路板内置组件的装置和方法

    公开(公告)号:US20060261482A1

    公开(公告)日:2006-11-23

    申请号:US11131741

    申请日:2005-05-18

    Abstract: A multi-layered circuit board a built-in component including multiple terminals, at least one signal pad formed on a top surface of the multi-layered circuit board for signal transmission, each of the at least one signal pad corresponding to one of the multiple terminals, and at least one test pad formed on the top surface of the multi-layered circuit board, each of the at least one test pad corresponding to one of the at least one signal pad for testing an electric path extending from the one signal pad through the one terminal to the each of the at least one test pad.

    Abstract translation: 一种多层电路板,包括多个端子的内置组件,至少一个形成在用于信号传输的多层电路板的顶表面上的信号焊盘,所述至少一个信号焊盘中的每一个对应于多个 端子和形成在多层电路板的顶表面上的至少一个测试焊盘,所述至少一个测试焊盘中的每一个对应于至少一个信号焊盘中的一个,用于测试从一个信号焊盘延伸的电路径 通过所述一个端子到所述至少一个测试垫中的每一个。

    Regulable test integrated circuit system for signal noise and method of using same
    37.
    发明授权
    Regulable test integrated circuit system for signal noise and method of using same 失效
    用于信号噪声的可调谐测试集成电路系统及其使用方法

    公开(公告)号:US06683469B2

    公开(公告)日:2004-01-27

    申请号:US09858538

    申请日:2001-05-17

    CPC classification number: G01R31/318572 G01R29/26

    Abstract: A regulable test IC system for signal noise on the electrical analysis point, comprising: a power supply, for providing a test voltage in the system; a pulse generator, for providing a test frequency in a noise testing of the system; a regulable test IC with different signal pads capable of regulable testing signal noise with the test frequency from the pulse generator and the test voltage from the power supply in a plurality of built-in specific structures, under the basis of an assigned current standard; and a digital detection device with a display, for displaying and recording the result of the regulable test.

    Abstract translation: 一种用于电气分析点上的信号噪声的可调节测试IC系统,包括:用于在系统中提供测试电压的电源; 脉冲发生器,用于在系统的噪声测试中提供测试频率; 具有不同信号焊盘的可调节测试IC,其具有在分配的当前标准的基础上具有来自脉冲发生器的测试频率的可调节测试信号噪声和来自多个内置特定结构中的电源的测试电压; 以及具有显示器的数字检测装置,用于显示和记录可调节测试的结果。

    Mirror image shielding structure
    40.
    发明授权
    Mirror image shielding structure 有权
    镜像屏蔽结构

    公开(公告)号:US08179695B2

    公开(公告)日:2012-05-15

    申请号:US12783478

    申请日:2010-05-19

    Abstract: A mirror image shielding structure is provided, which includes an electronic element and a ground shielding plane below the electronic element. The shape of the ground shielding plane is identical to the projection shape of the electronic element, and the horizontal size of the ground shielding plane is greater than or equal to that of the electronic element. Thus, the parasitic effect between the electronic element and the ground shielding plane is effectively reduced, and the vertical coupling effect between electronic elements is also reduced. Furthermore, the vertical impact on the signal integrity of the embedded elements caused by the layout of the transmission lines is prevented.

    Abstract translation: 提供一种镜像屏蔽结构,其包括电子元件和电子元件下方的接地屏蔽平面。 接地屏蔽面的形状与电子元件的突出形状相同,接地屏蔽面的水平尺寸大于或等于电子元件的尺寸。 因此,有效地减小了电子元件与接地屏蔽层之间的寄生效应,并且电子元件之间的垂直耦合效应也降低。 此外,防止了由传输线的布局引起的对嵌入元件的信号完整性的垂直影响。

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