Highly collimating tapered light guide for uniform illumination of flat panel displays
    6.
    发明授权
    Highly collimating tapered light guide for uniform illumination of flat panel displays 有权
    高准直锥形光导,用于平板显示器的均匀照明

    公开(公告)号:US06648485B1

    公开(公告)日:2003-11-18

    申请号:US09711041

    申请日:2000-11-13

    IPC分类号: F21V704

    摘要: A light guide system has a light guide having a first end portion opposite a second end portion. The light guide provides a first surface and a second surface between the first and second end portions, and the second surface is inclined relative to the first surface. A light source is disposed along the first end portion on a first axis. A light redistribution device is disposed on an entrance of the light guide for receiving light from the light source and redistributing a portion of the light perpendicular to the first axis to provide a uniform light distribution from the first surface.

    摘要翻译: 导光系统具有导光体,该导光体具有与第二端部相对的第一端部。 光导件在第一和第二端部之间提供第一表面和第二表面,并且第二表面相对于第一表面倾斜。 光源沿着第一端部设置在第一轴上。 光再分配装置设置在光导的入口处,用于接收来自光源的光并且重新分配垂直于第一轴的光的一部分以提供从第一表面均匀的光分布。

    DUV laser annealing and stabilization of SiCOH films
    9.
    发明授权
    DUV laser annealing and stabilization of SiCOH films 失效
    DUV激光退火和SiCOH膜的稳定化

    公开(公告)号:US07560794B2

    公开(公告)日:2009-07-14

    申请号:US11693409

    申请日:2007-03-29

    IPC分类号: H01L29/00

    摘要: A method of fabricating a dielectric film comprising atoms of Si, C, O and H (hereinafter SiCOH) that has improved insulating properties as compared with prior art dielectric films, including prior art SiCOH dielectric films that are not subjected to the inventive deep ultra-violet (DUV) is disclosed. The improved properties include reduced current leakage which is achieved without adversely affecting (increasing) the dielectric constant of the SiCOH dielectric film. In accordance with the present invention, a SiCOH dielectric film exhibiting reduced current leakage and improved reliability is obtained by subjecting an as deposited SiCOH dielectric film to a DUV laser anneal. The DUV laser anneal step of the present invention likely removes the weakly bonded C from the film, thus improving leakage current.

    摘要翻译: 与现有技术的电介质膜相比,包括具有改进的绝缘性能的Si,C,O和H原子(以下称为SiCOH)的电介质膜的制造方法,包括不经受本发明的深超极化的现有技术的SiCOH介电膜, 紫色(DUV)。 改进的性能包括减少的电流泄漏,其不会不利地影响(增加)SiCOH介电膜的介电常数。 根据本发明,通过使沉积的SiCOH电介质膜进行DUV激光退火,获得了表现出减小的电流泄漏和改进的可靠性的SiCOH电介质膜。 本发明的DUV激光退火工序可能从膜中除去弱结合的C,从而提高漏电流。