公开(公告)号：US4475041A

公开(公告)日：1984-10-02

申请号：US380524

申请日：1982-05-21

Applicant: Helmut Fischer

Inventor： Helmut Fischer

IPC: G01Q70/00 ,  G01B15/02 ,  G01N23/225 ,  G21K1/02

CPC classification number: G01B15/02

Abstract: An aperture device for measuring thin films has an aperture ring, of a material and thickness that is impenetrable by the radiation from radionuclides. The ring has a passage for emitted and reflected radiation extending approximately perpendicular to said ring, and a radiation device consisting of at least one collimating radiation source holder comprising a tube of a predetermined diameter that is permeable to radiation in the forward direction and has sides and a back that are impermeable to radiation and houses a radionuclide. The forward end surface of the tube lies behind the forward end surface of the passage. The cross-section of the passage is large compared to the cross-section of the radionuclide. A partition divides the passage into at least two chambers that are open at their rearward and forward ends. The partition has partition walls that are impermeable to radiation. The radiation source holder is arranged in one of the chambers, the cross-section of which chamber is a multiple of the cross-section of the radiation source holder. The forward end surface of the radiation source holder lies behind the forward end surface of the partition.

Abstract translation: 用于测量薄膜的孔径装置具有孔径环，其材料和厚度不可透过来自放射性核素的辐射。 所述环具有大致垂直于所述环延伸的发射和反射辐射的通道，以及由至少一个准直辐射源保持器组成的辐射装置，所述至少一个准直辐射源保持器包括预定直径的管，所述管具有向前方向的辐射透过并具有侧面和 背面不透辐射并放置放射性核素。 管的前端表面位于通道的前端表面之后。 通道的横截面与放射性核素的横截面相比是大的。 隔板将通道分成至少两个在其后端和前端开口的室。 分隔壁具有防渗透隔壁。 辐射源保持器布置在一个室中，该室的横截面是辐射源保持器的横截面的倍数。 辐射源支架的前端表面位于隔板的前端表面之后。

公开(公告)号：US20210208041A1

公开(公告)日：2021-07-08

申请号：US16070617

申请日：2017-01-09

Applicant: Helmut Fischer GmbH Institut für Elektronik und Messtechnik

Inventor： Helmut Fischer

IPC: G01N3/46

Abstract: A measuring device for detection pf measurement signals during a penetrating movement of a penetrating member into a surface of a test object or during a sensing movement of the penetrating member on the surface of the test object. The measuring device includes a housing which accommodates a force generating device and on which a holding element is arranged remote from the force generating device, which holding element is movable relative to the housing at least in one direction along a longitudinal axis of the housing and which accommodates the penetrating member. The measuring device also includes at least one first measuring element for measuring the penetration depth of the penetrating member into the surface of the test object or a traversing movement of the penetrating member along the longitudinal axis relative to the housing during a sensing movement on the surface of the test object, wherein a transmission element is provided which extends between the force generating device and the penetrating member.

公开(公告)号：US10584952B2

公开(公告)日：2020-03-10

申请号：US14723027

申请日：2015-05-27

Applicant: Helmut Fischer GmbH Institut fuer Elektronik and Messtechnik

Inventor： Helmut Fischer

IPC: G01B7/06 ,  G01B21/08 ,  G01B7/00

Abstract: Measuring probe for non-destructive measuring of the thickness of thin layers, in particular in cavities, which are accessible by an opening or on curved surfaces, with a measuring head, which includes at least one sensor element and at least one contact spherical cap, assigned to the sensor element on a surface, to be checked, of the cavity, and with a gripping element for positioning and guiding the measuring probe on and/or along the surface to be measured, wherein on the gripping element, a long, elastically yielding guide bar is provided, which accepts the at least one measuring head on its end opposing the gripping element, in such a way that it is moveable with at least one degree of freedom in relation to the guide bar.

