摘要:
The present invention relates to a non-volatile semiconductor memory having non-volatile memory cells capable of electrically erasing and writing data. Each memory cell has a floating gate formed on the surface of the semiconductor substrate above the channel region, and a control gate. The floating gate partially covers the channel region. Each memory cell is thereby constructed of a parallel connection of a floating gate transistor and an enhancement type transistor. The floating gate transistor is displaced in one of the widthwise directions of the channel region, or partially covers only the central portion of the channel region in the widthwise direction thereof. A plurality of memory cells are connected in series to constitute a basic block. Adjacent basic blocks are separated by an enhancement type MOS transistor. In this memory, a memory cell (floating gate) and an enhancement type MOS transistor (gate) are formed in self alignment with each other using the same mask. In addition, in this memory, a control gate and a floating gate are formed in self alignment with each other using the same mask.
摘要:
A memory cell array is divided into a plurality of blocks. In altering data for a block (selected block), a moderating voltage is applied to the source or control gate of a memory cell in another block (non-selected block) to moderate stress between the floating gate and source/drain, thereby preventing write error and erase error. In the program operation, the source and drain of a memory cell in the non-selected block are equalized to moderate an electric field between the control gate and source/drain and not to flow a channel current, thereby preventing write error. In carrying out a negative voltage erase method, prior to setting the source line and word line of a cell in a non-selected block to an erase voltage, the source and word lines are equalized. The equalization operation is released after the erase operation, thereby preventing malfunction of a non-selected cell.
摘要:
Source and drain regions of a second conductivity type are formed in a stripe form in the surface area of a semiconductor substrate of a first conductivity type. A first insulation film is formed on the source and drain regions of the substrate. A second thin insulation film having a tunnel effect is formed on that part of the substrate which lies between the source and drain regions. A floating gate is formed on the second insulation film. A third insulation film is formed on the first insulation film, the floating gate and that part of the substrate which lies between the source and drain regions and on which the second insulation film is not formed. A control gate is formed on the third insulation film in a stripe form extending in a direction which intersects the source and drain regions. An impurity region of the first conductivity type having an impurity concentration higher than the substrate is formed in the substrate except the source and drain regions and the portions lying below the control gate. A floating gate transistor is constituted to include the substrate, source and drain regions, second insulation film, floating gate, third insulation film and control gate. An offset transistor is constituted to include the substrate, source and drain regions, third insulation film and control gate. The first insulation film and the impurity region are used as an element isolation region of a memory cell.
摘要:
An electrostatic discharge protection circuit is provided with a variable threshold for limiting the potential of an input signal having a given high or low voltage, and is adapted to an EPROM containing an input MOS transistor which is responsive to the input signal. The protection circuit is associated with an input terminal for receiving the input signal. The input terminal is coupled to the gate of the input MOS transistor. The protection circuit also includes a circuit element for limiting or suppressing the input signal potential at the variable threshold. The gate of the input MOS transistor receives the potential limited signal from the circuit element. The circuit element is responsive to a given threshold control potential. The variable threshold is enhanced by the given threshold control potential when a high-voltage input signal is applied to the input terminal.
摘要:
A semiconductor device comprises a plurality of data supply circuits, output circuits for producing a plurality of data delivered from the data supply circuit and delay circuit for transferring respective data from each data supply circuit to a different output circuit with a different delay time. Each data supply circuit includes a plurality of row lines, a row decoder for selecting the row line in response to an address signal, a plurality of memory cell arrays including memory cells selectively driven by the row line and storing data, a plurality of column lines to receive data read out from the memory cell array, and a column decoder for selecting said column lines. The delay circuit prevents a plurality of data from being simultaneously outputted.
摘要:
A semiconductor integrated circuit comprises a first MOS transistor connected at the drain to a power source terminal of a high potential power source and supplied at the gate with a predetermined voltage, a logic circuit including MOS transistors provided between the power source terminal and a circuit point at a potential and operating in a potential range between the high potential and the circuit point, and a circuit for making the potential at the circuit point coincide with the potential at the source of the first MOS transistor.
摘要:
A current-controlling MOS transistor is connected between a power source and an MOS circuit. A control voltage which has a level related to temperature is applied to the gate electrode of the control MOS transistor in order to compensate for current reduction at high temperatures due to the lowering of the mobility of minority carriers. The response time of the MOS circuit is made less dependent on temperature as a result of the current compensation.
摘要:
In a nonvolatile semiconductor memory device using as memory cells insulated-gate type field effect transistors each having source and drain regions, a floating gate electrode, and a control gate electrode, the width of the floating and control gate electrodes is narrower at those portions which are located over a channel between the source and drain regions in each memory cell than at those portions which are not located over the channel.
摘要:
A memory device utilizing metal oxide semiconductor field effect transistors (MOS FETs) formed in a semiconductor substrate. The memory device is so improved as to be accessed without a delay and as not to behave erroneously, in spite of a potential variation of data line or the semiconductor substrate. It comprises a plurality of row lines for supplying input signals, a plurality of column lines for supplying output signals, decoders for selecting any one of these lines, a plurality of memory cells connected to the row and column lines in a specific manner, a voltage sensing circuit connected to the column lines, a first potential source connected to the column lines, a second potential source for supplying the memory cells with a source voltage, and means for holding the column lines at a potential substantially equal to the voltage supplied from the second potential source when the potential of the column lines or the substrate varies.
摘要:
A semiconductor memory having a burst mode reading function in synchronization with a clock signal comprises a memory array composed of a plurality of memory cells, a sync read control circuit for releasing an upper group of the received address as a memory access address and a lower group of the received address as a burst address in synchronization with the clock signal, a sense amplifier for releasing an output data from each of the memory cells selected by the memory address, a decoder for decoding the burst address, a address latch for latching the decoded burst address in synchronization with the clock signal, a page selector for holding the output data and selecting corresponding one of the output data determined by the burst address of the address latch, and an output latch for latching the output data in synchronization with the clock signal.