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公开(公告)号:US09036956B2
公开(公告)日:2015-05-19
申请号:US13399098
申请日:2012-02-17
申请人: Chun-Hao Tseng , Wan-Yu Lee , Hai-Ching Chen , Tien-I Bao
发明人: Chun-Hao Tseng , Wan-Yu Lee , Hai-Ching Chen , Tien-I Bao
CPC分类号: G02B6/12004 , G02B6/0083 , G02B6/132 , G02B6/136 , G02B6/138 , G02B6/4214 , G02B2006/12061 , G02B2006/12104 , G02B2006/12121 , G02B2006/12176
摘要: A method of fabricating a waveguide device is disclosed. The method includes providing a substrate having an elector-interconnection region and a waveguide region and forming a patterned dielectric layer and a patterned redistribution layer (RDL) over the substrate in the electro-interconnection region. The method also includes bonding the patterned RDL to a vertical-cavity surface-emitting laser (VCSEL) through a bonding stack. A reflecting-mirror trench is formed in the substrate in the waveguide region, and a reflecting layer is formed over a reflecting-mirror region inside the waveguide region. The method further includes forming and patterning a bottom cladding layer in a wave-tunnel region inside the waveguide region and forming and patterning a core layer and a top cladding layer in the waveguide region.
摘要翻译: 公开了一种制造波导器件的方法。 该方法包括提供具有选通互连区域和波导区域的衬底,并且在电互连区域中的衬底上形成图案化电介质层和图案化再分配层(RDL)。 该方法还包括通过结合堆叠将图案化的RDL结合到垂直腔表面发射激光器(VCSEL)。 在波导区域的基板上形成反射镜沟槽,反射层形成在波导区域内的反射镜区域的上方。 该方法还包括在波导区域内的波通道区域中形成和图案化底包层,并且在波导区域中形成和图案化芯层和顶包层。
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公开(公告)号:US20130216177A1
公开(公告)日:2013-08-22
申请号:US13399098
申请日:2012-02-17
申请人: Chun-Hao Tseng , Wan-Yu Lee , Hai-Ching Chen , Tien-I Bao
发明人: Chun-Hao Tseng , Wan-Yu Lee , Hai-Ching Chen , Tien-I Bao
CPC分类号: G02B6/12004 , G02B6/0083 , G02B6/132 , G02B6/136 , G02B6/138 , G02B6/4214 , G02B2006/12061 , G02B2006/12104 , G02B2006/12121 , G02B2006/12176
摘要: A method of fabricating a waveguide device is disclosed. The method includes providing a substrate having an elector-interconnection region and a waveguide region and forming a patterned dielectric layer and a patterned redistribution layer (RDL) over the substrate in the electro-interconnection region. The method also includes bonding the patterned RDL to a vertical-cavity surface-emitting laser (VCSEL) through a bonding stack. A reflecting-mirror trench is formed in the substrate in the waveguide region, and a reflecting layer is formed over a reflecting-mirror region inside the waveguide region. The method further includes forming and patterning a bottom cladding layer in a wave-tunnel region inside the waveguide region and forming and patterning a core layer and a top cladding layer in the waveguide region.
摘要翻译: 公开了一种制造波导器件的方法。 该方法包括提供具有选通互连区域和波导区域的衬底,并且在电互连区域中的衬底上形成图案化电介质层和图案化再分配层(RDL)。 该方法还包括通过结合堆叠将图案化的RDL结合到垂直腔表面发射激光器(VCSEL)。 在波导区域的基板上形成反射镜沟槽,反射层形成在波导区域内的反射镜区域的上方。 该方法还包括在波导区域内的波通道区域中形成和图案化底包层,并且在波导区域中形成和图案化芯层和顶包层。
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公开(公告)号:US10180547B2
公开(公告)日:2019-01-15
申请号:US13403566
申请日:2012-02-23
申请人: Wan-Yu Lee , Chun-Hao Tseng , Hai-Ching Chen , Tien-I Bao
发明人: Wan-Yu Lee , Chun-Hao Tseng , Hai-Ching Chen , Tien-I Bao
摘要: An optical bench on substrate includes a substrate and a trench formed inside the substrate and having a sloping side. A reflector layer is formed over the sloping side. An optical component is mounted over the substrate. The reflector layer is configured to reflect an electromagnetic wave to or from the optical component.