公开(公告)号：US09076897B2

公开(公告)日：2015-07-07

申请号：US14001310

申请日：2012-02-24

Applicant: Helmut Fischer ,  Andreas Plössl

Inventor： Helmut Fischer ,  Andreas Plössl

IPC: H01L33/02 ,  H01L31/18 ,  H01L33/00 ,  H01L31/0687 ,  H01L31/02 ,  H01L33/64 ,  H01S5/02 ,  H01S5/024 ,  H01S5/022

CPC classification number: H01L33/02 ,  H01L31/02 ,  H01L31/06875 ,  H01L31/18 ,  H01L31/1892 ,  H01L31/1896 ,  H01L33/0079 ,  H01L33/641 ,  H01L2924/0002 ,  H01S5/0217 ,  H01S5/02272 ,  H01S5/02476 ,  Y02E10/544 ,  Y02P70/521 ,  H01L2924/00

Abstract: An optoelectronic semiconductor device includes an optoelectronic semiconductor layer sequence on a metal carrier element, which includes as a first component silver and as a second component a material having a lower coefficient of thermal expansion than silver, wherein the first and second components are intermixed in the metal carrier element.

Abstract translation: 光电半导体器件包括在金属载体元件上的光电子半导体层序列，其包括作为第一组分银和作为第二组分的具有比银更低的热膨胀系数的材料，其中第一和第二组分混合在 金属载体元件。

公开(公告)号：US09074880B2

公开(公告)日：2015-07-07

申请号：US13066797

申请日：2011-04-25

Applicant: Helmut Fischer

Inventor： Helmut Fischer

IPC: G01B7/06 ,  G01B21/08

CPC classification number: G01B7/10 ,  G01B7/001 ,  G01B7/105 ,  G01B21/08

Abstract: The invention relates to a measuring probe for non-destructive measuring of the thickness of thin layers, in particular in cavities, which are accessible by an opening or on curved surfaces, with a measuring head, which comprises at least one sensor element and at least one contact spherical cap, assigned to the sensor element on a surface, to be checked, of the cavity, and with a gripping element for positioning and guiding the measuring probe on and/or along the surface to be measured, wherein on the gripping element, a long, elastically yielding guide bar is provided, which accepts the at least one measuring head on its end opposing the gripping element, in such a way that it is moveable with at least one degree of freedom in relation to the guide bar.

Abstract translation: 本发明涉及一种用于非破坏性地测量薄层厚度的测量探针，特别是在通过开口或弯曲表面可访问的空腔中，测量头包括至少一个传感器元件并且至少包括 分配给待检查的空腔中的传感器元件的一个接触球形盖，以及用于在测量表面上和/或沿着待测量表面定位和引导测量探针的夹持元件，其中在夹持元件上 提供了一种长而弹性屈服的导向杆，其在其与夹持元件相对的端部上接收至少一个测量头，使得其可相对于导向杆至少一个自由度移动。

公开(公告)号：US20140225602A1

公开(公告)日：2014-08-14

申请号：US14119971

申请日：2012-05-24

Applicant: Helmut Fischer

Inventor： Helmut Fischer

IPC: G01B7/06

CPC classification number: G01B7/10 ,  G01B7/105 ,  Y10T29/49071

Abstract: The invention relates to a measuring probe for measuring the thickness of thin layers, having a housing (14) with at least one sensor element (17), which is received at least slightly moveably along a longitudinal axis (16) and which comprises at least one first winding device (44), which has a magnetic pot core (41) arranged in the longitudinal axis (16) of the housing (14), and to whose central pin (42) a first and second coil (70, 71) are allocated, and having a spherical positioning cap (21) on the central pin (42) pointing towards the measuring surface of an object to be measured, which cap comprises a bearing surface (57) for fitting on a measuring surface, wherein a second winding device (48) is provided allocated to the spherical positioning cap (21), which device is formed from a discoidal or annular carrier (49) having at least one Archimedean coil (51), and a shield (83, 85) is provided at least partially between the first and second winding device (44, 48).

