公开(公告)号：US20080099819A1

公开(公告)日：2008-05-01

申请号：US11874004

申请日：2007-10-17

申请人： Masaru KITO ,  Hirofumi INOUE

发明人： Masaru KITO ,  Hirofumi INOUE

IPC分类号： H01L29/788 ,  H01L21/8239 ,  H01L21/8247

CPC分类号： H01L27/105 ,  G11C16/10 ,  H01L27/0207 ,  H01L27/0688 ,  H01L27/11556 ,  H01L27/1157 ,  H01L27/11578 ,  H01L27/11582

摘要： According to an aspect of the present invention, there is provided a nonvolatile semiconductor storage apparatus including: a substrate; a columnar semiconductor disposed perpendicular to the substrate; a charge storage laminated film disposed around the columnar semiconductor; a first conductor layer that is in contact with the charge storage laminated film and that has a first end portion having a first end face; a second conductor layer that is in contact with the charge storage laminated film, that is separated from the first conductor layer and that has a second end portion having a second end face; a first contact plug disposed on the first end face; and a second contact plug disposed on the second end face.

摘要翻译： 根据本发明的一个方面，提供了一种非易失性半导体存储装置，包括：基板; 垂直于衬底设置的柱状半导体; 设置在所述柱状半导体周围的电荷存储层叠膜; 与所述电荷存储叠层膜接触并具有第一端部的第一导体层，所述第一端部具有第一端面; 与电荷存储叠层膜接触的第二导体层，其与第一导体层分离并且具有具有第二端面的第二端部; 设置在所述第一端面上的第一接触插塞; 以及设置在所述第二端面上的第二接触插塞。

公开(公告)号：US20130075805A1

公开(公告)日：2013-03-28

申请号：US13419984

申请日：2012-03-14

申请人： Mitsuru SATO ,  Megumi ISHIDUKI ,  Masaru KIDOH ,  Atsushi KONNO ,  Yoshihiro AKUTSU ,  Masaru KITO ,  Yoshiaki FUKUZUMI ,  Ryota KATSUMATA

发明人： Mitsuru SATO ,  Megumi ISHIDUKI ,  Masaru KIDOH ,  Atsushi KONNO ,  Yoshihiro AKUTSU ,  Masaru KITO ,  Yoshiaki FUKUZUMI ,  Ryota KATSUMATA

IPC分类号： H01L29/792 ,  H01L21/425

CPC分类号： H01L29/7926 ,  H01L21/265 ,  H01L27/11582 ,  H01L29/0676 ,  H01L29/66833

摘要： According to one embodiment, a method for manufacturing a nonvolatile semiconductor storage device includes; forming a first and a second stacked bodies; forming a through hole penetrating through the first stacked body, a second portion communicating with the first portion and penetrating through a select gate, and a third portion communicating with the second portion and penetrating through a second insulating layer; forming a memory film, a gate insulating film, and a channel body; forming a third insulating layer inside the channel body; forming a first embedded portion above a boundary portion inside the third portion; exposing the channel body by removing part of the first embedded portion and part of the third insulating layer in the third portion; and embedding a second embedded portion including silicon having higher impurity concentration than the first embedded portion above the first embedded portion inside the third portion.

摘要翻译： 根据一个实施例，一种用于制造非易失性半导体存储装置的方法包括： 形成第一和第二堆叠体; 形成穿过所述第一层叠体的通孔，与所述第一部分连通并穿过选择栅极的第二部分，以及与所述第二部分连通并穿透第二绝缘层的第三部分; 形成记忆膜，栅极绝缘膜和通道体; 在通道体内形成第三绝缘层; 在第三部分内部的边界部分上方形成第一嵌入部分; 通过去除第三部分中的第一嵌入部分和第三绝缘层的一部分的一部分来暴露通道体; 以及在所述第三部分内部嵌入包含比所述第一嵌入部分上方的所述第一嵌入部分杂质浓度高的硅的第二嵌入部分。

公开(公告)号：US20110284947A1

公开(公告)日：2011-11-24

申请号：US13198359

申请日：2011-08-04

申请人： Masaru KITO ,  Hideaki Aochi ,  Ryota Katsumata ,  Akihiro Nitayama ,  Masaru Kidoh ,  Hiroyasu Tanaka ,  Yoshiaki Fukuzumi ,  Yasuyuki Matsuoka ,  Mitsuru Sato

