Method of forming a thin layer and method of manufacturing a flash memory device and a capacitor using the same
    61.
    发明申请
    Method of forming a thin layer and method of manufacturing a flash memory device and a capacitor using the same 审中-公开
    薄层形成方法及其制造方法及使用其的电容器

    公开(公告)号:US20060172484A1

    公开(公告)日:2006-08-03

    申请号:US11341553

    申请日:2006-01-30

    Abstract: In a method of forming a thin layer and a method of manufacturing a flash memory and a capacitor using the same, a first thin layer may be formed on a substrate, and the thin layer may include one of metal, metal nitride and a combination thereof. A binding inhibitor may be formed on the first thin layer by a surface treatment on the first thin layer. The binding inhibitor may reduce a bonding strength between first and second elements when a second thin layer is formed on the first thin layer in a subsequent process using a precursor including the first element and the second element having a ligand binding to the first element. In a flash memory, the first and second thin layers may be a floating gate and a dielectric layer, respectively, and in a capacitor, the first and second thin layers may be a lower electrode and a dielectric layer, respectively.

    Abstract translation: 在形成薄层的方法和使用其制造闪速存储器和电容器的方法中,可以在衬底上形成第一薄层,并且薄层可以包括金属,金属氮化物及其组合之一 。 可以通过在第一薄层上的表面处理在第一薄层上形成结合抑制剂。 当使用包含第一元素的前体和具有与第一元素结合的配体的第二元素的随后的方法中,在第一薄层上形成第二薄层时,结合抑制剂可以降低第一和第二元素之间的结合强度。 在闪速存储器中,第一和第二薄层可以分别是浮动栅极和电介质层,并且在电容器中,第一和第二薄层可以分别是下部电极和介电层。

    Zero margin enable controlling apparatus and method of sense amplifier adapted to semiconductor memory device
    62.
    发明授权
    Zero margin enable controlling apparatus and method of sense amplifier adapted to semiconductor memory device 有权
    适用于半导体存储器件的读取放大器的零余量使能控制装置和方法

    公开(公告)号:US06459637B1

    公开(公告)日:2002-10-01

    申请号:US09895196

    申请日:2001-06-29

    CPC classification number: G11C29/02 G11C7/06 G11C7/1045 G11C2207/2254

    Abstract: An apparatus for controlling an enable of a sense amplifier in a semiconductor memory device includes a test part for repeatedly varying a test code value until the enable of the sense amplifier has a zero margin with respect to data to be read by the sense amplifier, and for determining the test code value at a time point when the enable has the zero margin. A fuse array cuts a fuse corresponding to the determined test code value.

    Abstract translation: 一种用于控制半导体存储器件中的读出放大器的使能的装置包括用于重复地改变测试代码值的测试部件,直到读出放大器的使能相对于读出放大器要读取的数据为止为止,以及 用于在启用具有零余量的时间点确定测试代码值。 保险丝阵列切断与确定的测试代码值对应的保险丝。

    Backlight assembly and display device having the same
    67.
    发明授权
    Backlight assembly and display device having the same 有权
    具有相同的背光组件和显示装置

    公开(公告)号:US08104946B2

    公开(公告)日:2012-01-31

    申请号:US12173176

    申请日:2008-07-15

    CPC classification number: G02F1/133605 G02F1/133604 G02F1/133608

    Abstract: A backlight assembly, in which several parts are unified so as to reduce a number of parts used and simplify an assembly process includes lamps emitting light, first lamp sockets, each of which includes a first connection member coupled with one end of each of the lamps so as to be electrically connected to the end of each of the lamps, and a reflection plate to reflect the light emitted from the lamps, and including socket fixing units formed integrally therewith to respectively fix the first lamp sockets. Each of the socket fixing units includes a socket fixing groove formed on a bottom plane of the reflection plate.

    Abstract translation: 一种背光组件,其中多个部件是统一的,以便减少使用的部件数量并简化组装过程,包括发射光的灯,第一灯插座,每个灯插座包括与每个灯的一端连接的第一连接部件 以电连接到每个灯的端部,以及反射板,用于反射从灯发射的光,并且包括与其一体形成的插座固定单元,以分别固定第一灯插座。 每个插座固定单元包括形成在反射板的底平面上的插座固定槽。

    PHASE-CHANGE MEMORY DEVICE
    70.
    发明申请
    PHASE-CHANGE MEMORY DEVICE 审中-公开
    相变存储器件

    公开(公告)号:US20110073832A1

    公开(公告)日:2011-03-31

    申请号:US12892419

    申请日:2010-09-28

    Abstract: A phase-change memory device, including a lower electrode, a phase-change material pattern electrically connected to the lower electrode, and an upper electrode electrically connected to the phase-change material pattern. The lower electrode may include a first structure including a metal semiconductor compound, a second structure on the first structure, the second structure including a metal nitride material, and including a lower part having a greater width than an upper part, and a third structure including a metal nitride material containing an element X, the third structure being on the second structure, the element X including at least one selected from the group of silicon, boron, aluminum, oxygen, and carbon.

    Abstract translation: 相变存储器件,包括下电极,电连接到下电极的相变材料图案,以及电连接到相变材料图案的上电极。 下电极可以包括第一结构,其包括金属半导体化合物,第一结构上的第二结构,第二结构包括金属氮化物材料,并且包括具有比上部宽度更大的下部的第一结构,以及包括 包含元素X的金属氮化物材料,第三结构在第二结构上,元素X包括选自硅,硼,铝,氧和碳中的至少一种。

Patent Agency Ranking