公开(公告)号：US20160122180A1

公开(公告)日：2016-05-05

申请号：US14993714

申请日：2016-01-12

Applicant: Silex Microsystems AB

Inventor： Thorbjom Ebefors ,  Edvard Kalvesten ,  Tomas Bauer

IPC: B81B7/00 ,  H01L23/498 ,  H01L23/66 ,  H01L23/04 ,  H01L23/64

CPC classification number: H01L21/50 ,  B81B7/007 ,  B81B2207/095 ,  B81C1/00301 ,  H01L21/6835 ,  H01L21/76898 ,  H01L21/78 ,  H01L23/04 ,  H01L23/10 ,  H01L23/481 ,  H01L23/49827 ,  H01L23/49838 ,  H01L23/552 ,  H01L23/585 ,  H01L23/642 ,  H01L23/645 ,  H01L23/66 ,  H01L24/03 ,  H01L24/05 ,  H01L24/11 ,  H01L24/13 ,  H01L24/16 ,  H01L24/27 ,  H01L24/29 ,  H01L24/30 ,  H01L24/32 ,  H01L24/33 ,  H01L24/81 ,  H01L24/83 ,  H01L2221/68363 ,  H01L2221/68372 ,  H01L2223/6616 ,  H01L2223/6622 ,  H01L2223/6655 ,  H01L2223/6677 ,  H01L2224/02311 ,  H01L2224/02313 ,  H01L2224/02371 ,  H01L2224/02372 ,  H01L2224/0239 ,  H01L2224/03462 ,  H01L2224/0401 ,  H01L2224/05073 ,  H01L2224/05155 ,  H01L2224/05548 ,  H01L2224/05573 ,  H01L2224/05644 ,  H01L2224/1146 ,  H01L2224/13009 ,  H01L2224/13024 ,  H01L2224/13083 ,  H01L2224/131 ,  H01L2224/13111 ,  H01L2224/13144 ,  H01L2224/13155 ,  H01L2224/29009 ,  H01L2224/29011 ,  H01L2224/29012 ,  H01L2224/29018 ,  H01L2224/29101 ,  H01L2224/29111 ,  H01L2224/29144 ,  H01L2224/30051 ,  H01L2224/3012 ,  H01L2224/81005 ,  H01L2224/81203 ,  H01L2224/81801 ,  H01L2224/83005 ,  H01L2224/83203 ,  H01L2224/83801 ,  H01L2224/83805 ,  H01L2924/01005 ,  H01L2924/01006 ,  H01L2924/01013 ,  H01L2924/01029 ,  H01L2924/01033 ,  H01L2924/0105 ,  H01L2924/01051 ,  H01L2924/01072 ,  H01L2924/01079 ,  H01L2924/0132 ,  H01L2924/01322 ,  H01L2924/014 ,  H01L2924/1461 ,  H01L2924/19041 ,  H01L2924/19042 ,  H01L2924/19043 ,  H01L2924/30105 ,  H01L2924/30107 ,  H01L2924/3011 ,  H01L2924/3025 ,  H01L2924/00 ,  H01L2924/01027 ,  H01L2924/01028 ,  H01L2924/3512

Abstract: A wafer level method of making a micro-electronic and/or micro-mechanic device, having a capping with electrical wafer through connections (vias), comprising the steps of providing a first wafer of a semiconductor material having a first and a second side and a plurality of holes and/or recesses in the first side, and a barrier structure extending over the wafer on the second side, said barrier comprising an inner layer an insulating material, such as oxide, and an outer layer of another material. Then, metal is applied in said holes so as to cover the walls in the holes and the bottom of the holes. The barrier structure is removed and contacts are provided to the wafer through connections on the back-side of the wafer. Bonding structures are provided on either of said first side or the second side of the wafer. The wafer is bonded to another wafer carrying electronic and micro-electronic/mechanic components, such that the first wafer forms a capping structure covering the second wafer. Finally the wafer is singulated to individual devices.

Abstract translation: 一种制造微电子和/或微机械装置的晶片级方法，其具有通过连接（通孔）的电晶片的封盖，包括以下步骤：提供具有第一和第二侧面的半导体材料的第一晶片，以及 第一侧中的多个孔和/或凹部，以及在第二侧上延伸到晶片上方的阻挡结构，所述屏障包括绝缘材料（例如氧化物）和另一材料的外层的内层。 然后，将金属施加在所述孔中，以覆盖孔中的壁和孔的底部。 去除阻挡结构，并且通过晶片背面上的连接将接触提供给晶片。 粘合结构设置在晶片的所述第一侧或第二侧中的任一个上。 晶片被接合到另一个承载电子和微电子/机械部件的晶片，使得第一晶片形成覆盖第二晶片的封盖结构。 最后，将晶片单个化为单个器件。