发明人： Masaru KITO ,  Hideaki Aochi ,  Ryota Katsumata ,  Akihiro Nitayama ,  Masaru Kidoh ,  Hiroyasu Tanaka ,  Yoshiaki Fukuzumi ,  Yasuyuki Matsuoka ,  Mitsuru Sato

IPC分类号： H01L29/792

CPC分类号： H01L27/11582 ,  G11C16/0483 ,  H01L21/8221 ,  H01L27/0688 ,  H01L27/105 ,  H01L27/115 ,  H01L27/11556 ,  H01L27/11573 ,  H01L27/11578

摘要： A nonvolatile semiconductor memory device that have a new structure are provided, in which memory cells are laminated in a three dimensional state so that the chip area may be reduced. The nonvolatile semiconductor memory device of the present invention is a nonvolatile semiconductor memory device that has a plurality of the memory strings, in which a plurality of electrically programmable memory cells is connected in series. The memory strings comprise a pillar shaped semiconductor; a first insulation film formed around the pillar shaped semiconductor; a charge storage layer formed around the first insulation film; the second insulation film formed around the charge storage layer; and first or nth electrodes formed around the second insulation film (n is natural number more than 1). The first or nth electrodes of the memory strings and the other first or nth electrodes of the memory strings are respectively the first or nth conductor layers that are spread in a two dimensional state.

摘要翻译： 提供了具有新结构的非易失性半导体存储器件，其中以三维状态层叠存储单元，从而可以减小芯片面积。 本发明的非易失性半导体存储装置是具有串联连接有多个电可编程存储单元的多个存储串的非易失性半导体存储装置。 存储器串包括柱形半导体; 形成在柱状半导体周围的第一绝缘膜; 形成在所述第一绝缘膜周围的电荷存储层; 形成在电荷存储层周围的第二绝缘膜; 并且形成在第二绝缘膜周围的第一或第n电极（n是大于1的自然数）。 存储器串的第一或第n电极和存储器串的其它第一或第n电极分别是以二维状态扩展的第一或第n导体层。

公开(公告)号：US20100052042A1

公开(公告)日：2010-03-04

申请号：US12561451

申请日：2009-09-17

申请人： Hiroyasu TANAKA ,  Ryota KATSUMATA ,  Hideaki AOCHI ,  Masaru KIDO ,  Masaru KITO ,  Mitsuru SATO

发明人： Hiroyasu TANAKA ,  Ryota KATSUMATA ,  Hideaki AOCHI ,  Masaru KIDO ,  Masaru KITO ,  Mitsuru SATO

IPC分类号： H01L29/792 ,  H01L21/336

CPC分类号： H01L29/792 ,  H01L21/8221 ,  H01L27/0688 ,  H01L27/105 ,  H01L27/11548 ,  H01L27/11551 ,  H01L27/11556 ,  H01L27/11575 ,  H01L27/11578 ,  H01L27/11582 ,  H01L29/7881 ,  H01L29/7926

摘要： The semiconductor memory device of the present invention includes a plurality of memory strings having a plurality of electrically reprogrammable memory cells connected in series, the memory strings having a column shaped semiconductor, a first insulation film formed around the column shaped semiconductor, a charge accumulation layer formed around the first insulation film, a second insulation film formed around the charge accumulation film and a plurality of electrodes formed around the second insulation film, a bit line connected to one end of the memory strings via a plurality of selection transistors, and a conducting layer extending in two dimensions and in which the plurality of electrodes of the memory strings and the plurality of electrodes of different memory strings are shared respectively, wherein each end part of the conducting layer is formed in step shapes in a direction parallel with the bit line.

