METHOD FOR PRODUCING A SEMICONDUCTOR
    8.
    发明申请
    METHOD FOR PRODUCING A SEMICONDUCTOR 审中-公开
    制造半导体的方法

    公开(公告)号:US20090298270A1

    公开(公告)日:2009-12-03

    申请号:US12474464

    申请日:2009-05-29

    IPC分类号: H01L21/265

    摘要: A method for producing a semiconductor is disclosed. One embodiment provides a p-doped semiconductor body having a first side and a second side. An n-doped zone is formed in the semiconductor body by implantation of protons into the semiconductor body via the first side down to a specific depth of the semiconductor body and by subsequent heating at least of the proton-implanted region of the semiconductor body. A pn junction arises in the semiconductor body. The second side of the semiconductor body is removed at least as far as a space charge zone spanned at the pn junction.

    摘要翻译: 公开了半导体的制造方法。 一个实施例提供了具有第一侧和第二侧的p掺杂半导体本体。 通过将半导体本体中的质子经由第一侧向下注入到半导体本体的特定深度并且随后至少加热半导体本体的质子注入区域,在半导体本体中形成n掺杂区。 在半导体体中产生pn结。 半导体主体的第二面至少与在pn结处跨过的空间电荷区域一样被去除。

    Metal semiconductor contact, semiconductor component, integrated circuit arrangement and method
    10.
    发明授权
    Metal semiconductor contact, semiconductor component, integrated circuit arrangement and method 有权
    金属半导体接触,半导体元件,集成电路布置及方法

    公开(公告)号:US07087981B2

    公开(公告)日:2006-08-08

    申请号:US10419597

    申请日:2003-04-21

    IPC分类号: H01L29/207

    摘要: The present invention relates to a metal-semiconductor contact comprising a semiconductor layer and comprising a metallization applied to the semiconductor layer, a high dopant concentration being introduced into the semiconductor layer such that a non-reactive metal-semiconductor contact is formed between the metallization and the semiconductor layer. The metallization and/or the semiconductor layer are formed in such a way that only a fraction of the introduced doping concentration is electrically active, and a semiconductor layer doped only with this fraction of the doping concentration only forms a Schottky contact when contact is made with the metallization. Furthermore, the invention relates to a semiconductor component comprising a drain zone, body zones embedded therein and source zones again embedded therein. The semiconductor component has metal-semiconductor contacts in which the contacts made contact only with the source zones but not with the body zones.

    摘要翻译: 本发明涉及包含半导体层并包含施加到半导体层的金属化的金属 - 半导体接触,将高掺杂浓度引入到半导体层中,使得在金属化和金属化之间形成非反应性金属 - 半导体接触 半导体层。 金属化和/或半导体层以这样的方式形成,使得只有一部分引入的掺杂浓度是电活性的,并且仅当这一部分掺杂浓度掺杂的半导体层仅在与...接触时形成肖特基接触 金属化。 此外,本发明涉及一种半导体部件,其包括漏区,嵌入其中的主体区和再次嵌入其中的源区。 半导体部件具有金属半导体触点,触点仅与源极区域接触而不与主体区域接触。