摘要:
Nonvolatile memory devices including memory cell arrays with a plurality of cell strings connected between a substrate and a plurality of bit lines and selected by selection lines, and a gating circuit configured to drive the selection lines in at least two directions.
摘要:
At least one address scheduling method includes selecting a first bit line, selecting a first string connected to the first bit line, performing address scheduling on N pages of each of multi-level cells in the first string sequentially from a bottom word line to a top word line, and after completing the address scheduling on all word lines in the first string, performing address scheduling on second to k-th strings sequentially in the same manner as performed with respect to the first string, where “k” is 2 or a natural number greater than 2.
摘要:
A method is provided for driving a nonvolatile memory device, including multiple strings, where each string is formed by penetrating plate-shaped word lines stacked on a substrate. The method includes configuring the word lines of a string in multiple zones based on zone configuration information, and applying zone voltages to the zones, respectively. The zone configuration information is varied according to a mode of operation.
摘要:
According to example embodiments, a memory device includes a memory cell array, a controller including a normal program controller and a dummy program controller, and a driver. The memory cell array includes a first memory block on a substrate. The first memory block includes a plurality of cell strings on the substrate extending in a vertical direction. The normal program controller is configured to generate a first control signal for programming normal cells of a selected cell string that is selected based on an address received by the controller. The dummy program controller is configured to generate a second control signal for programming at least one dummy cell included in each of the plurality of cell strings before generation of the first control signal. The driver is configured to apply a first operation voltage set for programming the normal cells of the selected cell string to the first memory block in response to the first controller signal. The driver is configured to apply a second operation voltage set for programming the at least one dummy cell to the first memory block in response to the second control signal.
摘要:
According to example embodiments, an operation method of a nonvolatile memory device includes determining a location of a selected word line among word lines connected to the nonvolatile memory device, selecting one of a plurality of different read disturbance reducing modes according to the location of the selected word line, and performing a read or verification operation according to the selected read disturbance reducing modes. The nonvolatile memory device includes cell strings. Each one of the cell strings includes memory cells stacked on top of each other in a direction perpendicular to the substrate and between a ground select transistor and a string select transistor. The ground select transistor is between the substrate and the number of the memory cells. The string select transistor is connected to a bit line and is between the bit line and the number of the memory cells.
摘要:
An operating method of a nonvolatile memory, which includes a plurality of cell strings, each cell string having a plurality of memory cells and a string selection transistor stacked on a substrate, includes detecting threshold voltages of the string selection transistors of the plurality of cell strings; adjusting voltages to be supplied to the string selection transistors according to the detected threshold voltages; and applying the adjusted voltages to the string selection transistors to select or unselect the plurality of cell strings during a programming operation.
摘要:
A method of erasing a nonvolatile memory device which includes a plurality of memory blocks includes receiving an erase command; erasing a selected memory block among the plurality of memory blocks in response to the erase command; and performing an operation of checking whether a threshold voltage of a selection transistor connected to at least one selection line for selecting strings included in the selected memory block is changed while performing an erase verification operation for checking whether the selected memory block is normally erased.
摘要:
According to example embodiments of inventive concepts, a nonvolatile memory device includes a first NAND string and a second NAND string. The first NAND string include a first string selection transistor, a first ground selection transistor having a threshold voltage higher than a threshold voltage of the first string selection transistor, and first memory cells stacked on a substrate. The a second NAND string includes a second string selection transistor, a second ground selection transistor having a threshold voltage higher than a threshold voltage of the second string selection transistor, and second memory cells stacked on the substrate. A first selection line may connect the first string selection line and the first ground selection line, and a second selection line may connect the second selection line and the second ground selection line. The first and second selection lines may be electrically isolated from each other.
摘要:
A nonvolatile memory device includes a 3D memory cell array having words lines that extend from a lowest memory cell array layer closest to a substrate to a highest memory cell array layer farthest from the substrate, a voltage generator circuit generating first and second voltage signals, and a row selecting circuit that simultaneously applies the first voltage signal to a selected word line and the second voltage signal to an unselected word line. The selected word line and the unselected word line have different resistances, yet the first voltage signal is applied to the selected word line and the second voltage signal is applied to the unselected word line with a same rising slope over a defined period of time.
摘要:
Non-volatile memory device channel boosting methods in which at least two strings are connected to one bit line, the channel boosting methods including applying an initial channel voltage to channels of strings in a selected memory block, floating inhibit strings each having an un-programmed cell among the strings, and boosting channels of the floated inhibit strings.