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公开(公告)号:US11658090B2
公开(公告)日:2023-05-23
申请号:US17232495
申请日:2021-04-16
Applicant: Samsung Electronics Co., Ltd.
Inventor: Heungkyu Kwon
IPC: H01L23/31 , H01L23/373 , H01L23/367 , H01L23/433 , H01L23/498 , H01L25/16
CPC classification number: H01L23/3675 , H01L23/3128 , H01L23/3735 , H01L25/16
Abstract: A semiconductor package system includes a substrate, a first and a second semiconductor package, a first thermal conductive layer, a first passive device, and a heat radiation structure. The first and second semiconductor package and first passive device may be mounted on a top surface of the substrate. The first semiconductor package may include a first semiconductor chip that includes a plurality of logic circuits. The first thermal conductive layer may be on the first semiconductor package. The heat radiation structure may be on the first thermal conductive layer, the second semiconductor package, and the first passive device. The heat radiation structure may include a first bottom surface physically contacting the first thermal conductive layer, and a second bottom surface at a higher level than that of the first bottom surface. The second bottom surface may be on the second semiconductor package and/or the first passive device.
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公开(公告)号:US11075138B2
公开(公告)日:2021-07-27
申请号:US16397278
申请日:2019-04-29
Applicant: Samsung Electronics Co., Ltd.
Inventor: Heungkyu Kwon
IPC: H01L23/373 , H01L23/31 , H01L23/367 , H01L23/00
Abstract: Provided is a semiconductor package system. The system includes a substrate, a first semiconductor package on the substrate, a second semiconductor package on the substrate, a first passive element on the substrate, a heat dissipation structure on the first semiconductor package, the second semiconductor package, and the first passive element, and a first heat conduction layer between the first semiconductor package and the heat dissipation structure. A sum of a height of the first semiconductor package and a thickness of the first heat conduction layer may be greater than a height of the first passive element. The height of the first semiconductor package may be greater than a height of the second semiconductor package.
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公开(公告)号:US11600607B2
公开(公告)日:2023-03-07
申请号:US16744437
申请日:2020-01-16
Applicant: Samsung Electronics Co., Ltd.
Inventor: Heungkyu Kwon
IPC: H01L25/16 , H01L23/538 , H01L23/498 , H01L23/367
Abstract: A semiconductor module may include a system board including a top surface and a bottom surface, a module substrate provided on the top surface of the system board, a system semiconductor package mounted on the module substrate, and first and second power management semiconductor packages mounted on the module substrate. The first and second power management semiconductor packages may be spaced apart from each other in a first direction, which is parallel to a top surface of the module substrate, with the system semiconductor package interposed therebetween.
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公开(公告)号:US11069623B2
公开(公告)日:2021-07-20
申请号:US16385089
申请日:2019-04-16
Applicant: Samsung Electronics Co., Ltd.
Inventor: Heungkyu Kwon
Abstract: Provided is a semiconductor package. The semiconductor package may include a substrate, a semiconductor chip on the substrate, a passive element on the substrate, a conductive structure on the substrate, and an interposer substrate on the semiconductor chip, the passive element, and the conductive structure. The interposer substrate may be electrically connected to the conductive structure. A height of the passive element may be greater than a height of the semiconductor chip.
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公开(公告)号:US09859237B2
公开(公告)日:2018-01-02
申请号:US14843326
申请日:2015-09-02
Applicant: SAMSUNG ELECTRONICS CO., LTD.
Inventor: Heungkyu Kwon , Inhyuk Kim
CPC classification number: H01L24/05 , G06F21/30 , H01L21/561 , H01L21/568 , H01L22/32 , H01L23/3114 , H01L23/3128 , H01L23/3192 , H01L24/03 , H01L24/06 , H01L24/11 , H01L24/13 , H01L24/19 , H01L24/20 , H01L24/48 , H01L24/85 , H01L25/0657 , H01L2224/0231 , H01L2224/0237 , H01L2224/02375 , H01L2224/02381 , H01L2224/0392 , H01L2224/0401 , H01L2224/04042 , H01L2224/04105 , H01L2224/05024 , H01L2224/05548 , H01L2224/06515 , H01L2224/12105 , H01L2224/13024 , H01L2224/131 , H01L2224/16227 , H01L2224/32145 , H01L2224/32225 , H01L2224/48091 , H01L2224/48227 , H01L2224/48247 , H01L2224/73253 , H01L2224/73265 , H01L2225/0651 , H01L2225/06517 , H01L2225/06558 , H01L2225/06568 , H01L2225/1023 , H01L2225/1035 , H01L2225/1041 , H01L2225/1058 , H01L2924/00014 , H01L2924/15311 , H01L2924/181 , H01L2924/18162 , H01L2924/00012 , H01L2224/45015 , H01L2924/207 , H01L2224/45099 , H01L2924/00 , H01L2924/014
Abstract: A chip includes a core layer, at least one redistribution layer formed on the core layer, and at least one triple pad connected to a pad of the core layer through the at least one redistribution layer or at least one via connected to the at least one redistribution layer. The at least one triple pad includes a bonding pad, a redistribution layer pad connected to the at least one redistribution layer, and a test pad configured to perform a wafer level test. The bonding pad, the redistribution layer pad and the test pad are connected to one another through the at least one redistribution layer, and the test pad is disposed in a core area that overlaps the core layer.
