NITRIDE BASED SEMICONDUCTOR LASER DEVICE
    2.
    发明申请
    NITRIDE BASED SEMICONDUCTOR LASER DEVICE 审中-公开
    基于氮化物的半导体激光器件

    公开(公告)号:US20110200065A1

    公开(公告)日:2011-08-18

    申请号:US13040798

    申请日:2011-03-04

    IPC分类号: H01S5/028

    摘要: One facet and the other facet of a nitride based semiconductor laser device are respectively composed of a cleavage plane of (0001) and a cleavage plane of (000 1). Thus, the one facet and the other facet are respectively a Ga polar plane and an N polar plane. A portion of the one facet and a portion of the other facet, which are positioned in an optical waveguide, constitute a pair of cavity facets. A first protective film including oxygen as a constituent element is formed on the one facet. A second protective film including nitrogen as a constituent element is formed on the other facet.

    摘要翻译: 氮化物基半导体激光器件的一个面和另一个面分别由(0001)的解理面和(000 1)的解理面构成。 因此,一个面和另一个面分别是Ga极平面和N极平面。 位于光波导中的一个面和另一个面的一部分的一部分构成一对腔面。 在一个面上形成包括氧作为构成元素的第一保护膜。 在另一方面形成包括氮作为构成元素的第二保护膜。

    Semiconductor laser device
    9.
    发明授权
    Semiconductor laser device 失效
    半导体激光器件

    公开(公告)号:US5559818A

    公开(公告)日:1996-09-24

    申请号:US312696

    申请日:1994-09-27

    摘要: The present invention is directed to a semiconductor laser device in which an active layer is constituted by a quantum well layer having a structure in which well layers and barrier layers which are formed on a GaAs substrate are alternately layered, cladding layers are provided so as to interpose the active layer, the value of a strain on each of the well layers is -0.8% to -1.5%, the thickness of a well layer is from 80 .ANG. to 180 .ANG., the value of strain on each of the barrier layers is +0.5% to +1.0%, the thickness of the barrier layer is 20 .ANG. to 60 .ANG., and the respective numbers of layered well layers and barrier layers are 2 to 4.

    摘要翻译: 本发明涉及一种半导体激光器件,其中有源层由具有结构的量子阱层构成,其中形成在GaAs衬底上的阱层和阻挡层交替层叠,提供包层,以便 插入有源层,阱层的应变值为-0.8%〜-1.5%,阱层的厚度为80〜180,势垒层的应变值为 + 0.5%〜+ 1.0%时,阻挡层的厚度为20〜60,分层阱层和阻挡层的数量为2〜4。