摘要翻译： 本发明的半导体存储器件包括具有串联连接的多个电可再编程存储器单元的多个存储器串，具有列形半导体的存储器串，形成在柱状半导体周围的第一绝缘膜，电荷累积层 形成在第一绝缘膜周围，形成在电荷累积膜周围的第二绝缘膜和围绕第二绝缘膜形成的多个电极，经由多个选择晶体管连接到存储器串的一端的位线，以及导电 分别在存储器串的多个电极和不同的存储器串的多个电极中分别共享，其中导电层的每个端部在平行于位线的方向上形成为台阶形状 。

公开(公告)号：US20080315291A1

公开(公告)日：2008-12-25

申请号：US12140734

申请日：2008-06-17

申请人： Masaru KITO ,  Hideaki Aochi ,  Ryota Katsumata ,  Masaru Kidoh ,  Hiroyasu Tanaka ,  Yoshiaki Fukuzumi ,  Yasuyuki Matsuoka

发明人： Masaru KITO ,  Hideaki Aochi ,  Ryota Katsumata ,  Masaru Kidoh ,  Hiroyasu Tanaka ,  Yoshiaki Fukuzumi ,  Yasuyuki Matsuoka

IPC分类号： H01L29/00 ,  H01L21/31

CPC分类号： H01L27/105 ,  H01L21/02161 ,  H01L21/02164 ,  H01L21/0217 ,  H01L21/31645 ,  H01L27/11568 ,  H01L27/11578 ,  H01L27/11582 ,  H01L29/66833 ,  H01L29/792 ,  H01L29/7926

摘要： A nonvolatile semiconductor memory device has a plurality of memory strings each including a plurality of electrically rewritable memory cells serially connected. The memory string includes a columnar semiconductor portion extending in the vertical direction from a substrate, a first charge storage layer formed adjacent to the columnar semiconductor portion and configured to accumulate charge, a first block insulator formed adjacent to the first charge storage layer, and a first conductor formed adjacent to the first block insulator.

摘要翻译： 非易失性半导体存储器件具有多个存储串，每个存储串包括串联连接的多个电可重写存储器单元。 存储器串包括从基板沿垂直方向延伸的柱状半导体部分，与柱状半导体部分相邻形成并构成为积蓄电荷的第一电荷存储层，与第一电荷存储层相邻形成的第一块绝缘体， 第一导体与第一块绝缘体相邻形成。

公开(公告)号：US20070290253A1

公开(公告)日：2007-12-20

申请号：US11765881

申请日：2007-06-20

申请人： Masaru KITO ,  Nobutoshi Aoki ,  Masaru Kidoh ,  Ryota Katsumata ,  Masaki Kondo ,  Naoki Kusunoki ,  Toshiyuki Enda ,  Sanae Ito ,  Hiroyoshi Tanimoto ,  Hideaki Aochi ,  Akihiro Nitayama ,  Riichiro Shirota

发明人： Masaru KITO ,  Nobutoshi Aoki ,  Masaru Kidoh ,  Ryota Katsumata ,  Masaki Kondo ,  Naoki Kusunoki ,  Toshiyuki Enda ,  Sanae Ito ,  Hiroyoshi Tanimoto ,  Hideaki Aochi ,  Akihiro Nitayama ,  Riichiro Shirota

IPC分类号： H01L29/788

CPC分类号： H01L29/7881 ,  H01L21/84 ,  H01L27/115 ,  H01L27/11521 ,  H01L27/11568 ,  H01L27/1203 ,  H01L29/42336

摘要： A nonvolatile semiconductor memory device includes: a semiconductor region; device isolation regions placed in the semiconductor region and extending in a column direction; a semiconductor layer placed on the semiconductor region and between the device isolation regions, and having a convex shape in cross section along a row direction; source/drain regions placed in the semiconductor layer and spaced from each other; a gate insulating film placed on the semiconductor layer between the source/drain regions; a floating gate electrode layer placed on the gate insulating film; an intergate insulating film placed on the floating gate electrode layer and upper surfaces of the device isolation regions; and a control gate electrode layer placed on the intergate insulating film and extending in the row direction.