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公开(公告)号:US08736014B2
公开(公告)日:2014-05-27
申请号:US12271617
申请日:2008-11-14
申请人: Bo-Jiun Lin , Ching-Yu Lo , Hai-Ching Chen , Tien-I Bao , Chen-Hua Yu
发明人: Bo-Jiun Lin , Ching-Yu Lo , Hai-Ching Chen , Tien-I Bao , Chen-Hua Yu
IPC分类号: H01L21/31
CPC分类号: H01L21/3121 , C23C18/1212 , C23C18/122 , C23C18/1254 , H01L21/02126 , H01L21/02203 , H01L21/02216 , H01L21/02282 , H01L21/02304
摘要: A semiconductor device and method for making such that provides improved mechanical strength is disclosed. The semiconductor device comprises a semiconductor substrate; an adhesion layer disposed over the semiconductor substrate; and a porous low-k film disposed over the semiconductor substrate, wherein the porous low-k film comprises a porogen and a composite bonding structure including at least one Si—O—Si bonding group and at least one bridging organic functional group.
摘要翻译: 公开了一种提供改进的机械强度的半导体器件和制造方法。 半导体器件包括半导体衬底; 设置在半导体衬底上的粘附层; 以及设置在所述半导体衬底上的多孔低k膜,其中所述多孔低k膜包含致孔剂和包含至少一个Si-O-Si键合基团和至少一个桥连有机官能团的复合键合结构。
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公开(公告)号:US08735278B2
公开(公告)日:2014-05-27
申请号:US13550951
申请日:2012-07-17
申请人: Ming Han Lee , Hai-Ching Chen , Hsiang-Huan Lee , Tien-I Bao , Chi-Lin Teng
发明人: Ming Han Lee , Hai-Ching Chen , Hsiang-Huan Lee , Tien-I Bao , Chi-Lin Teng
IPC分类号: H01L21/4763
CPC分类号: H01L23/53238 , H01L21/76834 , H01L21/76867 , H01L21/76885 , H01L21/76897 , H01L2924/0002 , H01L2924/00
摘要: The present disclosure is directed to a method of manufacturing an interconnect structure in which a low-k dielectric layer is formed over a semiconductor substrate followed by formation of a copper or copper alloy layer over the low-k dielectric layer. The copper or copper alloy layer is patterned and etched to form a copper body having recesses, which are then filled with a low-k dielectric material. The method allows for formation of a damascene structures without encountering the various problems presented by non-planar features and by porus low-K dielectric damage.
摘要翻译: 本公开涉及一种制造互连结构的方法,其中在半导体衬底上形成低k电介质层,然后在低k电介质层上形成铜或铜合金层。 铜或铜合金层被图案化和蚀刻以形成具有凹部的铜体,然后填充有低k电介质材料。 该方法允许形成镶嵌结构,而不会遇到由非平面特征和孔隙低K电介质损伤所呈现的各种问题。
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公开(公告)号:US08264066B2
公开(公告)日:2012-09-11
申请号:US12617900
申请日:2009-11-13
申请人: Ching-Yu Lo , Hung-Jung Tu , Hai-Ching Chen , Tien-I Bao , Wen-Chih Chiou , Chen-Hua Yu
发明人: Ching-Yu Lo , Hung-Jung Tu , Hai-Ching Chen , Tien-I Bao , Wen-Chih Chiou , Chen-Hua Yu
IPC分类号: H01L29/40
CPC分类号: H01L21/6835 , H01L21/76898 , H01L23/481 , H01L24/02 , H01L2221/68372 , H01L2224/0557 , H01L2924/00014 , H01L2924/0002 , H01L2924/01019 , H01L2924/04941 , H01L2924/12042 , H01L2924/14 , H01L2924/19041 , H01L2924/19043 , H01L2224/05552 , H01L2924/00
摘要: An integrated circuit structure includes a semiconductor substrate; a through-semiconductor via (TSV) opening extending into the semiconductor substrate; and a TSV liner in the TSV opening. The TSV liner includes a sidewall portion on a sidewall of the TSV opening and a bottom portion at a bottom of the TSV opening. The bottom portion of the TSV liner has a bottom height greater than a middle thickness of the sidewall portion of the TSV liner.
