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公开(公告)号:US20220127721A1
公开(公告)日:2022-04-28
申请号:US17078474
申请日:2020-10-23
Applicant: Applied Materials, Inc. , National University of Singapore
Inventor: Vicknesh Sahmuganathan , Zhongxin Chen , Gu Jiteng , Eswaranand Venkatasubramanian , Loh Kian Ping , Abhijit Basu Mallick , John Sudijono
IPC: C23C16/27 , H01L21/02 , C23C16/54 , C23C16/455 , C23C16/511
Abstract: Methods of depositing a diamond layer are described, which may be used in the manufacture of integrated circuits. Methods include processing a substrate in which nanocrystalline diamond deposited on a substrate, wherein the processing methods result in a nanocrystalline diamond hard mask having high hardness.
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公开(公告)号:US12037679B2
公开(公告)日:2024-07-16
申请号:US17633010
申请日:2021-12-15
Applicant: Applied Materials, Inc. , National University of Singapore
Inventor: Vicknesh Sahmuganathan , Jiteng Gu , Zhongxin Chen , Kian Ping Loh , John Sudijono , Haisen Xu , Sze Chieh Tan , Yuanxing Han , Jiecong Tang , Eswaranand Venkatasubramanian , Abhijit Basu Mallick
CPC classification number: C23C16/274 , C01B32/26 , C08F2/48 , C23C16/0272 , C23C16/042 , C23C16/511
Abstract: Apparatuses and methods for forming a film on a substrate are described. The film is formed on the substrate by depositing an adamantane monomer and an initiator on the substrate to form a polymerizable seed layer and curing the polymerizable seed layer to form a polyadamantane layer.
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公开(公告)号:US20240234127A1
公开(公告)日:2024-07-11
申请号:US18615539
申请日:2024-03-25
Applicant: Applied Materials, Inc.
Inventor: Xinke Wang , Bhaskar Jyoti Bhuyan , Zeqing Shen , Susmit Singha Roy , Abhijit Basu Mallick , Jiecong Tang , John Sudijono , Mark Saly
CPC classification number: H01L21/02118 , C23C16/04 , C23C16/26 , C23C16/56 , H01L21/02205 , H01L21/0228 , H01L21/02304
Abstract: Methods of selectively depositing a carbon-containing layer are described. Exemplary processing methods may include flowing a first precursor over a substrate comprising a metal surface and a non-metal surface to form a first portion of an initial carbon-containing film on the metal surface. The methods may include removing a first precursor effluent from the substrate. A second precursor may then be flowed over the substrate to react with the first portion of the initial carbon-containing layer. The methods may include removing a second precursor effluent from the substrate. The methods may include pre-treating the metal surface of the substrate to form a metal oxide surface on the metal surface.
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公开(公告)号:US20240229231A1
公开(公告)日:2024-07-11
申请号:US18585303
申请日:2024-02-23
Applicant: Applied Materials, Inc.
Inventor: Sze Chieh Tan , Vicknesh Sahmuganathan , Eswaranand Venkatasubramanian , Abhijit Basu Mallick , John Sudijono
IPC: C23C16/27 , B82Y40/00 , C23C16/02 , C23C16/455
CPC classification number: C23C16/279 , C23C16/0227 , C23C16/45536 , B82Y40/00
Abstract: Methods of depositing a nanocrystalline diamond film are described. The method may be used in the manufacture of integrated circuits. Methods include treating a substrate with a mild plasma to form a treated substrate surface, incubating the treated substrate with a carbon-rich weak plasma to nucleate diamond particles on the treated substrate surface, followed by treating the substrate with a strong plasma to form a nanocrystalline diamond film.
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公开(公告)号:US20240055255A1
公开(公告)日:2024-02-15
申请号:US17880797
申请日:2022-08-04
Applicant: Applied Materials, Inc.
Inventor: Zeqing Shen , Xinke Wang , Susmit Singha Roy , Abhijit Basu Mallick , Bhaskar Jyoti Bhuyan , John Sudijono
IPC: H01L21/033 , H01L21/02
CPC classification number: H01L21/0337 , H01L21/02271 , H01L21/02337 , H01L21/02211
Abstract: Methods of selectively depositing a carbon-containing layer are described. Exemplary processing methods may include treating a substrate comprising a carbon-containing surface and a silicon-containing surface with one or more of ozone or hydrogen peroxide to passivate the silicon-containing surface. In one or more embodiments, a carbon-containing layer is then selectively deposited on the carbon-containing surface and not on the silicon-containing surface by flowing a first precursor over the substrate to form a first portion of an initial carbon-containing film on the carbon-containing surface and not on the silicon-containing surface. The methods may include removing a first precursor effluent from the substrate. A second precursor may then be flowed over the substrate to react with the first portion of the initial carbon-containing layer. The methods may include removing a second precursor effluent from the substrate.