Abstract translation: 本发明涉及一种用于测量薄层厚度的测量探针，其具有具有至少一个传感器元件（17）的外壳（14），该传感器元件至少沿着纵向轴线（16）可稍微移动，并且至少包括 一个第一卷绕装置（44），其具有布置在壳体（14）的纵向轴线（16）中的磁性罐芯（41），并且其中心销（42）具有第一和第二线圈（70,71） 并且在中心销（42）上具有指向待测量物体的测量表面的球形定位盖（21），该盖包括用于装配在测量表面上的支承表面（57），其中第二 卷绕装置（48）被设置为分配给球形定位盖（21），该装置由具有至少一个阿弥式线圈（51）的盘形或环形载体（49）形成，并且提供屏蔽（83,85） 至少部分地在第一和第二卷绕装置（44,48）之间。

公开(公告)号：US20110260720A1

公开(公告)日：2011-10-27

申请号：US13066796

申请日：2011-04-25

Applicant: Helmut Fischer

Inventor： Helmut Fischer

IPC: G01B7/06

CPC classification number: G01B21/08 ,  G01B7/105

Abstract: The invention relates to a measuring probe for non-destructive measuring of the thickness of thin layers on an object with a measuring head, which comprises at least one sensor element for contact on a measurement surface of an object, and with a support device for receiving the measuring head, which is at least partly surrounded by a housing, wherein at least one further measuring head, which is adjacent to and separated from the first measuring head, is arranged on the support device, which can be controlled independently of the first measuring head.

Abstract translation: 本发明涉及一种测量探头，用于对具有测量头的物体上的薄层的厚度进行非破坏性测量，所述测量头包括用于接触物体的测量表面上的至少一个传感器元件和用于接收的支撑装置 所述测量头至少部分地被壳体包围，其中与所述第一测量头相邻并且与所述第一测量头分离的至少一个另外的测量头被布置在所述支撑装置上，所述测量头可独立于所述第一测量 头。

公开(公告)号：US20100171215A1

公开(公告)日：2010-07-08

申请号：US12663669

申请日：2008-05-07

Applicant: Helmut Fischer ,  Dieter Eissler ,  Alexander Heindl

Inventor： Helmut Fischer ,  Dieter Eissler ,  Alexander Heindl

IPC: H01L23/48 ,  H01L21/50

CPC classification number: H01L25/0753 ,  H01L21/561 ,  H01L21/563 ,  H01L21/6835 ,  H01L23/3114 ,  H01L24/12 ,  H01L24/81 ,  H01L24/83 ,  H01L24/90 ,  H01L24/95 ,  H01L24/97 ,  H01L33/0079 ,  H01L33/22 ,  H01L33/382 ,  H01L33/44 ,  H01L2221/68322 ,  H01L2221/68354 ,  H01L2221/68363 ,  H01L2221/68377 ,  H01L2224/05568 ,  H01L2224/05573 ,  H01L2224/05611 ,  H01L2224/05624 ,  H01L2224/05644 ,  H01L2224/05655 ,  H01L2224/05666 ,  H01L2224/05669 ,  H01L2224/13111 ,  H01L2224/13124 ,  H01L2224/13144 ,  H01L2224/13155 ,  H01L2224/13169 ,  H01L2224/16225 ,  H01L2224/29144 ,  H01L2224/2919 ,  H01L2224/81001 ,  H01L2224/81801 ,  H01L2224/83851 ,  H01L2224/90 ,  H01L2224/95001 ,  H01L2224/97 ,  H01L2924/01005 ,  H01L2924/01006 ,  H01L2924/01013 ,  H01L2924/01015 ,  H01L2924/01023 ,  H01L2924/01033 ,  H01L2924/01078 ,  H01L2924/01079 ,  H01L2924/01082 ,  H01L2924/10158 ,  H01L2924/10329 ,  H01L2924/12041 ,  H01L2924/181 ,  H01L2924/01032 ,  H01L2924/0105 ,  H01L2224/81 ,  H01L2924/00014 ,  H01L2924/00

Abstract: A method of producing optoelectronic components is indicated, in which a plurality of semiconductor bodies, each with a semiconductor layer sequence, are provided. In addition, a component carrier assembly with a plurality of connection pads is provided. The semiconductor bodies are positioned relative to the component carrier assembly. An electrically conductive connection is produced between the connection pads and the associated semiconductor bodies and the semiconductor bodies are attached to the component carrier assembly. The optoelectronic components are finished in that one component carrier (30) is formed from the component carrier assembly, to which the semiconductor bodies are attached, for each optoelectronic component.

