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公开(公告)号:US20230253343A1
公开(公告)日:2023-08-10
申请号:US18301606
申请日:2023-04-17
发明人: Jin-woo PARK , Un-Byoung KANG , Jong Ho LEE
IPC分类号: H01L23/00 , H01L23/498 , H01L23/14
CPC分类号: H01L23/562 , H01L23/49816 , H01L24/14 , H01L23/14
摘要: A semiconductor package includes a first substrate including a circuit pattern and a dummy pattern on an upper face of the first substrate, a solder ball, a second substrate on the first substrate, and an underfill material layer between the first and second substrates. The underfill material layer wraps around the solder ball. The dummy pattern is not electrically connected to the circuit pattern. The first substrate includes a solder resist layer on the circuit pattern and the dummy pattern. The solder resist layer includes a first opening for exposing at least a part of the circuit pattern. The solder ball is in the first opening and electrically insulated from the dummy pattern by the solder resist layer. The second substrate is electrically connected to the first substrate by the solder ball. The second substrate is electrically insulated from the dummy pattern by the solder resist layer.
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公开(公告)号:US20220130802A1
公开(公告)日:2022-04-28
申请号:US17571796
申请日:2022-01-10
发明人: Joonho JUN , Un-Byoung KANG , Sunkyoung SEO , Jongho LEE , Young Kun JEE
IPC分类号: H01L25/065 , H01L23/00
摘要: A semiconductor package may include first and second substrates, which are vertically stacked, a semiconductor device layer on a bottom surface of the second substrate to face a top surface of the first substrate, upper chip pads and an upper dummy pad on the top surface of the first substrate, penetration electrodes, which each penetrate the first substrate and are connected to separate, respective upper chip pads, lower chip pads on a bottom surface of the semiconductor device layer and electrically connected to separate, respective upper chip pads, and a lower dummy pad on the bottom surface of the semiconductor device layer and electrically isolated from the upper dummy pad. A distance between the upper and lower dummy pads in a horizontal direction that is parallel to the first substrate may be smaller than a diameter of the lower dummy pad.
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公开(公告)号:US20200303445A1
公开(公告)日:2020-09-24
申请号:US16898610
申请日:2020-06-11
发明人: Un-Byoung KANG , Yungcheol KONG , Hyunsu JUN , Kyoungsei CHOI
IPC分类号: H01L27/146 , H01L31/0203 , H01L23/00 , H01L31/024
摘要: A semiconductor package including a substrate, a memory chip on the substrate, a mold layer on the substrate to cover a side surface of the memory chip, an image sensor chip on the memory chip and the mold layer, and a connection terminal between and electrically connecting the memory chip to the image sensor chip may be provided.
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公开(公告)号:US20190074316A1
公开(公告)日:2019-03-07
申请号:US16177780
申请日:2018-11-01
发明人: Un-Byoung KANG , Yungcheol Kong , Hyunsu Jun , Kyoungsei Choi
IPC分类号: H01L27/146 , H01L31/024 , H01L31/0203 , H01L23/00
摘要: A semiconductor package including a substrate, a memory chip on the substrate, a mold layer on the substrate to cover a side surface of the memory chip, an image sensor chip on the memory chip and the mold layer, and a connection terminal between and electrically connecting the memory chip to the image sensor chip may be provided.
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公开(公告)号:US20150214089A1
公开(公告)日:2015-07-30
申请号:US14682231
申请日:2015-04-09
发明人: CHUNGSUN LEE , Jung-Seok AHN , Kwang-chul CHOI , Un-Byoung KANG , Jung-Hwan KIM , JOONSIK SOHN , JEON IL LEE
IPC分类号: H01L21/683 , B32B37/18 , B32B37/12 , B32B38/10 , H01L21/02 , B32B38/04 , B32B37/24 , H01L21/304 , H01L21/768 , H01L23/00 , B32B37/26 , B32B38/16
CPC分类号: H01L21/6835 , B32B37/1284 , B32B37/18 , B32B37/24 , B32B37/26 , B32B38/04 , B32B38/10 , B32B38/162 , B32B2037/268 , B32B2315/08 , B32B2457/14 , H01L21/02057 , H01L21/02126 , H01L21/304 , H01L21/6836 , H01L21/76898 , H01L24/03 , H01L24/14 , H01L2221/68318 , H01L2221/68327 , H01L2221/6834 , H01L2221/68363 , H01L2221/68372 , H01L2221/68381 , H01L2224/0401 , H01L2224/05025 , H01L2224/13023 , H01L2924/12042 , H01L2924/181 , Y10S438/977 , H01L2924/00
摘要: A method for processing substrates includes providing a bonding layer between a substrate and a carrier to bond the substrate to the carrier, processing the substrate while the substrate is supported by the carrier, and removing the bonding layer to separate the substrate from the carrier. The bonding layer may include a thermosetting release layer and thermosetting glue layers, wherein at least one of the thermosetting glue layers is provided on each side of the thermosetting release layer.
