Thermal deformation management for chip carriers
    1.
    发明授权
    Thermal deformation management for chip carriers 有权
    芯片载体的热变形管理

    公开(公告)号:US06291776B1

    公开(公告)日:2001-09-18

    申请号:US09185425

    申请日:1998-11-03

    IPC分类号: H05K111

    摘要: A chip carrier constituted of an organic laminate which incorporates structure compensating for thermal deformation of the carrier. Moreover, disclosed is a method of counteracting the thermal deformations encountered by chip carriers, especially during solder reflow, which is predicated on the uniformly, equidistant positioning of metal-plated through-holes (PTH) formed in the chip carrier relative to contact pads. A plurality of plated through-holes (PTH) are positioned equidistantly relative to contact (BGA) pads on a surface of a substrate which is constituted of an organic laminate material, so as to be able to control both in-plane and out-of-plane thermal deformations in the chip carrier material which may be occasioned in a solder reflow furnace or oven.

    摘要翻译: 由有机层压板构成的芯片载体,其结合补偿载体热变形的结构。 此外,公开了一种抵消芯片载体遇到的热变形的方法,特别是在焊料回流期间,其基于形成在芯片载体中的金属镀通孔(PTH)相对于接触焊盘的均匀等距定位。 多个电镀通孔(PTH)相对于由有机层压材料构成的基板的表面上的接触(BGA)焊盘等距定位,以便能够同时控制平面内和外侧 可能在焊料回流炉或烘箱中发生的芯片载体材料中的平面热变形。