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公开(公告)号:US11837294B2
公开(公告)日:2023-12-05
申请号:US17735196
申请日:2022-05-03
Applicant: KIOXIA CORPORATION
Inventor: Noboru Shibata , Hironori Uchikawa
CPC classification number: G11C16/26 , G11C7/08 , G11C8/14 , G11C16/0483 , G11C16/08 , G11C16/10 , H10B43/27 , H10B43/35 , G11C2207/2245
Abstract: According to one embodiment, a semiconductor memory includes a first memory cell array including a plurality of first memory cells; and a second memory cell array including a plurality of second memory cells. Each of threshold voltages of the first memory cells and the second memory cells is set to any of a first threshold voltage, a second threshold voltage higher than the first threshold voltage, and a third threshold voltage higher than the second threshold voltage. Data of three or more bits including a first bit, a second bit, and a third bit is stored using a combination of a threshold voltage of the first memory cell and a threshold voltage of the second memory cell.
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公开(公告)号:US11768732B2
公开(公告)日:2023-09-26
申请号:US17530748
申请日:2021-11-19
Applicant: KIOXIA CORPORATION
Inventor: Yuta Kumano , Hironori Uchikawa , Kosuke Morinaga , Naoaki Kokubun , Masahiro Kiyooka , Yoshiki Notani , Kenji Sakurada , Daiki Watanabe
IPC: G11C29/00 , G06F11/10 , G11C11/56 , H03M13/00 , H03M13/37 , G11C29/52 , H03M13/11 , G11C29/04 , G11C16/26 , G11C29/42
CPC classification number: G06F11/1048 , G06F11/1012 , G06F11/1044 , G06F11/1068 , G11C11/5642 , G11C29/52 , H03M13/3715 , H03M13/3746 , H03M13/6325 , G11C16/26 , G11C29/42 , G11C2029/0409 , G11C2029/0411 , H03M13/1108 , H03M13/1111
Abstract: According to one embodiment, a memory system includes a non-volatile memory, a memory interface that reads data recorded in the non-volatile memory as a received value, a converting unit that converts the received value to first likelihood information by using a first conversion table, a decoder that decodes the first likelihood information, a control unit that outputs an estimated value with respect to the received value, which is a decoding result obtained by the decoding, when decoding by the decoder has succeeded, and a generating unit that generates a second conversion table based on a decoding result obtained by the decoding, when decoding of the first likelihood information by the decoder has failed. When the generating unit generates the second conversion table, the converting unit converts the received value to the second likelihood information by using the second conversion table, and the decoder decodes the second likelihood information.
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公开(公告)号:US11575395B2
公开(公告)日:2023-02-07
申请号:US17317280
申请日:2021-05-11
Applicant: Kioxia Corporation
Inventor: Shinichi Kanno , Hironori Uchikawa
Abstract: A semiconductor memory device includes a plurality of detecting code generators configured to generate a plurality of detecting codes to detect errors in a plurality of data items, respectively, a plurality of first correcting code generators configured to generate a plurality of first correcting codes to correct errors in a plurality of first data blocks, respectively, each of the first data blocks containing one of the data items and a corresponding detecting code, a second correcting code generators configured to generate a second correcting code to correct errors in a second data block, the second data block containing the first data blocks, and a semiconductor memory configured to nonvolatilely store the second data block, the first correcting codes, and the second correcting code.
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公开(公告)号:US11309918B2
公开(公告)日:2022-04-19
申请号:US17005282
申请日:2020-08-27
Applicant: KIOXIA CORPORATION
Inventor: Yuta Kumano , Hironori Uchikawa
Abstract: A memory system includes a nonvolatile memory and a memory controller. The nonvolatile memory stores a multidimensional error correction code in which each of a plurality of symbol groups is encoded by both a first component code and a second component code. The memory controller reads the error correction code from the nonvolatile memory, executes a first decoding process using the first component code and the second component code, and when the first decoding process fails, executes a second decoding process on an error symbol group. The second decoding process includes a process of selecting the positions of a plurality of symbols whose values included in the error symbol group are to be inverted according to a decision rule. The decision rule includes a rule for cyclically shifting a position selected for the second decoding process at to decide the position for the second decoding process at the next time.
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公开(公告)号:US11025281B2
公开(公告)日:2021-06-01
申请号:US16806322
申请日:2020-03-02
Applicant: KIOXIA CORPORATION
Inventor: Naoko Kifune , Hironori Uchikawa
Abstract: A memory system includes a nonvolatile memory and a memory controller that encodes first XOR data generated by performing an exclusive OR operation on pieces of user data, wherein a value of each bit of the XOR data is generated by performing an exclusive OR operation on values of bits that are at one of a plurality of bit positions of a piece of user data, generates codewords by encoding the plurality of pieces of user data and the generated XOR data, respectively, and stores the codewords in the nonvolatile memory. The memory controller also performs a read operation by reading the codewords from the nonvolatile memory and decoding them. When the decoding of two or more of the codewords fails, the memory controller generates second XOR data, and corrects the value of one of the bits corresponding to a codeword whose decoding failed, based on the second XOR data.
