TANTALUM AMIDO-COMPLEXES WITH CHELATE LIGANDS USEFUL FOR CVD AND ALD OF TaN AND Ta205 THIN FILMS
    9.
    发明申请
    TANTALUM AMIDO-COMPLEXES WITH CHELATE LIGANDS USEFUL FOR CVD AND ALD OF TaN AND Ta205 THIN FILMS 有权
    具有适用于TaN和Ta205薄膜的CVD和ALD的CHATEAL配体的TANTALUM AMIDO复合物

    公开(公告)号:US20100240918A1

    公开(公告)日:2010-09-23

    申请号:US12790835

    申请日:2010-05-30

    IPC分类号: C07F9/00

    摘要: Tantalum compounds of Formula I hereof are disclosed, having utility as precursors for forming tantalum-containing films such as barrier layers. The tantalum compounds of Formula I may be deposited by CVD or ALD for forming semiconductor device structures including a dielectric layer, a barrier layer on the dielectric layer, and a copper metallization on the barrier layer, wherein the barrier layer includes a Ta-containing layer and sufficient carbon so that the Ta-containing layer is amorphous. According to one embodiment, the semiconductor device structure is fabricated by depositing the Ta-containing barrier layer, via CVD or ALD, from a precursor including the tantalum compound of Formula I hereof at a temperature below about 400° C. in a reducing or inert atmosphere, e.g., a gas or plasma optionally containing a reducing agent.

    摘要翻译: 公开了式I的钽化合物,其用作形成含钽膜如阻挡层的前体。 可以通过CVD或ALD沉积式I的钽化合物以形成包括电介质层,电介质层上的阻挡层和阻挡层上的铜金属化的半导体器件结构,其中阻挡层包括含Ta层 和足够的碳,使得含Ta层是无定形的。 根据一个实施例,半导体器件结构通过CVD或ALD从包含式I的钽化合物的前体在低于约400℃的还原或惰性的沉积中制备 气氛,例如任选地含有还原剂的气体或等离子体。