摘要:
A bumper absorber (9) has a squared U-shaped cross section formed of: a vertical face (11) extending in a top-bottom direction and a vehicle width direction, and a top face (12) and a bottom face (13) respectively extending rearward from a top end and a bottom end of the vertical face (11). The bumper absorber (9) is configured such that the top face (12) and the bottom face (13) thereof are supported by the bumper reinforcement (10) via multiple attachment members (23 to 27), and an interval between the attachment members adjacent to each other in the vehicle width direction is set to decrease from end portions (9b) in the vehicle width direction toward a central portion (9a) in the vehicle width direction.
摘要:
A bumper absorber (9) has a squared U-shaped cross section formed of: a vertical face (11) extending in a top-bottom direction and a vehicle width direction, and a top face (12) and a bottom face (13) respectively extending rearward from a top end and a bottom end of the vertical face (11). The bumper absorber (9) is configured such that the top face (12) and the bottom face (13) thereof are supported by the bumper reinforcement (10) via multiple attachment members (23 to 27), and an interval between the attachment members adjacent to each other in the vehicle width direction is set to decrease from end portions (9b) in the vehicle width direction toward a central portion (9a) in the vehicle width direction.
摘要:
An oxygen or nitrogen ion beam is implanted into a polycrystalline silicon or in an amorphous silicon layer, or a single crystal device body or layer, on a semiconductor substrate to an extent sufficient to convert the polycrystalline silicon layer, the amorphous layer or the single crystal device body or layer into a semi-insulating layer having a resistivity of 10.sup.7 to 10.sup.11 ohm-cm, which has improved passivation property.
摘要:
A method of making a semiconductor device which has sharp corners on an upper surface and wherein a passivation layer is formed over said surface and windows are formed in the passivation layer for the attaching and formation of electrodes in which a photoresist material is placed over the passivation layer and selectively removed so as to leave areas of photoresist at locations over said passivation layer wherein electrodes are to be formed after which a layer of metal is formed over the surface and the metal and photoresist is removed at those portions where the photoresist layer remained after which passivation the area is etched through the windows in the metal layer and the metal layer is then removed and the electrodes are formed in the windows.
摘要:
A thin film resistor is formed of polycrystalline silicon which contains 2 to 45 atomic percent of oxygen and wherein the resistivity of the polycrystalline silicon film varies as a function of the amount of oxygen contained in the film and wherein the resistivity is substantially higher than polycrystalline silicon not containing oxygen.
摘要:
A semiconductor device and method of making the same is disclosed having a surface passivation film of a polycrystalline silicon layer containing 2 to 45 atomic percent of oxygen atoms.The polycrystalline silicon layer is locally electrically insulated by oxidizing throughout the thickness of the layer.The local oxidizing treatment causes the polycrystalline or silicon layer to pattern.
摘要:
A semiconductive device is provided which includes a single crystal substrate. A first insulating layer arranged on one surface of the substrate is of polycrystalline silicon containing oxygen. A second insulating layer formed on the first insulating layer is of polycrystalline silicon containing one of a group consisting of nitrogen, Si.sub.3 N.sub.4, Al.sub.2 O.sub.3 and silicone resin. The substrate includes at least one PN junction which extends to the said surface of the substrate. A novel method of making is also disclosed.
摘要翻译:提供了包括单晶衬底的半导体器件。 布置在基板的一个表面上的第一绝缘层是含氧的多晶硅。 形成在第一绝缘层上的第二绝缘层是由氮,Si 3 N 4,Al 2 O 3和有机硅树脂组成的组中的一种的多晶硅。 衬底包括延伸到衬底的所述表面的至少一个PN结。 还公开了一种新颖的制造方法。
摘要:
A method for fabricating a semiconductor device includes the steps of forming a first polycrystalline silicon layer containing oxygen atoms on a semiconductor layer, of forming a second polycrystalline silicon layer containing nitrogen atoms on the first polycrystalline silicon layer, of removing a predetermined part of the first and second polycrystalline silicon layers to form an opening therein, and of diffusing impurity material into the semiconductor layer through the opening in order to form a diffused region. The fabricating process can be remarkably simplified.
摘要:
A gastric access device having an external bolster and a tubular body. The tubular body has an integral bolster portion at one end and an integral dilator portion at an opposite end. An incision extending from an external body surface to an internal body cavity is formed and the gastric access device is inserted through the incision such that the bolster portion is in contact with an inner body surface surrounding the internal body cavity, the tubular body lies within and projects outwardly from the incision, and the dilator portion is on the outside or exterior of the body. The external bolster is slid or pushed down over the dilator portion and the projecting portion of the tubular body and into contact with the external surface of the body. The projecting portion of the tubular body is clamped and subsequently severed to disconnect the dilator portion from the tubular body. Thereafter, air flow control devices may be inserted into the tubular body, and surgical tools inserted through the tubular body and into the internal body cavity. The surgical tools are manipulated by the surgeon to perform surgical procedures on the tissue within the internal body cavity.
摘要:
A polycrystalline silicon layer as a passivation layer formed on a semiconductor single crystal layer in a semiconductor device and in which polycrystalline silicon layer contains 2 to 45 atomic percent of oxygen. This layer can be formed under accurate control by utilizing a mixed gas of nitrogen oxide as an oxygen supply source and a silicon compound as a silicon supply source is thermally decomposed. The polycrystalline silicon is constituted of grains comprising single crystals of silicon. Oxygen atoms are uniformly distributed in the grains. Substantially no SiO.sub.2 layer exists between the grains and the semiconductor single crystal layer.