摘要翻译: 一种处理衬底的方法包括:在衬底和载体之间提供接合层,以将衬底粘合到载体上,在衬底由载体支撑的同时处理衬底,以及去除结合层以使衬底与载体分离。 粘合层可以包括热固性剥离层和热固性胶层,其中至少一个热固性胶层设置在热固性剥离层的每一侧上。
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公开(公告)号:US20230420374A1
公开(公告)日:2023-12-28
申请号:US18303380
申请日:2023-04-19
发明人: Kwang-Chul CHOI , Sang Hyun LEE , Un-Byoung KANG , Jung Hoon KANG
IPC分类号: H01L23/538 , H01L25/16 , H01L23/498
CPC分类号: H01L23/5383 , H01L25/16 , H01L23/49816 , H01L25/105
摘要: A semiconductor package includes a package substrate having a first side and an opposite second side, a semiconductor chip on the first side of the package substrate, a capacitor on the second side of the package substrate, a plurality of connecting terminals on the second side of the package substrate, and a metal line within a trench in the package substrate. The trench extends in a first direction, and the metal line is between the capacitor and the plurality of connecting terminals. The metal line is spaced apart from the capacitor in a second direction that is transverse to the first direction, and a distance between the metal line and the capacitor is 100 μm or more and 1000 μm or less.
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公开(公告)号:US20220037261A1
公开(公告)日:2022-02-03
申请号:US17349174
申请日:2021-06-16
发明人: Ju-Il CHOI , Gyuho KANG , Un-Byoung KANG , Byeongchan KIM , Junyoung PARK , Jongho LEE , Hyunsu HWANG
IPC分类号: H01L23/538 , H01L23/498 , H01L23/00 , H01L23/31 , H01L25/10
摘要: A semiconductor package including a redistribution substrate including an insulating layer and redistribution patterns in the insulating layer may be provided. Each of the redistribution patterns may include a via portion, a pad portion vertically overlapping the via portion, and a line portion extending from the pad portion. The via portion, the pad portion, and the line portion may be connected to each other to form a single object. A level of a bottom surface of the pad portion may be lower than a level of a bottom surface of the line portion. A width of the line portion may have a largest value at a level between a top surface of the line portion and the bottom surface of the line portion.
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公开(公告)号:US20210384143A1
公开(公告)日:2021-12-09
申请号:US17168337
申请日:2021-02-05
发明人: Jin-woo PARK , Un-Byoung KANG , Jong Ho LEE
IPC分类号: H01L23/00 , H01L23/14 , H01L23/498
摘要: A semiconductor package includes a first substrate including a circuit pattern and a dummy pattern on an upper face of the first substrate, a solder ball, a second substrate on the first substrate, and an underfill material layer between the first and second substrates. The underfill material layer wraps around the solder ball. The dummy pattern is not electrically connected to the circuit pattern. The first substrate includes a solder resist layer on the circuit pattern and the dummy pattern. The solder resist layer includes a first opening for exposing at least a part of the circuit pattern. The solder ball is in the first opening and electrically insulated from the dummy pattern by the solder resist layer. The second substrate is electrically connected to the first substrate by the solder ball. The second substrate is electrically insulated from the dummy pattern by the solder resist layer.
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公开(公告)号:US20180040658A1
公开(公告)日:2018-02-08
申请号:US15583224
申请日:2017-05-01
发明人: Un-Byoung KANG , Yungcheol KONG , Hyunsu JUN , Kyoungsei CHOI
IPC分类号: H01L27/146 , H01L23/00 , H01L31/024
CPC分类号: H01L27/14634 , H01L24/48 , H01L27/14618 , H01L27/14621 , H01L27/14627 , H01L27/14636 , H01L27/14645 , H01L27/1469 , H01L31/0203 , H01L31/024 , H01L2224/16227
摘要: A semiconductor package including a substrate, a memory chip on the substrate, a mold layer on the substrate to cover a side surface of the memory chip, an image sensor chip on the memory chip and the mold layer, and a connection terminal between and electrically connecting the memory chip to the image sensor chip may be provided.
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公开(公告)号:US20140210075A1
公开(公告)日:2014-07-31
申请号:US14147718
申请日:2014-01-06
发明人: CHUNGSUN LEE , Jung-Seok AHN , Kwang-chul CHOI , Un-Byoung KANG , Jung-Hwan KIM , JOONSIK SOHN , JEON IL LEE
IPC分类号: H01L21/304 , H01L21/683
CPC分类号: H01L21/6835 , B32B37/1284 , B32B37/18 , B32B37/24 , B32B37/26 , B32B38/04 , B32B38/10 , B32B38/162 , B32B2037/268 , B32B2315/08 , B32B2457/14 , H01L21/02057 , H01L21/02126 , H01L21/304 , H01L21/6836 , H01L21/76898 , H01L24/03 , H01L24/14 , H01L2221/68318 , H01L2221/68327 , H01L2221/6834 , H01L2221/68363 , H01L2221/68372 , H01L2221/68381 , H01L2224/0401 , H01L2224/05025 , H01L2224/13023 , H01L2924/12042 , H01L2924/181 , Y10S438/977 , H01L2924/00
摘要: A method for processing substrates includes providing a bonding layer between a substrate and a carrier to bond the substrate to the carrier, processing the substrate while the substrate is supported by the carrier, and removing the bonding layer to separate the substrate from the carrier. The bonding layer may include a thermosetting release layer and thermosetting glue layers, wherein at least one of the thermosetting glue layers is provided on each side of the thermosetting release layer.
摘要翻译: 一种处理衬底的方法包括:在衬底和载体之间提供接合层,以将衬底粘合到载体上,在衬底由载体支撑的同时处理衬底,以及去除结合层以使衬底与载体分离。 粘合层可以包括热固性剥离层和热固性胶层,其中至少一个热固性胶层设置在热固性剥离层的每一侧上。
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