公开(公告)号：US20140063580A1

公开(公告)日：2014-03-06

申请号：US14073307

申请日：2013-11-06

Applicant: SILEX Microsystems AB

Inventor： Thorbjorn Ebefors ,  Edvard Kalvesten ,  Peter Agren ,  Niklas Svedin

IPC: G02B26/08

CPC classification number: G02B26/0833 ,  B81B7/0006 ,  B81B7/007 ,  B81B2207/092 ,  B81B2207/095 ,  G02B6/3518 ,  G02B6/3584 ,  G02B26/0841 ,  H01L21/76898 ,  H01L23/481 ,  H01L2924/0002 ,  H01L2924/00012 ,  H01L2924/00

Abstract: A layered micro-electronic and/or micro-mechanic structure comprises at least three alternating electrically conductive layers with insulating layers between the conductive layers. There is also provided a via in a first outer layer, said via comprising an insulated conductive connection made of wafer native material through the layer, an electrically conductive plug extending through the other layers and into said via in the first outer layer in order to provide conductivity through the layers, and an insulating enclosure surrounding said conductive plug in at least one selected layer of said other layers for insulating said plug from the material in said selected layer. It also relates to micro-electronic and/or micro- mechanic device comprising a movable member provided above a cavity such that it is movable in at least one direction. The device has a layered structure according to the invention. Methods of making such a layered MEMS structure is also provided.

Abstract translation: 分层微电子和/或微机械结构包括在导电层之间具有绝缘层的至少三个交替导电层。 还提供了在第一外层中的通孔，所述通孔包括由穿过该层的晶片天然材料制成的绝缘导电连接，在第一外层中延伸穿过其它层并进入所述通孔的导电插塞，以便提供 通过层的导电性，以及围绕所述其它层的至少一个所选层的所述导电插塞的绝缘外壳，用于使所述插塞与所述选定层中的材料绝缘。 它还涉及微电子和/或微机械装置，其包括设置在空腔上方的可动构件，使得其可在至少一个方向上移动。 该装置具有根据本发明的分层结构。 还提供了制造这种分层MEMS结构的方法。

公开(公告)号：US09448401B2

公开(公告)日：2016-09-20

申请号：US14073307

申请日：2013-11-06

Applicant: SILEX Microsystems AB

Inventor： Thorbjorn Ebefors ,  Edvard Kalvesten ,  Peter Agren ,  Niklas Svedin

IPC: G02B26/08 ,  B81B7/00 ,  H01L21/768 ,  H01L23/48 ,  G02B6/35

CPC classification number: G02B26/0833 ,  B81B7/0006 ,  B81B7/007 ,  B81B2207/092 ,  B81B2207/095 ,  G02B6/3518 ,  G02B6/3584 ,  G02B26/0841 ,  H01L21/76898 ,  H01L23/481 ,  H01L2924/0002 ,  H01L2924/00012 ,  H01L2924/00

Abstract: A layered micro-electronic and/or micro-mechanic structure comprises at least three alternating electrically conductive layers with insulating layers between the conductive layers. There is also provided a via in a first outer layer, said via comprising an insulated conductive connection made of wafer native material through the layer, an electrically conductive plug extending through the other layers and into said via in the first outer layer in order to provide conductivity through the layers, and an insulating enclosure surrounding said conductive plug in at least one selected layer of said other layers for insulating said plug from the material in said selected layer. It also relates to micro-electronic and/or micro-mechanic device comprising a movable member provided above a cavity such that it is movable in at least one direction. The device has a layered structure according to the invention. Methods of making such a layered MEMS structure is also provided.

Abstract translation: 分层微电子和/或微机械结构包括在导电层之间具有绝缘层的至少三个交替导电层。 还提供了在第一外层中的通孔，所述通孔包括由穿过该层的晶片天然材料制成的绝缘导电连接，在第一外层中延伸穿过其它层并进入所述通孔的导电插塞，以便提供 通过层的导电性，以及围绕所述其它层的至少一个所选层的所述导电插塞的绝缘外壳，用于使所述插塞与所述选定层中的材料绝缘。 它还涉及微电子和/或微机械装置，其包括设置在空腔上方的可动构件，使得其可在至少一个方向上移动。 该装置具有根据本发明的分层结构。 还提供了制造这种分层MEMS结构的方法。

公开(公告)号：US09718674B2

公开(公告)日：2017-08-01

申请号：US14914015

申请日：2014-08-26

Applicant: SILEX MICROSYSTEMS AB

Inventor： Edvard Kalvesten ,  Thorbjorn Ebefors ,  Niklas Svedin

IPC: H01L23/08 ,  B81B7/00 ,  H01L21/50 ,  B81C1/00 ,  H01L23/00

CPC classification number: B81B7/007 ,  B81B2201/01 ,  B81B2201/0264 ,  B81B2201/0271 ,  B81B2203/0118 ,  B81B2203/0127 ,  B81B2207/095 ,  B81C1/00301 ,  B81C2201/0153 ,  B81C2201/036 ,  B81C2203/0109 ,  B81C2203/0145 ,  H01L21/50 ,  H01L23/08 ,  H01L24/94 ,  H01L2924/16235