摘要翻译： 非易失性半导体存储器件包括：半导体区域; 器件隔离区域放置在半导体区域中并沿列方向延伸; 放置在半导体区域和器件隔离区之间的半导体层，沿着行方向具有凸形的横截面; 源极/漏极区域放置在半导体层中并彼此间隔开; 位于源极/漏极区之间的半导体层上的栅极绝缘膜; 放置在栅极绝缘膜上的浮栅电极层; 布置在浮栅电极层和器件隔离区的上表面上的隔间绝缘膜; 以及控制栅极电极层，其设置在所述隔间绝缘膜上并沿行方向延伸。

公开(公告)号：US20120206961A1

公开(公告)日：2012-08-16

申请号：US13235999

申请日：2011-09-19

申请人： Masaru KITO

发明人： Masaru KITO

IPC分类号： G11C16/10

CPC分类号： G11C16/0483 ,  G11C16/04 ,  G11C16/06 ,  G11C16/10 ,  G11C16/3404 ,  G11C16/3495

摘要： According to one embodiment, a method for operating a nonvolatile semiconductor memory device, the device includes a memory unit having a memory string, and a control unit. The memory string includes a plurality of transistors and has a first group being part of the transistors, a adjusting transistor connected next to the first group, and a second group including transistors connected to a side opposite the first group with respect to the adjusting transistor. The method includes rewriting the threshold values of the transistors of the first group, and then performing control so as to set a first threshold value for adjustment to the adjusting transistor to adjust an amount corresponding to relative variations in the threshold values of the transistors of the second group, the relative variations being caused by the rewrite of the threshold values of the transistors of the first group.

摘要翻译： 根据一个实施例，一种用于操作非易失性半导体存储器件的方法，该器件包括具有存储器串的存储器单元和控制单元。 存储器串包括多个晶体管，并且具有作为晶体管的一部分的第一组，与第一组相邻的调节晶体管，以及包括连接到相对于调整晶体管的与第一组相对的一侧的晶体管的第二组。 该方法包括重写第一组的晶体管的阈值，然后执行控制，以便将调整用的第一阈值设置为调节晶体管，以调整对应于晶体管的阈值的相对变化的量 第二组，相对变化是由第一组的晶体管的阈值的重写引起的。

公开(公告)号：US20110002172A1

公开(公告)日：2011-01-06

申请号：US12728694

申请日：2010-03-22

申请人： Masaru KITO ,  Ryota Katsumata ,  Yoshiaki Fukuzumi ,  Masaru Kidoh ,  Hiroyasu Tanaka ,  Yosuke Komori ,  Megumi Ishiduki ,  Junya Matsunami ,  Tomoko Fujiwara ,  Hideaki Aochi ,  Ryouhei Kirisawa ,  Yoshimasa Mikajiri ,  Shigeto Oota

发明人： Masaru KITO ,  Ryota Katsumata ,  Yoshiaki Fukuzumi ,  Masaru Kidoh ,  Hiroyasu Tanaka ,  Yosuke Komori ,  Megumi Ishiduki ,  Junya Matsunami ,  Tomoko Fujiwara ,  Hideaki Aochi ,  Ryouhei Kirisawa ,  Yoshimasa Mikajiri ,  Shigeto Oota

IPC分类号： G11C16/02 ,  G11C11/34

CPC分类号： G11C16/04 ,  G11C16/0483 ,  G11C16/10 ,  G11C16/16 ,  G11C16/3409 ,  G11C16/3413 ,  H01L27/11578 ,  H01L27/11582

摘要： A nonvolatile semiconductor memory device includes: a memory unit; and a control unit. The memory unit includes a multilayer structure including electrode films and inter-electrode insulating films alternately stacked in a first direction; a semiconductor pillar piercing the multilayer structure in the first direction; a memory layer provided between the semiconductor pillar and the electrode films; a inner insulating film provided between the memory layer and the semiconductor pillar; a outer insulating film provided between the memory layer and the electrode films; and a wiring electrically connected to the first semiconductor pillar. In erasing operation, the control unit sets the first wiring at a first potential and sets the electrode film at a second potential lower than the first potential, and then sets the first wiring at a third potential and sets the electrode film at a fourth potential higher than the third potential.

