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1.发明授权Method and apparatus for screening combinatorial libraries of semiconducting properties 有权用于筛选半导体性质组合文库的方法和装置公开(公告)号：US07242000B2
公开(公告)日：2007-07-10
申请号：US10392238
申请日：2003-03-18
IPC分类号： G01J5/02
CPC分类号： G01N21/55 , B01D15/265 , B01D15/325 , B01D15/34 , B01J19/0046 , B01J19/26 , B01J2219/00274 , B01J2219/00283 , B01J2219/00308 , B01J2219/0031 , B01J2219/00313 , B01J2219/00315 , B01J2219/00317 , B01J2219/00335 , B01J2219/00337 , B01J2219/00344 , B01J2219/00351 , B01J2219/00364 , B01J2219/00378 , B01J2219/0043 , B01J2219/00443 , B01J2219/00452 , B01J2219/00495 , B01J2219/00497 , B01J2219/005 , B01J2219/00511 , B01J2219/00515 , B01J2219/0052 , B01J2219/00527 , B01J2219/00536 , B01J2219/00583 , B01J2219/00585 , B01J2219/00587 , B01J2219/0059 , B01J2219/00596 , B01J2219/00605 , B01J2219/00653 , B01J2219/00659 , B01J2219/00675 , B01J2219/00689 , B01J2219/00691 , B01J2219/00702 , B01J2219/00704 , B01J2219/00707 , B01J2219/00722 , B01J2219/00738 , B01J2219/00745 , B01J2219/00747 , B01J2219/0075 , B01J2219/00752 , B01J2219/00754 , B82Y30/00 , C40B30/08 , C40B40/00 , C40B40/14 , C40B40/18 , C40B50/14 , C40B60/12 , C40B60/14 , G01J3/28 , G01N15/0205 , G01N21/3563 , G01N21/8422 , G01N29/036 , G01N29/0609 , G01N29/2418 , G01N29/348 , G01N33/44 , G01N35/085 , G01N2015/0288 , G01N2015/0294 , G01N2021/3595 , G01N2291/106
摘要： This invention discloses methods, materials, and devices for making and screening combinatorial libraries to identify semi-conducting and thermoelectric materials. The disclosed method includes preparing a combinatorial library of materials, and identifying library members that are semiconductors. The method may include determining a thermoelectric figure of merit, ZT, for each member of a second combinatorial library of materials. The method determines ZT by applying an oscillatory voltage across the library members, measuring power dissipated by library members, and calculating ZT from the power dissipated. The method may also include isolating single-phase materials of the semiconducting library members. The present invention also discloses an apparatus for discovering thermoelectric materials using combinatorial techniques. The apparatus includes a first combinatorial library of materials comprised of thin films arrayed on a substrate, and a device for identifying semiconducting members of the first combinatorial library. In addition, the apparatus may include a device for measuring ZT—a voltage source for applying an oscillatory electrical potential across members of a second combinatorial library arrayed on a substrate, and a device for measuring the resulting power dissipated by library members. The apparatus may also include a device for isolating single-phase materials of library members that were identified as semiconductors.
摘要翻译： 本发明公开了用于制作和筛选组合文库以识别半导体和热电材料的方法，材料和装置。 所公开的方法包括制备材料的组合文库，以及识别作为半导体的文库成员。 该方法可以包括确定材料的第二组合库的每个构件的热电特性值ZT。 该方法通过在库构件上施加振荡电压来确定ZT，测量库构件消耗的功率，以及从功率消耗计算ZT。 该方法还可以包括隔离半导体文库成员的单相材料。 本发明还公开了一种使用组合技术发现热电材料的装置。 该装置包括由衬底上排列的薄膜组成的材料的第一组合库，以及用于识别第一组合库的半导电构件的装置。 此外，该装置可以包括用于测量ZT的装置，用于在排列在衬底上的第二组合库的构件上施加振荡电位的电压源，以及用于测量由库构件消散的所得功率的装置。 该装置还可以包括用于隔离被识别为半导体的库成员的单相材料的装置。
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公开(公告)号：US06738529B1
公开(公告)日：2004-05-18
申请号：US09415772
申请日：1999-10-08
IPC分类号： G06K936
CPC分类号： G01N35/085 , B01J19/0046 , B01J19/26 , B01J2219/00274 , B01J2219/00283 , B01J2219/00308 , B01J2219/0031 , B01J2219/00313 , B01J2219/00315 , B01J2219/00317 , B01J2219/00335 , B01J2219/00337 , B01J2219/00344 , B01J2219/00351 , B01J2219/00364 , B01J2219/00378 , B01J2219/0043 , B01J2219/00443 , B01J2219/00452 , B01J2219/00495 , B01J2219/00497 , B01J2219/005 , B01J2219/00511 , B01J2219/00515 , B01J2219/0052 , B01J2219/00527 , B01J2219/00536 , B01J2219/00583 , B01J2219/00585 , B01J2219/00587 , B01J2219/0059 , B01J2219/00596 , B01J2219/00605 , B01J2219/0061 , B01J2219/00612 , B01J2219/00659 , B01J2219/00675 , B01J2219/00689 , B01J2219/00691 , B01J2219/00702 , B01J2219/00704 , B01J2219/00707 , B01J2219/00722 , B01J2219/00738 , B01J2219/00745 , B01J2219/00747 , B01J2219/0075 , B01J2219/00754 , B82Y30/00 , C07F15/0066 , C07F15/045 , C40B30/08 , C40B40/14 , C40B40/18 , C40B50/14 , G01J4/00 , G01N15/0205 , G01N21/253 , G01N21/64 , G01N29/036 , G01N29/2425 , G01N29/348 , G01N29/4427 , G01N33/44 , G01N2015/0288 , G01N2015/0294 , G01N2291/106 , Y10T436/112499 , Y10T436/113332 , Y10T436/115831
