Test pad structure, a pad structure for inspecting a semiconductor chip and a wiring subtrate for a tape package having the same
    2.
    发明申请
    Test pad structure, a pad structure for inspecting a semiconductor chip and a wiring subtrate for a tape package having the same 有权
    测试垫结构,用于检查半导体芯片的焊盘结构和具有该衬垫结构的带封装

    公开(公告)号:US20090322362A1

    公开(公告)日:2009-12-31

    申请号:US12457775

    申请日:2009-06-22

    Abstract: A test pad structure may include a plurality of test pads and a plurality of connection leads. A plurality of the test pads may be sequentially arranged from a wiring pattern on a substrate and arranged in rows parallel with one another. The plurality of the test pads may include a first group of test pads having at least one pad arranged in a first row and a second group of test pads having at least two pads. A plurality of the connection leads may extend from end portions of the wiring pattern to be connected to the plurality of test pads. A plurality of the connection leads may include at least one inner lead passing between the at least two pads of the second group of the test pads arranged in a second row closest to the first group of the test pads. The at least one inner lead may be connected to at least one pad of the at least two pads of the second group of the test pads arranged in a third row next to the second row.

    Abstract translation: 测试焊盘结构可以包括多个测试焊盘和多个连接引线。 多个测试焊盘可以从衬底上的布线图形顺序地布置并且彼此平行布置。 多个测试焊盘可以包括第一组测试焊盘,其具有布置在第一行中的至少一个焊盘和具有至少两个焊盘的第二组测试焊盘。 多个连接引线可以从要连接到多个测试焊盘的布线图案的端部延伸。 多个连接引线可以包括通过第二组测试焊盘的至少两个焊盘之间的至少一个内引线,该焊盘布置在最靠近第一组测试焊盘的第二行中。 所述至少一个内引线可以连接到布置在第二行旁边的第三行中的第二组测试焊盘的至少两个焊盘中的至少一个焊盘。

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