摘要翻译: 集成电路结构包括半导体衬底; 贯穿半导体衬底的贯通半导体通孔(TSV)开口; 和TSV开口的TSV衬管。 TSV衬套包括在TSV开口的侧壁上的侧壁部分和TSV开口底部的底部。 TSV衬管的底部部分的底部高度大于TSV衬套的侧壁部分的中间厚度。
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公开(公告)号:US08836127B2
公开(公告)日:2014-09-16
申请号:US12621569
申请日:2009-11-19
申请人: Ching-Yu Lo , Bo-Jiun Lin , Hai-Ching Chen , Tien-I Bao , Shau-Lin Shue , Chen-Hua Yu
发明人: Ching-Yu Lo , Bo-Jiun Lin , Hai-Ching Chen , Tien-I Bao , Shau-Lin Shue , Chen-Hua Yu
IPC分类号: H01L23/522 , H01L23/532 , H01L23/00
CPC分类号: H01L23/53295 , H01L23/5329 , H01L24/02 , H01L2924/01006 , H01L2924/01007 , H01L2924/01013 , H01L2924/01014 , H01L2924/01015 , H01L2924/01019 , H01L2924/0102 , H01L2924/01023 , H01L2924/01029 , H01L2924/01033 , H01L2924/0105 , H01L2924/01079 , H01L2924/01082 , H01L2924/014 , H01L2924/05042 , H01L2924/14 , H01L2924/15788 , H01L2924/351 , H01L2924/00
摘要: An integrated circuit device has a dual damascene structure including a lower via portion and an upper line portion. The lower via portion is formed in a polyimide layer, and the upper line portion is formed in an inter-metal dielectric (IMD) layer formed of USG or polyimide. A passivation layer is formed on the IMD layer, and a bond pad is formed overlying the passivation layer to electrically connect the upper line portion.
摘要翻译: 集成电路装置具有双镶嵌结构,其包括下通孔部分和上线部分。 下通孔部分形成在聚酰亚胺层中,并且上部分部分形成在由USG或聚酰亚胺形成的金属间电介质(IMD)层中。 在IMD层上形成钝化层,并且形成覆盖钝化层的接合焊盘以电连接上部线部分。
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公开(公告)号:US20120074535A1
公开(公告)日:2012-03-29
申请号:US12893374
申请日:2010-09-29
申请人: Hsin-Yen Huang , Ching-Yu Lo , Hai-Ching Chen , Tien-I Bao
发明人: Hsin-Yen Huang , Ching-Yu Lo , Hai-Ching Chen , Tien-I Bao
IPC分类号: H01L29/06 , H01L21/31 , C09D183/06
CPC分类号: H01L21/02203 , C08G77/50 , C09D183/14 , C23C16/30 , C23C18/122 , C23C18/1254 , H01L21/02126 , H01L21/02216 , H01L21/02274 , H01L21/02282 , H01L2924/0002 , H01L2924/00
摘要: The present disclosure provides a dielectric material including a low dielectric constant material and an additive. The additive includes a compound having a Si—X—Si bridge, where X is a number of carbon atoms between 1 and 8. The additive may include terminal Si—CH3 groups. The dielectric material including the additive may be used as an inter-layer dielectric (ILD) layer of a semiconductor device. The dielectric material including the additive may be formed using a CVD or sol-gel process. One example of the additive is bis(triethoxysilyl)ethene.
