摘要:
In one embodiment, a method of forming a multi-die semiconductor device is provided. A plurality of dice is mounted on a semiconductor substrate, and neighboring ones of the dice are separated by a distance at which a first one of the neighboring dice will contact a meniscus of a flange of the neighboring die during underfill to form a capillary bridge between the neighboring dice. Solder bumps are reflowed to electrically connect contact terminals of the plurality of dice to contact terminals on a top surface of the substrate. Underfill is deposited along one or more edges of one or more of the plurality of dice. As a result of the capillary bridge formed between neighboring dice, flow of underfill is induced between the bottom surfaces of the neighboring dice and the top surface of the substrate. The dispensed underfill is cured.
摘要:
Method, apparatus, and computer readable medium for designing an integrated circuit (IC) are described. In some examples, layout data describing conductive layers of the integrated circuit is obtained. The layout data is analyzed to identify through die via (TDV) areas. A metal fill pattern is created for each of the TDV areas having a maximum metal density within design rules for the integrated circuit. The metal fill pattern for each of the TDV areas is merged with the layout data.
摘要:
A semiconductor device is provided that includes a substrate having opposing first and second surfaces and an interconnect structure extending between the first and second surfaces. A plurality of bond pads are located on the first surface of the substrate and the bond pads are electrically connected to the interconnect structure. The bond pads each have two or more micro-bumps, with the two or more micro-bumps on each bond pad being arranged to electrically connect the bond pad to one die pad of a semiconductor die. A plurality of external contacts are located on the second surface of the substrate and the external contacts are electrically connected to the interconnect structure.
摘要:
A method of designing an integrated circuit (IC) having multiple dies can include identifying a unified design library having a first process node specific (PNS) library for a first IC process technology and a second PNS library for a second IC process technology. The first PNS library can be correlated with a first die of the IC. The second PNS library can be correlated with the second die of the IC. Via a processor, a circuit element can be defined within a circuit design implemented within the IC according to the PNS library correlated to the die in which the circuit element is located.
摘要:
An integrated circuit die is described that includes an array of tiles arranged in columns. The integrated circuit die includes interface tiles having at least one row of through die vias. The integrated circuit die includes metal layers that include horizontal wiring tracks and metal layers that include vertical wiring tracks. At least some of the metal layers having vertical wiring segments include horizontal wiring segments. Each horizontal wiring segment is coupled to a first wiring segment of a horizontal wiring track that is interrupted by the at least one row of through die vias and is coupled to a second wiring segment of the horizontal wiring track that is interrupted by the at least one row of through die vias. Each horizontal wiring segment extends between the at least one row of through die vias and at least one row of through die vias in an adjoining interface tile.
摘要:
A method of testing a multi-die integrated circuit (IC) can include testing an inter-die connection of the multi-die IC. The inter-die connection can include a micro-bump coupling a first die to a second die. The method can include detecting whether a fault occurs during testing of the inter-die connection. Responsive to detecting the fault, the multi-die integrated circuit can be designated as including a faulty inter-die connection. Also described is an integrated circuit that includes a first die, a second die on which the first die may be disposed, a plurality of inter-die connections coupling the first die to the second die, and a plurality of probe pads, where each probe pad is coupled to at least one of the inter-die connections.
摘要:
Method and apparatus for integrating capacitors in stacked integrated circuits are described. One aspect of the invention relates to a semiconductor assembly having a carrier substrate, a plurality of integrated circuit dice, and at least one metal-insulator-metal (MIM) capacitor. The integrated circuit dice are vertically stacked on the carrier substrate. Each MIM capacitor is disposed between a first integrated circuit die and a second integrated circuit die of the plurality of integrated circuit dice. The at least one MIM capacitor is fabricated on at least one of a face of the first integrated circuit die and a backside of the second integrated circuit die.
摘要:
A software model (620) of a stacked integrated circuit system (600) includes a first integrated circuit die (602) connected to a second integrated circuit die (604) through an interchip communication interface (606). A software model of the first integrated circuit die includes an integrated circuit resource (614) and an internal interface (150). A software model of the second integrated circuit die includes a stacked resource (618). The software model of the internal interface is configurable to connect the stacked resource of the second integrated circuit die to the integrated circuit resource through the interchip communication interface.
摘要:
A hardware stack (HSTACK) structure using programmable logic can include a look-up table (LUT) random access memory (RAM) circuit and circuitry within the LUT RAM circuit for propagating data upwards and downwards. The hardware structure can be arbitrarily assembled into a larger structure by adding stacks to a top portion, a bottom portion, or a portion between the top portion and the bottom portion. The hardware stack structure can further include a virtual stack (VSTACK) structure coupled to the HSTACK structure within a field programmable gate array (FPGA) fabric. The VSTACK can be arranged in the form of an appended peripheral memory and cache control for virtual extension to an HSTACK address space. The hardware stack structure can further include an auxiliary reset circuit.
摘要:
A circuit for enabling partial reconfiguration of memory elements of a device having programmable logic is described. The circuit comprises a block of memory cells comprising a look-up table of a configurable logic block; and a reset signal coupled to the block of memory elements, the reset signal enabling partial reconfiguration of the memory cells of the configurable logic block. Each the memory cell may be coupled to receive the reset signal enabling the partial reconfiguration of the block of memory cells of the configurable logic block. The reset signal may comprise a plurality of signals, wherein each signal of the plurality of signals is coupled to a memory cell of the block of memory cells. Each memory cell may also receive a signal for setting an initial state. A method of enabling partial reconfiguration of memory cells of a look-up table of a programmable logic device is also described.