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公开(公告)号:US12020756B2
公开(公告)日:2024-06-25
申请号:US18134719
申请日:2023-04-14
Applicant: Kioxia Corporation
Inventor: Noboru Shibata , Hironori Uchikawa , Taira Shibuya
IPC: G11C16/00 , G06F3/06 , G11C16/04 , G11C16/08 , G11C16/10 , G11C16/26 , G11C16/32 , G11C16/34 , H10B69/00
CPC classification number: G11C16/26 , G06F3/0604 , G06F3/0659 , G06F3/0679 , G11C16/0483 , G11C16/08 , G11C16/10 , G11C16/32 , G11C16/3459 , H10B69/00
Abstract: A semiconductor memory includes a first memory cell configured to be set with a first threshold voltage, the first threshold voltage being one of different threshold voltage levels, a second memory cell configured to be set with a second threshold voltage, the second threshold voltage being one of different threshold voltage levels, a first word line coupled to the first memory cell, a second word line coupled to the second memory cell, and a controller configured to read data of one of different bits based on a combination of the first threshold voltage of the first memory cell and the second threshold voltage of the second memory cell.
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公开(公告)号:US12009837B2
公开(公告)日:2024-06-11
申请号:US18330669
申请日:2023-06-07
Applicant: Kioxia Corporation
Inventor: Hironori Uchikawa
CPC classification number: H03M13/159 , H03M13/098 , H03M13/1177 , H03M13/1575 , H03M13/2732 , H03M13/2735
Abstract: A syndrome calculation circuit includes a matrix product calculation circuit. The matrix product calculation circuit is configured to generate syndrome bits in a composite field by calculating a matrix product of input data bits and a first arithmetic matrix. The first arithmetic matrix is a matrix product of a basis conversion matrix for converting a data string from a Galois field to the composite field and a second arithmetic matrix, which is at least a part of a parity check matrix.
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公开(公告)号:US11831335B2
公开(公告)日:2023-11-28
申请号:US17807038
申请日:2022-06-15
Applicant: Kioxia Corporation
Inventor: Naoaki Kokubun , Yuki Kondo , Hironori Uchikawa
IPC: H03M13/15
CPC classification number: H03M13/152 , H03M13/1525 , H03M13/1545
Abstract: A memory system includes a memory controller. The memory controller executes first calculation of obtaining a first degree to k-th degree error locator polynomials (1≤k
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公开(公告)号:US11664822B2
公开(公告)日:2023-05-30
申请号:US17680164
申请日:2022-02-24
Applicant: KIOXIA CORPORATION
Inventor: Yuta Kumano , Hironori Uchikawa
CPC classification number: H03M13/1111 , G06F11/1068 , H03M13/1575 , H03M13/3723 , H03M13/45
Abstract: A memory system includes an encoder and a decoder. The encoder is configured to generate multi-dimensionally-coded data to be written into the non-volatile memory. Data bits of the multi-dimensionally-coded data are grouped into first and second dimensional codes with respect to first and second dimensions, respectively. The decoder is configured to, with respect to each of the first and second dimensional codes included in read multi-dimensionally-coded data, generate a syndrome value of the dimensional code, generate low-reliability location information, generate a soft-input value based on the syndrome value and the low-reliability location information, decode the dimensional code through correction of the dimensional code using the soft-input value, and store modification information indicating a bit of the dimensional code corrected through the correction and reliability information indicating reliability of the correction. The decoder generates the soft-input value also based on the modification information and the reliability information in the memory.
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公开(公告)号:US11657879B2
公开(公告)日:2023-05-23
申请号:US17244246
申请日:2021-04-29
Applicant: Kioxia Corporation
Inventor: Noboru Shibata , Hironori Uchikawa , Taira Shibuya
IPC: G11C11/00 , G11C16/26 , G11C16/04 , G11C16/08 , G11C16/10 , G11C16/34 , G06F3/06 , G11C16/32 , H01L27/115
CPC classification number: G11C16/26 , G06F3/0604 , G06F3/0659 , G06F3/0679 , G11C16/0483 , G11C16/08 , G11C16/10 , G11C16/32 , G11C16/3459 , H01L27/115
Abstract: A semiconductor memory includes a first memory cell configured to be set with a first threshold voltage, the first threshold voltage being one of different threshold voltage levels, a second memory cell configured to be set with a second threshold voltage, the second threshold voltage being one of different threshold voltage levels, a first word line coupled to the first memory cell, a second word line coupled to the second memory cell, and a controller configured to read data of one of different bits based on a combination of the first threshold voltage of the first memory cell and the second threshold voltage of the second memory cell.
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