Abstract: A device includes a base substrate (700) with a micro component (702) attached thereto. Suitably it is provided with routing elements (704) for conducting signals to and from the component (702). It also includes spacer members (706) which also can act as conducting structures for routing signals vertically. There is a capping structure (708) of a glass material, provided above the base substrate (700), bonded via the spacer members (706), preferably by eutectic bonding, wherein the capping structure (708) includes vias (710) including metal for providing electrical connection through the capping structure. The vias can be made by a stamping/pressing method entailing pressing needles under heating to soften the glass and applying pressure, to a predetermined depth in the glass. However, other methods are possible, e-g- drilling, etching, blasting.

公开(公告)号：US09620390B2

公开(公告)日：2017-04-11

申请号：US14993714

申请日：2016-01-12

Applicant: Silex Microsystems AB

Inventor： Thorbjorn Ebefors ,  Edvard Kalvesten ,  Tomas Bauer

IPC: B81B7/00 ,  H01L23/04 ,  H01L23/498 ,  H01L23/64 ,  H01L23/66 ,  H01L21/50 ,  H01L21/683 ,  H01L23/552 ,  H01L23/58 ,  H01L21/78 ,  H01L21/768 ,  H01L23/10 ,  H01L23/48 ,  H01L23/00

CPC classification number: H01L21/50 ,  B81B7/007 ,  B81B2207/095 ,  B81C1/00301 ,  H01L21/6835 ,  H01L21/76898 ,  H01L21/78 ,  H01L23/04 ,  H01L23/10 ,  H01L23/481 ,  H01L23/49827 ,  H01L23/49838 ,  H01L23/552 ,  H01L23/585 ,  H01L23/642 ,  H01L23/645 ,  H01L23/66 ,  H01L24/03 ,  H01L24/05 ,  H01L24/11 ,  H01L24/13 ,  H01L24/16 ,  H01L24/27 ,  H01L24/29 ,  H01L24/30 ,  H01L24/32 ,  H01L24/33 ,  H01L24/81 ,  H01L24/83 ,  H01L2221/68363 ,  H01L2221/68372 ,  H01L2223/6616 ,  H01L2223/6622 ,  H01L2223/6655 ,  H01L2223/6677 ,  H01L2224/02311 ,  H01L2224/02313 ,  H01L2224/02371 ,  H01L2224/02372 ,  H01L2224/0239 ,  H01L2224/03462 ,  H01L2224/0401 ,  H01L2224/05073 ,  H01L2224/05155 ,  H01L2224/05548 ,  H01L2224/05573 ,  H01L2224/05644 ,  H01L2224/1146 ,  H01L2224/13009 ,  H01L2224/13024 ,  H01L2224/13083 ,  H01L2224/131 ,  H01L2224/13111 ,  H01L2224/13144 ,  H01L2224/13155 ,  H01L2224/29009 ,  H01L2224/29011 ,  H01L2224/29012 ,  H01L2224/29018 ,  H01L2224/29101 ,  H01L2224/29111 ,  H01L2224/29144 ,  H01L2224/30051 ,  H01L2224/3012 ,  H01L2224/81005 ,  H01L2224/81203 ,  H01L2224/81801 ,  H01L2224/83005 ,  H01L2224/83203 ,  H01L2224/83801 ,  H01L2224/83805 ,  H01L2924/01005 ,  H01L2924/01006 ,  H01L2924/01013 ,  H01L2924/01029 ,  H01L2924/01033 ,  H01L2924/0105 ,  H01L2924/01051 ,  H01L2924/01072 ,  H01L2924/01079 ,  H01L2924/0132 ,  H01L2924/01322 ,  H01L2924/014 ,  H01L2924/1461 ,  H01L2924/19041 ,  H01L2924/19042 ,  H01L2924/19043 ,  H01L2924/30105 ,  H01L2924/30107 ,  H01L2924/3011 ,  H01L2924/3025 ,  H01L2924/00 ,  H01L2924/01027 ,  H01L2924/01028 ,  H01L2924/3512

Abstract: A wafer level method of making a micro-electronic and/or micro-mechanic device, having a capping with electrical wafer through connections (vias), comprising the steps of providing a first wafer of a semiconductor material having a first and a second side and a plurality of holes and/or recesses in the first side, and a barrier structure extending over the wafer on the second side, said barrier comprising an inner layer an insulating material, such as oxide, and an outer layer of another material. Then, metal is applied in said holes so as to cover the walls in the holes and the bottom of the holes. The barrier structure is removed and contacts are provided to the wafer through connections on the back-side of the wafer. Bonding structures are provided on either of said first side or the second side of the wafer. The wafer is bonded to another wafer carrying electronic and micro-electronic/mechanic components, such that the first wafer forms a capping structure covering the second wafer. Finally the wafer is singulated to individual devices.