SHORT DETECTION AND INVERSION
    43.
    发明申请
    SHORT DETECTION AND INVERSION 有权
    短期检测和反转

    公开(公告)号:US20170069397A1

    公开(公告)日:2017-03-09

    申请号:US15356223

    申请日:2016-11-18

    Abstract: In some examples, a memory device may be configured to store data in either an original or an inverted state based at least in part on a state associated with one or more shorted bit cells. For instance, the memory device may be configured to identify a shorted bit cell within a memory array and to store the data in the memory array, such that a state of the data bit stored in the shorted bit cell matches the state associated with the shorted bit cell.

    Abstract translation: 在一些示例中,存储器设备可以被配置为至少部分地基于与一个或多个短路位单元相关联的状态来存储处于原始或反相状态的数据。 例如,存储器设备可以被配置为识别存储器阵列内的短路位单元并且将数据存储在存储器阵列中,使得存储在短路位单元中的数据位的状态与短路相关联的状态匹配 位单元格。

    Circuit and method for controlling MRAM cell bias voltages
    44.
    发明授权
    Circuit and method for controlling MRAM cell bias voltages 有权
    用于控制MRAM单元偏置电压的电路和方法

    公开(公告)号:US09542989B2

    公开(公告)日:2017-01-10

    申请号:US14887426

    申请日:2015-10-20

    Abstract: A cell bias control circuit maximizes the performance of devices in the read/write path of memory cells (magnetic tunnel junction device+transistor) without exceeding leakage current or reliability limits by automatically adjusting multiple control inputs of the read/write path at the memory array according to predefined profiles over supply voltage, temperature, and process corner variations by applying any specific reference parameter profiles to the memory array.

    Abstract translation: 电池偏置控制电路通过自动调节存储器阵列上的读/写路径的多个控制输入,使存储器单元(磁隧道结器件+晶体管)的读/写路径中的器件的性能最大化,而不会超过泄漏电流或可靠性限制 根据电源电压,温度和过程角变化的预定义配置,通过将任何特定参考参数配置文件应用于存储器阵列。

    ECC word configuration for system-level ECC compatibility
    45.
    发明授权
    ECC word configuration for system-level ECC compatibility 有权
    ECC字配置,用于系统级ECC兼容性

    公开(公告)号:US09529672B2

    公开(公告)日:2016-12-27

    申请号:US14496964

    申请日:2014-09-25

    CPC classification number: H03M13/2906 G06F11/1012 G06F11/1076

    Abstract: A memory device includes memory arrays configured to store pages of data organized into multiple ECC words. The memory device also includes at least one input/output pad for each ECC word associated with a page, such that a first level of error correction may be performed by the memory device on each of the ECC words associated with a page and a second level of error correction is performed on the data output by each of the input/output pads during a particular period of time.

    Abstract translation: 存储器设备包括被配置为存储组织成多个ECC字的数据页的存储器阵列。 存储装置还包括用于与页面相关联的每个ECC字的至少一个输入/输出焊盘,使得存储器装置可以在与页面和第二级相关联的每个ECC字上执行第一级错误校正 在特定时间段内对每个输入/输出焊盘输出的数据执行纠错。

    Short detection and inversion
    46.
    发明授权
    Short detection and inversion 有权
    短检测和反转

    公开(公告)号:US09502089B2

    公开(公告)日:2016-11-22

    申请号:US14502287

    申请日:2014-09-30

    Abstract: In some examples, a memory device may be configured to store data in either an original or an inverted state based at least in part on a state associated with one or more shorted bit cells. For instance, the memory device may be configured to identify a shorted bit cell within a memory array and to store the data in the memory array, such that a state of the data bit stored in the shorted bit cell matches the state associated with the shorted bit cell.

    Abstract translation: 在一些示例中,存储器设备可以被配置为至少部分地基于与一个或多个短路位单元相关联的状态来存储处于原始或反相状态的数据。 例如,存储器设备可以被配置为识别存储器阵列内的短路位单元并且将数据存储在存储器阵列中,使得存储在短路位单元中的数据位的状态与短路相关联的状态匹配 位单元格。

    Memory device with differential bit cells
    49.
    发明授权
    Memory device with differential bit cells 有权
    具有差分位单元的存储器件

    公开(公告)号:US09336848B2

    公开(公告)日:2016-05-10

    申请号:US14727965

    申请日:2015-06-02

    CPC classification number: G11C11/1673 G11C11/1659 G11C11/1675

    Abstract: In some examples, a memory device may be configured to utilize differential bit cells formed from two or more tunnel junctions. In some cases, the tunnel junctions forming the differential bit cell may be arranged to utilize shared read circuitry to reduce device mismatch. For instance, the read operations associated with both tunnel junction may be time multiplexed such that the same preamplifier circuitry may sense voltages representative of the tunnel junctions.

    Abstract translation: 在一些示例中,存储器件可以被配置为利用由两个或更多个隧道结形成的差分位单元。 在一些情况下,形成差分位单元的隧道结可以被布置为利用共享读取电路来减少器件失配。 例如,与隧道结相关联的读取操作可以被时间复用,使得相同的前置放大器电路可以感测代表隧道结的电压。

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