摘要翻译： 非易失性半导体存储器件包括：存储器单元; 和控制单元。 存储单元包括多层结构，其包括沿第一方向交替堆叠的电极膜和电极间绝缘膜; 在所述第一方向上穿透所述多层结构的半导体柱; 设置在所述半导体柱和所述电极膜之间的存储层; 设置在所述存储层和所述半导体柱之间的内部绝缘膜; 设置在存储层和电极膜之间的外部绝缘膜; 以及电连接到第一半导体柱的布线。 在擦除操作中，控制单元将第一布线设置在第一电位，并将电极膜设置在比第一电位低的第二电位，然后将第一布线设置在第三电位，并将电极膜设置为高于第四电位 比第三个潜力。

公开(公告)号：US20100244186A1

公开(公告)日：2010-09-30

申请号：US12722920

申请日：2010-03-12

申请人： Ryota KATSUMATA ,  Masaru KITO ,  Yoshiaki FUKUZUMI ,  Masaru KIDOH ,  Hiroyasu TANAKA ,  Yosuke KOMORI ,  Megumi ISHIDUKI ,  Hideaki AOCHI ,  Ryouhei KIRISAWA ,  Junya MATSUNAMI ,  Tomoko FUJIWARA

发明人： Ryota KATSUMATA ,  Masaru KITO ,  Yoshiaki FUKUZUMI ,  Masaru KIDOH ,  Hiroyasu TANAKA ,  Yosuke KOMORI ,  Megumi ISHIDUKI ,  Hideaki AOCHI ,  Ryouhei KIRISAWA ,  Junya MATSUNAMI ,  Tomoko FUJIWARA

IPC分类号： H01L27/10 ,  H01L21/822 ,  G11C17/16

CPC分类号： H01L27/1021 ,  H01L23/5252 ,  H01L27/0207 ,  H01L27/101 ,  H01L27/112 ,  H01L27/11206 ,  H01L2924/0002 ,  H01L2924/00

摘要： A nonvolatile semiconductor memory device, includes: a stacked structural unit including a plurality of stacked component units stacked in a first direction, each of the stacked component units including a first conducting film made of a semiconductor of a first conductivity type provided perpendicular to the first direction and a first insulating film stacked in the first direction with the first conducting film; a semiconductor pillar piercing the stacked structural unit in the first direction and including a conducting region of a second conductivity type, the semiconductor pillar including a first region opposing each of the first conducting films, and a second region provided between the first regions with respect to the first direction, the second region having a resistance different from a resistance of the first region; and a second insulating film provided between the semiconductor pillar and the first conducting film.

摘要翻译： 一种非易失性半导体存储器件，包括：堆叠结构单元，包括沿第一方向堆叠的多个堆叠的元件单元，每个堆叠元件单元包括由垂直于第一元件垂直设置的第一导电类型的半导体制成的第一导电膜 方向和与第一导电膜在第一方向上堆叠的第一绝缘膜; 所述半导体柱在所述第一方向上穿透所述层叠结构单元，并且包括第二导电类型的导电区域，所述半导体柱包括与所述第一导电膜相对的第一区域，以及设置在所述第一区域之间的第二区域， 所述第一方向，所述第二区域具有与所述第一区域的电阻不同的电阻; 以及设置在所述半导体柱和所述第一导电膜之间的第二绝缘膜。

公开(公告)号：US20100219538A1

公开(公告)日：2010-09-02

申请号：US12776454

申请日：2010-05-10

申请人： Masaru KITO ,  Hideaki Aochi ,  Takayuki Okamura

发明人： Masaru KITO ,  Hideaki Aochi ,  Takayuki Okamura

IPC分类号： H01L23/538

CPC分类号： H01L21/3086 ,  H01L21/3088 ,  H01L27/105 ,  H01L27/1052 ,  H01L27/11524

摘要： A semiconductor device comprises a semiconductor layer including a plurality of paralleled linear straight sections extending in a first direction. The layer also includes a plurality of connecting sections each having a width in the first direction sufficient to form a wire-connectable contact therein and arranged to connect between adjacent ones of the straight sections in a second direction. The connecting sections have respective ends formed aligned with a first straight line parallel to the second direction.

摘要翻译： 半导体器件包括半导体层，该半导体层包括在第一方向上延伸的多个平行的线性直线部分。 该层还包括多个连接部分，每个连接部分具有在第一方向上的宽度，足以在其中形成可接线的触点，并且布置成在第二方向上在相邻的直部分之间连接。 连接部具有与平行于第二方向的第一直线对准的各自的端部。