摘要翻译: 本公开提供了包括低介电常数材料和添加剂的介电材料。 添加剂包括具有Si-X-Si桥的化合物,其中X是1至8之间的碳原子数。该添加剂可以包括末端Si-CH 3基团。 包括添加剂的电介质材料可以用作半导体器件的层间电介质(ILD)层。 可以使用CVD或溶胶 - 凝胶法形成包括添加剂的电介质材料。 添加剂的一个实例是双(三乙氧基甲硅烷基)乙烯。
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公开(公告)号:US20110115088A1
公开(公告)日:2011-05-19
申请号:US12621569
申请日:2009-11-19
申请人: Ching-Yu Lo , Bo-Jiun Lin , Hai-Ching Chen , Tien-I Bao , Shau-Lin Shue , Chen-Hua Yu
发明人: Ching-Yu Lo , Bo-Jiun Lin , Hai-Ching Chen , Tien-I Bao , Shau-Lin Shue , Chen-Hua Yu
IPC分类号: H01L23/48
CPC分类号: H01L23/53295 , H01L23/5329 , H01L24/02 , H01L2924/01006 , H01L2924/01007 , H01L2924/01013 , H01L2924/01014 , H01L2924/01015 , H01L2924/01019 , H01L2924/0102 , H01L2924/01023 , H01L2924/01029 , H01L2924/01033 , H01L2924/0105 , H01L2924/01079 , H01L2924/01082 , H01L2924/014 , H01L2924/05042 , H01L2924/14 , H01L2924/15788 , H01L2924/351 , H01L2924/00
摘要: An integrated circuit device has a dual damascene structure including a lower via portion and an upper line portion. The lower via portion is formed in a polyimide layer, and the upper line portion is formed in an inter-metal dielectric (IMD) layer formed of USG or polyimide. A passivation layer is formed on the IMD layer, and a bond pad is formed overlying the passivation layer to electrically connect the upper line portion.
摘要翻译: 集成电路装置具有双镶嵌结构,其包括下通孔部分和上线部分。 下通孔部分形成在聚酰亚胺层中,并且上部分部分形成在由USG或聚酰亚胺形成的金属间电介质(IMD)层中。 在IMD层上形成钝化层,并且形成覆盖钝化层的接合焊盘以电连接上部线部分。
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公开(公告)号:US07682963B2
公开(公告)日:2010-03-23
申请号:US11867308
申请日:2007-10-04
申请人: Hai-Ching Chen , Sunil Kumar Singh , Tien-I Bao , Shau-Lin Shue , Chen-Hua Yu
发明人: Hai-Ching Chen , Sunil Kumar Singh , Tien-I Bao , Shau-Lin Shue , Chen-Hua Yu
IPC分类号: H01L21/4763
CPC分类号: H01L23/5222 , H01L21/7682 , H01L23/53252 , H01L2924/0002 , H01L2924/00
摘要: The present disclosure provides a method for fabricating an integrated circuit. The method includes forming an energy removable film (ERF) on a substrate; forming a first dielectric layer on the ERF; patterning the ERF and first dielectric layer to form a trench in the ERF and the first dielectric layer; filling a conductive material in the trench; forming a ceiling layer on the first dielectric layer and conductive material filled in the trench; and applying energy to the ERF to form air gaps in the ERF after the forming of the ceiling layer.
摘要翻译: 本公开提供了一种用于制造集成电路的方法。 该方法包括在基板上形成能量可去除膜(ERF); 在ERF上形成第一介电层; 图案化ERF和第一介电层以在ERF和第一介电层中形成沟槽; 在沟槽中填充导电材料; 在第一介电层上形成顶层和填充在沟槽中的导电材料; 并且在形成天花板层之后,向ERF施加能量以在ERF中形成气隙。
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