摘要： Computer programs and computer-implemented methods are disclosed for extracting and analyzing combinatorial chemical data from images. The invention receives a stream of data, identifies a plurality of regions of interest and determines a series of values for one or more regions of interest. The library includes a plurality of members. The data stream includes a series of images of the library. Each region of interest corresponds to a location in each of the images and to a location in the library. The series of values for each region includes a value for each of the images. Particular embodiments have the following features. The invention calculates a figure of merit for a library member from each series of values. The stream of data comprises a series of images generated at a frequency of greater than about 1, 6, 12 or 30 frames per second. The series of images is captured from a beginning of a combinatorial experiment to an end of a commercial experiment. The regions of interest are identified after the series of images has been captured. The images are infrared images. The figure of merit is an emittance change, a phase transition point or a thermoelectric figure of merit for a library member. Regions of interest are identified by a user and have a user-defined shape. The series of values for each region is determined based on a user-defined computation. A graphical representation of the figures of merit is displayed.
摘要翻译： 公开了用于从图像中提取和分析组合化学数据的计算机程序和计算机实现的方法。 本发明接收数据流，识别多个感兴趣区域并确定一个或多个感兴趣区域的一系列值。 图书馆包括多个成员。 数据流包括图书馆的一系列图像。 每个感兴趣区域对应于每个图像中的位置和库中的位置。 每个区域的一系列值包括每个图像的值。 具体实施例具有以下特征。 本发明根据每一系列值计算库成员的品质因数。 数据流包括以大于每秒大约1,6,12或30帧的频率生成的一系列图像。 从组合实验的开始到商业实验的结束捕获一系列图像。 在捕获一系列图像之后识别感兴趣的区域。 图像是红外图像。 品质因数是库成员的发射变化，相变点或热电优值。 感兴趣区域由用户识别并具有用户定义的形状。 基于用户定义的计算来确定每个区域的一系列值。 显示品质因数的图形表示。
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公开(公告)号：US07076115B2
公开(公告)日：2006-07-11
申请号：US10803115
申请日：2004-03-16
IPC分类号： G06K9/36
CPC分类号： G01N35/085 , B01J19/0046 , B01J19/26 , B01J2219/00274 , B01J2219/00283 , B01J2219/00308 , B01J2219/0031 , B01J2219/00313 , B01J2219/00315 , B01J2219/00317 , B01J2219/00335 , B01J2219/00337 , B01J2219/00344 , B01J2219/00351 , B01J2219/00364 , B01J2219/00378 , B01J2219/0043 , B01J2219/00443 , B01J2219/00452 , B01J2219/00495 , B01J2219/00497 , B01J2219/005 , B01J2219/00511 , B01J2219/00515 , B01J2219/0052 , B01J2219/00527 , B01J2219/00536 , B01J2219/00583 , B01J2219/00585 , B01J2219/00587 , B01J2219/0059 , B01J2219/00596 , B01J2219/00605 , B01J2219/0061 , B01J2219/00612 , B01J2219/00659 , B01J2219/00675 , B01J2219/00689 , B01J2219/00691 , B01J2219/00702 , B01J2219/00704 , B01J2219/00707 , B01J2219/00722 , B01J2219/00738 , B01J2219/00745 , B01J2219/00747 , B01J2219/0075 , B01J2219/00754 , B82Y30/00 , C07F15/0066 , C07F15/045 , C40B30/08 , C40B40/14 , C40B40/18 , C40B50/14 , G01J4/00 , G01N15/0205 , G01N21/253 , G01N21/64 , G01N29/036 , G01N29/2425 , G01N29/348 , G01N29/4427 , G01N33/44 , G01N2015/0288 , G01N2015/0294 , G01N2291/106 , Y10T436/112499 , Y10T436/113332 , Y10T436/115831
摘要： Computer programs and computer-implemented methods implement techniques for evaluating experimental data from a library of materials. The techniques receive a plurality of images of a library of materials that includes an array of members associated with locations in the library. User input identifying a plurality of regions of interest is received. A series of reduced data values is determined for one or more of the regions of interest as a statistical function of a plurality of pixel values for pixels in the corresponding regions. A figure of merit is calculated from one or more of the series of reduced data values for a library member at the corresponding library location. The regions of interest include a plurality of pixels in the images and correspond to locations in the library.
