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公开(公告)号:US12190995B2
公开(公告)日:2025-01-07
申请号:US18455904
申请日:2023-08-25
Applicant: Samsung Electronics Co., Ltd.
Inventor: Byunghoon Jeong , Kyungtae Kang , Jangwoo Lee , Jeongdon Ihm
IPC: G11C7/22 , G11C7/10 , G11C8/18 , G11C29/42 , H03K19/173
Abstract: A memory device includes a memory cell array configured to store data; and a data output circuit configured to transmit status data to an external device through at least one data line in a latency period in response to a read enable signal received from the external device and transmit the data read from the memory cell array to the external device through the at least one data line in a period subsequent to the latency period.
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公开(公告)号:US11581025B2
公开(公告)日:2023-02-14
申请号:US17346853
申请日:2021-06-14
Applicant: SAMSUNG ELECTRONICS CO., LTD.
Inventor: Hyunsuk Kang , Jungjune Park , Kyoungtae Kang , Junha Lee , Byunghoon Jeong
Abstract: A high resolution impedance adjustment (ZQ) calibration method using a hidden least significant bit (HLSB) is provided. The high resolution ZQ calibration method generates a data input/output (DQ) code of n+1 bits without a calibration time increase by adding the hidden least significant bit (HLSB) to a ZQ code of n bits output in a ZQ calibration operation of an impedance adjustment (ZQ) pad. A change in a termination resistance of the DQ pad is reduced as small as possible by the DQ code of n+1 bits.
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公开(公告)号:US11127462B2
公开(公告)日:2021-09-21
申请号:US16834025
申请日:2020-03-30
Applicant: Samsung Electronics Co., Ltd.
Inventor: Junha Lee , Seonkyoo Lee , Jeongdon Ihm , Byunghoon Jeong
IPC: G11C16/06 , H01L23/66 , H01L25/065 , H01L25/18 , H01L23/00
Abstract: A multi-chip package with reduced calibration time and an impedance control (ZQ) calibration method thereof are provided. A master chip of the multi-chip package performs a first ZQ calibration operation by using a ZQ resistor, and then, the other slave chips simultaneously perform second ZQ calibration operations with respect to data input/output (DQ) pads of the slave chips by using a termination resistance value of a DQ pad of the master chip on the basis of a one-to-one correspondence relationship with the DQ pad of the master chip. The multi-chip package completes ZQ calibration by performing two ZQ calibration operations, thereby decreasing a ZQ calibration time.
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公开(公告)号:US11769537B2
公开(公告)日:2023-09-26
申请号:US18069685
申请日:2022-12-21
Applicant: Samsung Electronics Co., Ltd.
Inventor: Byunghoon Jeong , Kyungtae Kang , Jangwoo Lee , Jeongdon Ihm
IPC: G11C7/22 , G11C7/10 , H03K19/173 , G11C8/18 , G11C29/42
CPC classification number: G11C7/222 , G11C7/1057 , G11C7/1063 , G11C7/1084 , G11C8/18 , G11C29/42 , H03K19/1737
Abstract: A memory device includes a memory cell array configured to store data; and a data output circuit configured to transmit status data to an external device through at least one data line in a latency period in response to a read enable signal received from the external device and transmit the data read from the memory cell array to the external device through the at least one data line in a period subsequent to the latency period.
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公开(公告)号:US20230179193A1
公开(公告)日:2023-06-08
申请号:US17866517
申请日:2022-07-17
Applicant: Samsung Electronics Co., Ltd.
Inventor: Tongsung Kim , Youngmin Jo , Chiweon Yoon , Byungkwan Chun , Byunghoon Jeong
CPC classification number: H03K5/14 , H03K5/135 , H03L7/0816 , H03K2005/00247
Abstract: A memory package includes a plurality of memory chips, and an interface chip relaying communications between a controller and the plurality of memory chips and receiving a plurality of signals from the plurality of memory chips. The interface chip includes receivers outputting a data signal and a raw clock signal based on the plurality of signals, a delay circuit outputting a delay clock signal by applying an offset delay corresponding to ½ of one unit interval of the data signal and an additional delay to the raw clock signal, and a sampler sampling the data signal in synchronization with a clock signal. The delay circuit outputs the clock signal generated by removing the offset delay from the delay clock signal when the delay clock signal and the data signal have a phase difference corresponding to one unit interval of the data signal.
