Abstract:
An all digital phase locked loop comprises a time-to-digital converter and a configurable multiplier. The time-to-digital converter is configured to output a digital code based on a phase difference between a reference clock signal and a variable clock signal. The configurable multiplier is coupled with the time-to-digital converter. The configurable multiplier has a selectable bit size. The selectable bit size is based on a defined minimum number of bits to obtain a reciprocal of a variable clock period. The minimum number of bits is based on a comparison of a first number of bits of a divisor with a second number of bits of a quotient. The time-to-digital converter is configured to multiply the digital code by the reciprocal of the variable clock period to output a fractional error correction value.
Abstract:
An embodiment is a device including a control circuit, a time-to-digital converter circuit coupled having a first output coupled to a first input of the control circuit, and a gating circuit having a first input coupled to a first signal, a second input coupled to a second signal, and an output coupled to a first input of the time-to-digital converter circuit, an output of the control circuit coupled to a second input of the time-to-digital converter circuit and to a third input of the gating circuit.
Abstract:
A frequency synthesizer includes a phase-locked loop (PLL) and a loop bandwidth controller. The PLL generates an output clock according to a reference clock. The loop bandwidth controller checks at least one indicator indicative of injection pulling/pushing of the PLL to configure a loop bandwidth of the PLL. In one exemplary design, the loop bandwidth controller sets the loop bandwidth of the PLL by controlling a configuration of a loop filter included in the PLL. For example, the PLL is an all-digital phase-locked loop (ADPLL), and the loop filter is a digital loop filter of the ADPLL.
Abstract:
A digital phase locked loop operates with a time-to-digital converter and an a-priori-probability-phase-estimation component or estimator component that estimates the un-quantized phase associated with a quantization output of the time-to-digital converter. The time-to-digital converter generates a quantized value as the quantization output from a local oscillator signal of a local oscillator and a reference signal of a reference clock. The estimation component estimates a phase value from the quantized values as a function of a-priori data related to the time-to-digital converter and boundaries of the quantized value.
Abstract:
According to various embodiments described herein, a device includes a control circuit, a time-to-digital converter circuit coupled having a first output coupled to a first input of the control circuit, and a gating circuit having a first input coupled to a first signal, a second input coupled to a second signal, and an output coupled to a first input of the time-to-digital converter circuit, an output of the control circuit coupled to a second input of the time-to-digital converter circuit and to a third input of the gating circuit.
Abstract:
An electronic circuit includes a plurality of delay elements configured to delay a clock signal by a delay time and to supply the delayed clock signal as a delay signal, the delay time being shorter with a higher power source voltage; a delay time acquisition unit configured to acquire the delay time based on a value of the delay signal; and a voltage controller configured to perform a voltage control process in which the power source voltage is controlled to be high in a case where the acquired delay time is longer than a predetermined desired value and the power source voltage is controlled to be low in a case where the acquired delay time is shorter than the predetermined desired value.
Abstract:
A device includes a delay line, a first readout circuit electrically connected to the delay line, a second readout circuit electrically connected to the delay line, and a phase interpolator electrically connected to the second readout circuit.
Abstract:
The present invention makes it possible to measure a precision event time in such a way to make a reference data in accordance with a standard time reference frequency signal and to make a measurement data by using an apparatus with the same structure as a reference data with respect to a signal to be measured and to compare the measurement data with a reference data, whereby temperature effects can be minimized by making the time changes due to temperature changes occurring between two apparatuses happen equally, by providing the same structure and parts to a reference signal circuit apparatus for an event time measurement and a signal circuit apparatus to be measured, and the zero point adjustment is performed during the real time operation, so the system is not needed to stop.
Abstract:
A Traveling Pulse Wave Quantization method is provided for converting a time sensitive signal to a digital value. A first stop signal is delayed by a first time delay, a first plurality of times, to create a delayed first stop signal. A clock signal is delayed by a second time delay, a first plurality of times, to create a delayed clock signal first period. Each second time delay is associated with a corresponding first time delay, and the second time delay is greater than the first time delay. When the delayed first stop signal occurs before the delayed clock signal first period, a count of the delays is stopped and converted into a digital or thermometer value. An accurate resampled value is provided regardless of the duration in delay between the first stop signal and a second stop signal that is accepted after the first stop signal.
Abstract:
A time-to-digital converter (TDC) comprises a first delay line including a plurality of first delay cells connected in series, wherein each of the first delay cells include a plurality of first delay units connected in series, wherein each of the first delay units includes a tunable PMOS transistor, a first poly on oxide definition (OD) edge (PODE) transistor, and a pull-up PMOS transistor. The TDC further comprises a second delay line including a plurality of second delay cells connected in series, wherein each of the second delay cells include a plurality of second delay units connected in series, wherein each of the second delay units includes a tunable NMOS transistor, a second PODE transistor, and a pull-down NMOS transistor.