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公开(公告)号:US20230382933A1
公开(公告)日:2023-11-30
申请号:US18232421
申请日:2023-08-10
Applicant: Applied Materials, Inc.
Inventor: Chandan Kr Barik , John Sudijono , Chandan Das , Doreen Wei Ying Yong , Mark Saly , Bhaskar Jyoti Bhuyan , Feng Q. Liu
CPC classification number: C07F11/005 , C23C16/45553 , C23C16/4408 , C23C16/0272 , C23C16/18 , C23C16/45527 , C23C16/56 , C23C16/0227 , C23C16/0209
Abstract: Molybdenum(0) and coordination complexes are described. Methods for depositing molybdenum-containing films on a substrate are described. The substrate is exposed to a molybdenum precursor and a reactant to form the molybdenum-containing film (e.g., elemental molybdenum, molybdenum oxide, molybdenum carbide, molybdenum silicide, molybdenum disulfide, molybdenum nitride). The exposures can be sequential or simultaneous.
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公开(公告)号:US20230279540A1
公开(公告)日:2023-09-07
申请号:US17633010
申请日:2021-12-15
Applicant: Applied Materials, Inc. , National University of Singapore
Inventor: Vicknesh Sahmuganathan , Jiteng Gu , Zhongxin Chen , Kian Ping Loh , John Sudijono , Haisen Xu , Sze Chieh Tan , Yuanxing Han , Jiecong Tang , Eswaranand Venkatasubramanian , Abhijit Basu Mallick
CPC classification number: C23C16/274 , C01B32/26 , C08F2/48 , C23C16/0272 , C23C16/042 , C23C16/511
Abstract: Apparatuses and methods for forming a film on a substrate are described. The film is formed on the substrate by depositing an adamantane monomer and an initiator on the substrate to form a polymerizable seed layer and curing the polymerizable seed layer to form a polyadamantane layer.
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公开(公告)号:US20230142926A1
公开(公告)日:2023-05-11
申请号:US18096347
申请日:2023-01-12
Applicant: Applied Materials, Inc.
Inventor: Yong Wang , Doreen Wei Ying Yong , Bhaskar Jyoti Bhuyan , John Sudijono
CPC classification number: C23C16/0227 , C23C16/04 , C23C22/82 , C23C16/56 , C23C22/77
Abstract: Methods of patterning semiconductor devices comprising selective deposition methods are described. A blocking layer is deposited on a metal surface of a semiconductor device before deposition of a dielectric material on a dielectric surface. Methods include exposing a substrate surface including a metal surface and a dielectric surface to a heterocyclic reactant comprising a headgroup and a tailgroup in a processing chamber and selectively depositing the heterocyclic reactant on the metal surface to form a passivation layer, wherein the heterocyclic headgroup selectively reacts and binds to the metal surface.
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公开(公告)号:US20220406595A1
公开(公告)日:2022-12-22
申请号:US17355154
申请日:2021-06-22
Applicant: Applied Materials, Inc. , National University of Singapore
Inventor: Chandan Kr Barik , Doreen Wei Ying Yong , John Sudijono , Cong Trinh , Bhaskar Jyoti Bhuyan , Michael Haverty , Muthukumar Kaliappan , Yingqian Chen , Anil Kumar Tummanapelli , Richard Ming Wah Wong
IPC: H01L21/02 , C23C16/34 , C23C16/40 , C23C16/455
Abstract: Novel cyclic silicon precursors and oxidants are described. Methods for depositing silicon-containing films on a substrate are described. The substrate is exposed to a silicon precursor and a reactant to form the silicon-containing film (e.g., elemental silicon, silicon oxide, silicon nitride). The exposures can be sequential or simultaneous.
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公开(公告)号:US20220356197A1
公开(公告)日:2022-11-10
申请号:US17236020
申请日:2021-04-21
Applicant: Applied Materials, Inc.
Inventor: Chandan Kr Barik , John Sudijono , Chandan Das , Doreen Wei Ying Yong , Mark Saly , Bhaskar Jyoti Bhuyan , Feng Q. Liu
Abstract: Molybdenum(0) and coordination complexes are described. Methods for depositing molybdenum-containing films on a substrate are described. The substrate is exposed to a molybdenum precursor and a reactant to form the molybdenum-containing film (e.g., elemental molybdenum, molybdenum oxide, molybdenum carbide, molybdenum silicide, molybdenum disulfide, molybdenum nitride). The exposures can be sequential or simultaneous.
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