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公开(公告)号:US11372593B2
公开(公告)日:2022-06-28
申请号:US17168620
申请日:2021-02-05
Applicant: Samsung Electronics Co., Ltd.
Inventor: Seonkyoo Lee , Jeongdon Ihm , Chiweon Yoon , Byunghoon Jeong
Abstract: A nonvolatile memory device includes a first pin that receives a first signal, a second pin that receives a second signal, third pins that receive third signals, a fourth pin that receives a write enable signal, a memory cell array, and a memory interface circuit that obtains a command, an address, and data from the third signals in a first mode and obtains the command and the address from the first signal and the second signal and the data from the third signals in a second mode. In the first mode, the memory interface circuit obtains the command from the third signals and obtains the address from the third signals. In the second mode, the memory interface circuit obtains the command from the first signal and the second signal and obtains the address from the first signal and the second signal.
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公开(公告)号:US20220148630A1
公开(公告)日:2022-05-12
申请号:US17352527
申请日:2021-06-21
Applicant: Samsung Electronics Co., Ltd.
Inventor: Anil Kavala , Tongsung Kim , Chiweon Yoon , Byunghoon Jeong
Abstract: An impedance calibration circuit includes a first variable impedance, a second variable impedance, a third variable impedance. The first variable impedance is connected to a ZQ terminal. A first control circuit performs a first impedance calibration on the first variable impedance based on an output signal from an output of a first comparator. A second control circuit performs a second impedance calibration on the third variable impedance based on an output signal from an output of a second comparator. A first switch connects an input of the first comparator to one of the ZQ terminal and the first node. A second switch connects the output of the first comparator to one of the first and second control circuits. A third switch connects an output of the first switch to one of first and second input terminals of the first comparator and connects the reference voltage to the other.
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公开(公告)号:US20220115046A1
公开(公告)日:2022-04-14
申请号:US17346853
申请日:2021-06-14
Applicant: SAMSUNG ELECTRONICS CO.,LTD.
Inventor: Hyunsuk Kang , Jungjune Park , Kyoungtae Kang , Junha Lee , Byunghoon Jeong
Abstract: A high resolution impedance adjustment (ZQ) calibration method using a hidden least significant bit (HLSB) is provided. The high resolution ZQ calibration method generates a data input/output (DQ) code of n+1 bits without a calibration time increase by adding the hidden least significant bit (HLSB) to a ZQ code of n bits output in a ZQ calibration operation of an impedance adjustment (ZQ) pad. A change in a termination resistance of the DQ pad is reduced as small as possible by the DQ code of n+1 bits.
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公开(公告)号:US20220101895A1
公开(公告)日:2022-03-31
申请号:US17477931
申请日:2021-09-17
Applicant: SAMSUNG ELECTRONICS CO., LTD.
Inventor: YOUNGMIN JO , Byunghoon Jeong , TONGSUNG KIM , CHIWEON YOON , SEONKYOO LEE
IPC: G11C7/10
Abstract: A memory device includes a memory cell array, a page buffer, a control logic circuit, a plurality of input/output pins, a data bus inversion (DBI) pin, and an interface circuit. The page buffer is connected to the memory cell array. The control logic circuit is configured to control an operation of the memory cell array. The plurality of input/output pins receive a plurality of data signals from the controller. The DBI pin receives a DBI signal from the controller. The interface circuit count a first number of bits having a logic value of 1 and a second number of bits having a logic value of 0 from the data signals and the DBI signal and provide the data signals to the page buffer or the control logic circuit based on the first number and the second number.
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公开(公告)号:US20220101893A1
公开(公告)日:2022-03-31
申请号:US17470579
申请日:2021-09-09
Applicant: SAMSUNG ELECTRONICS CO., LTD.
Inventor: Taehyeon PARK , Byunghoon Jeong , Chiweon Yoon
Abstract: A memory chip, a memory controller, and an operating method of the memory chip are provided. The memory chip includes a plurality of pins; and an interface circuit configured to receive a swap command set from a memory controller through the plurality of pins, obtain a swap command and a swap address from the swap command set, generate a swap enable signal based on the swap command and the swap address, and swap and output a data signal according to the swap enable signal.
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