摘要翻译： 计算机程序和计算机实现的方法实施用于从材料库评估实验数据的技术。 这些技术接收包括与库中的位置相关联的成员阵列的材料库的多个图像。 接收识别感兴趣区域的用户输入。 为一个或多个感兴趣区域确定一系列缩减数据值作为对应区域中的像素的多个像素值的统计函数。 从相应库位置的库成员的一系列缩减数据值中计算一个品质因数。 感兴趣的区域包括图像中的多个像素并且对应于库中的位置。
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4.发明授权Method and apparatus for screening combinatorial libraries for semiconducting properties 有权用于筛选半导体性质的组合文库的方法和装置公开(公告)号：US06576906B1
公开(公告)日：2003-06-10
申请号：US09414615
申请日：1999-10-08
IPC分类号： G01J502
CPC分类号： G01N21/55 , B01D15/265 , B01D15/325 , B01D15/34 , B01J19/0046 , B01J19/26 , B01J2219/00274 , B01J2219/00283 , B01J2219/00308 , B01J2219/0031 , B01J2219/00313 , B01J2219/00315 , B01J2219/00317 , B01J2219/00335 , B01J2219/00337 , B01J2219/00344 , B01J2219/00351 , B01J2219/00364 , B01J2219/00378 , B01J2219/0043 , B01J2219/00443 , B01J2219/00452 , B01J2219/00495 , B01J2219/00497 , B01J2219/005 , B01J2219/00511 , B01J2219/00515 , B01J2219/0052 , B01J2219/00527 , B01J2219/00536 , B01J2219/00583 , B01J2219/00585 , B01J2219/00587 , B01J2219/0059 , B01J2219/00596 , B01J2219/00605 , B01J2219/00653 , B01J2219/00659 , B01J2219/00675 , B01J2219/00689 , B01J2219/00691 , B01J2219/00702 , B01J2219/00704 , B01J2219/00707 , B01J2219/00722 , B01J2219/00738 , B01J2219/00745 , B01J2219/00747 , B01J2219/0075 , B01J2219/00752 , B01J2219/00754 , B82Y30/00 , C40B30/08 , C40B40/00 , C40B40/14 , C40B40/18 , C40B50/14 , C40B60/12 , C40B60/14 , G01J3/28 , G01N15/0205 , G01N21/3563 , G01N21/8422 , G01N29/036 , G01N29/0609 , G01N29/2418 , G01N29/348 , G01N33/44 , G01N35/085 , G01N2015/0288 , G01N2015/0294 , G01N2021/3595 , G01N2291/106
摘要： This invention discloses methods, materials, and devices for making and screening combinatorial libraries to identify semi-conducting and thermoelectric materials. The disclosed method includes preparing a combinatorial library of materials, and identifying library members that are semiconductors. The method may include determining a thermoelectric figure of merit, ZT, for each member of a second combinatorial library of materials. The method determines ZT by applying an oscillatory voltage across the library members, measuring power dissipated by library members, and calculating ZT from the power dissipated. The method may also include isolating single-phase materials of the semiconducting library members. The present invention also discloses an apparatus for discovering thermoelectric materials using combinatorial techniques. The apparatus includes a first combinatorial library of materials comprised of thin films arrayed on a substrate, and a device for identifying semiconducting members of the first combinatorial library. In addition, the apparatus may include a device for measuring ZT—a voltage source for applying an oscillatory electrical potential across members of a second combinatorial library arrayed on a substrate, and a device for measuring the resulting power dissipated by library members. The apparatus may also include a device for isolating single-phase materials of library members that were identified as semiconductors.