Abstract translation: 表示制造光电子部件的方法，其中提供了各自具有半导体层序列的多个半导体本体。 另外，提供具有多个连接焊盘的部件载体组件。 半导体本体相对于分量载体组件定位。 在连接焊盘和相关的半导体主体之间产生导电连接，并且半导体主体附接到部件载体组件。 光电子部件的完成是，对于每个光电子部件，单分量载体（30）由与半导体主体相连的分量载体组件形成。

公开(公告)号：US07549314B2

公开(公告)日：2009-06-23

申请号：US11629018

申请日：2005-06-06

Applicant: Helmut Fischer

Inventor： Helmut Fischer

IPC: G01B3/30

CPC classification number: G01B7/105

Abstract: The invention relates to a calibrating device for adapting a measuring device for measuring the thickness of thin layers on an object to be measured, comprising a calibrating surface (12) having a flat upper side and a flat underside, which are provided at a distance with a predetermined thickness, characterized in that the calibrating surface (12) is arranged separate from at least one edge area (18) and the calibrating surface (12) is connected to the at least one edge area (18) via at least one transition area (14).

Abstract translation: 本发明涉及一种用于调整测量装置的校准装置，用于测量待测物体上的薄层的厚度，包括：具有平坦的上侧和平的下侧的校准表面（12），该校准表面（12）与 其特征在于，所述校准表面（12）与至少一个边缘区域（18）分开布置，并且所述校准表面（12）经由至少一个过渡区域（18）连接到所述至少一个边缘区域 （14）。

公开(公告)号：US07330053B2

公开(公告)日：2008-02-12

申请号：US11244856

申请日：2005-10-06

Applicant: Paul Brucke ,  Helmut Fischer

Inventor： Paul Brucke ,  Helmut Fischer

IPC: H03K19/094

CPC classification number: G11C7/1057 ,  G11C7/1051 ,  G11C11/4093 ,  H03K19/00384 ,  H03K19/018521

Abstract: A prestage for generating a control signal for an output driver of an integrated circuit, wherein the integrated circuit can be provided with a reference potential and a supply potential fixed in relation to the reference potential, comprises an input for receiving an input signal from the integrated circuit, a circuitry for generating an output signal based on the received input signal, an output for outputting the generated output signals as control signal for an output driver as well as a current source, which is effectively connected to the circuitry. Thereby, the circuitry for generating an output signal and the current source are connected in series and connected to a first potential and a second potential such that a prestage potential difference across the series circuit is higher than a supply potential difference between the supply potential and the reference potential. Such a prestage has the advantage that it is less sensitive against variations on the reference potential or the reference potential, respectively, than conventional circuitries and can generate an output signal with well defined rise times.

Abstract translation: 一种用于产生用于集成电路的输出驱动器的控制信号的前置放大器，其中所述集成电路可以被提供有相对于所述参考电位固定的参考电位和电源电位，包括用于接收来自所述集成电路的输入信号的输入 电路，用于基于接收的输入信号产生输出信号的电路，用于输出所生成的输出信号作为输出驱动器的控制信号的输出以及有效地连接到电路的电流源。 因此，用于产生输出信号和电流源的电路串联连接并连接到第一电位和第二电位，使得串联电路两端的前置电位差高于电源电压和 参考潜力。 这样的前置放大器的优点在于，它比传统电路分别对参考电位或参考电位的变化较不敏感，并且可以产生具有明确定义的上升时间的输出信号。