Methods and devices related to reduced packaging substrate deformation

    公开(公告)号:US11596056B2

    公开(公告)日:2023-02-28

    申请号:US16588884

    申请日:2019-09-30

    摘要: A packaging substrate can include a first surface and a second opposing surface, the first surface having a mounting region configured to receive electronic components, and electrical contacts formed on the second opposing surface. A saw street region can surround the mounting region and the electrical contacts, a metal layer and a solder mask layer being formed within the saw street region on the second opposing surface, and the solder mask layer being formed over the metal layer. An electronic module can include a packaging substrate including a first surface and a second opposing surface, the first surface including a mounting region. A plurality of electronic components can be mounted on the mounting region. A ground pad can be formed on the second opposing surface of the packaging substrate, the ground pad including a solder mask layer formed thereon, the solder mask layer having a plurality of openings.

    Methods related to dual-sided module with land-grid array (LGA) footprint

    公开(公告)号:US11139257B2

    公开(公告)日:2021-10-05

    申请号:US16699680

    申请日:2019-12-01

    摘要: According to certain aspects, a method for manufacturing packaged radio-frequency (RF) devices can include: providing a packaging substrate configured to receive a plurality of components, the packaging substrate including a first side and a second side; mounting a first circuit on the first side of the packaging substrate; implementing a first overmold structure on the first side of the packaging substrate, the first overmold structure substantially encapsulating the first component; mounting a second component on the second side of the packaging substrate, the second component being located in an area of the second side where redundant ground pins may be located; implementing a set of through-mold connections on the second side of the packaging substrate, the set of through-mold connections including signal pins and ground pins; forming a second overmold structure over the component and the set of through-mold connections; and removing a portion of the second overmold structure.