摘要翻译： 本发明公开了用于制作和筛选组合文库以识别半导体和热电材料的方法，材料和装置。 所公开的方法包括制备材料的组合文库，以及识别作为半导体的文库成员。 该方法可以包括确定材料的第二组合库的每个构件的热电特性值ZT。 该方法通过在库构件上施加振荡电压来确定ZT，测量库构件消耗的功率，以及从功率消耗计算ZT。 该方法还可以包括隔离半导体文库成员的单相材料。 本发明还公开了一种使用组合技术发现热电材料的装置。 该装置包括由衬底上排列的薄膜组成的材料的第一组合库，以及用于识别第一组合库的半导电构件的装置。 此外，该装置可以包括用于测量ZT的装置，用于在排列在衬底上的第二组合库的构件上施加振荡电位的电压源，以及用于测量由库构件消散的所得功率的装置。 该装置还可以包括用于隔离被识别为半导体的库成员的单相材料的装置。
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公开(公告)号：US07033542B2
公开(公告)日：2006-04-25
申请号：US10366464
申请日：2003-02-14
CPC分类号： B01L3/5085 , B01J2219/00313 , B01J2219/00702 , B01L2300/0654 , B01L2300/0819 , B01L2300/0851 , B01L2300/12 , C40B60/14 , G01N21/0303 , G01N21/21 , G01N21/253 , G01N21/274 , G01N21/33 , G01N21/3577 , G01N21/3581 , G01N21/359 , G01N21/552 , G01N21/648 , G01N21/76 , G01N21/7703
摘要： Rapid spectrum assay of multiple samples with infrared light is made possible by devices and methods that increase total light throughput. Multiple wavelength scan with Fourier analysis is combined with large numbers of sample wells located within infrared light compatible solid materials. In particular, very large scale measurement devices and systems for their use are fabricated from lithography and other techniques used for semiconductor processing.
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公开(公告)号：US06536944B1
公开(公告)日：2003-03-25
申请号：US09414744
申请日：1999-10-08
IPC分类号： G01N2504
CPC分类号： G01N30/88 , B01D15/26 , B01D15/265 , B01D15/325 , B01D15/34 , B01J19/0046 , B01J19/26 , B01J2219/00274 , B01J2219/00283 , B01J2219/00308 , B01J2219/0031 , B01J2219/00313 , B01J2219/00315 , B01J2219/00317 , B01J2219/00335 , B01J2219/00337 , B01J2219/00344 , B01J2219/00351 , B01J2219/00364 , B01J2219/00378 , B01J2219/0043 , B01J2219/00443 , B01J2219/00452 , B01J2219/00495 , B01J2219/00497 , B01J2219/005 , B01J2219/00511 , B01J2219/00515 , B01J2219/0052 , B01J2219/00527 , B01J2219/00536 , B01J2219/00583 , B01J2219/00585 , B01J2219/00587 , B01J2219/0059 , B01J2219/00596 , B01J2219/00605 , B01J2219/0061 , B01J2219/00612 , B01J2219/00659 , B01J2219/00675 , B01J2219/00689 , B01J2219/00691 , B01J2219/00702 , B01J2219/00704 , B01J2219/00707 , B01J2219/00722 , B01J2219/00738 , B01J2219/00745 , B01J2219/00747 , B01J2219/0075 , B01J2219/00754 , B82Y30/00 , C07F15/0066 , C07F15/045 , C08F10/00 , C40B30/08 , C40B40/14 , C40B40/18 , C40B50/14 , G01J4/00 , G01N15/0205 , G01N21/64 , G01N29/036 , G01N29/2418 , G01N29/2425 , G01N29/348 , G01N29/4427 , G01N30/02 , G01N30/16 , G01N30/24 , G01N30/30 , G01N30/461 , G01N30/466 , G01N30/54 , G01N30/60 , G01N30/6052 , G01N33/44 , G01N35/085 , G01N35/1097 , G01N2015/0288 , G01N2015/0294 , G01N2030/324 , G01N2030/885 , G01N2030/8886 , G01N2291/106 , Y10T436/25875 , C08F4/70
摘要： A method and apparatus for high-throughput determination of phase change points of combinatorial libraries of metal alloys uses an infrared camera to monitor temperature-dependent changes in emissivity/reflectivity of the alloys. An infrared focal plane array monitors the emissivity/reflectivity changes over time, and the intensity of each heated member over time is correlated with temperature to detect the phase change points of the members.
摘要翻译： 用于高通量确定金属合金组合库的相变点的方法和装置使用红外相机来监测合金的发射率/反射率的温度依赖性变化。 红外焦平面阵列监测随时间的发射率/反射率变化，并且随着时间的推移，每个加热构件的强度与温度相关联以检测构件的相变点。
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