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公开(公告)号:US11908810B2
公开(公告)日:2024-02-20
申请号:US17489328
申请日:2021-09-29
Applicant: SAMSUNG ELECTRONICS CO., LTD.
Inventor: Heungkyu Kwon , Junso Pak , Heeseok Lee
CPC classification number: H01L23/562 , H01L23/16
Abstract: A hybrid semiconductor device includes an interposer substrate, a semiconductor package mounted on the interposer substrate, a molding member on the package substrate covering at least a portion of the semiconductor chip and exposing an upper surface of the semiconductor chip, and a stiffener disposed on an upper surface of the interposer substrate substantially around the semiconductor package.
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公开(公告)号:US11908758B2
公开(公告)日:2024-02-20
申请号:US17550284
申请日:2021-12-14
Applicant: SAMSUNG ELECTRONICS CO., LTD.
Inventor: Heungkyu Kwon , Junso Pak , Heeseok Lee
IPC: H01L23/16 , H01L23/053 , H01L23/31
CPC classification number: H01L23/16 , H01L23/053 , H01L23/31
Abstract: A semiconductor package includes; a dual stiffener including an upper stiffener and a lower stiffener, an upper package including an upper package substrate, a semiconductor chip centrally mounted on an upper surface of the upper package substrate, and the upper stiffener disposed along an outer edge of the upper package substrate, and a lower package substrate that centrally mounts the upper package and includes the lower stiffener disposed on an upper surface of the lower package substrate to surround the upper package substrate.
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公开(公告)号:US11244885B2
公开(公告)日:2022-02-08
申请号:US16573107
申请日:2019-09-17
Applicant: Samsung Electronics Co., Ltd.
Inventor: Heungkyu Kwon
IPC: H01L23/367 , H01L21/48 , H01L25/18 , H01L25/065
Abstract: Disclosed is a semiconductor package system comprising a substrate, a first semiconductor package on the substrate, and a heat radiation structure on the first semiconductor package. The heat radiation structure includes a first part on a top surface of the first semiconductor package and a second part connected to the first part. The second part has a bottom surface at a level lower than a level of the top surface of the first semiconductor package. A vent hole is provided between an edge region of the substrate and the first part of the heat radiation structure.
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公开(公告)号:US10068881B2
公开(公告)日:2018-09-04
申请号:US15392275
申请日:2016-12-28
Applicant: SAMSUNG ELECTRONICS CO., LTD.
Inventor: Heungkyu Kwon
IPC: H01L23/544 , H01L21/00 , H01L25/10 , H01L25/00
Abstract: Provided are a package-on-package type semiconductor package and a method of fabricating the same. The semiconductor package includes upper package stacked on a lower package and a via provided between the lower and upper packages to electrically connect the lower and upper packages to each other. The lower package includes a lower package substrate, a lower semiconductor chip mounted on the lower package substrate, and a lower mold layer encapsulating the lower semiconductor chip and including an alignment mark. The lower mold layer includes a marking region, which is provided between the via and the lower semiconductor chip, and on which the alignment mark is provided.
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公开(公告)号:US08981543B2
公开(公告)日:2015-03-17
申请号:US13951376
申请日:2013-07-25
Applicant: Samsung Electronics Co., Ltd.
Inventor: Heungkyu Kwon , Seungjin Cheon
IPC: H01L23/13 , H01L23/00 , H01L23/498 , H01L23/28 , H01L25/065 , H01L25/10 , H01L23/31 , H01L21/56
CPC classification number: H01L23/562 , H01L21/565 , H01L23/13 , H01L23/28 , H01L23/3128 , H01L23/3135 , H01L23/49816 , H01L23/49838 , H01L25/0655 , H01L25/0657 , H01L25/105 , H01L2224/14181 , H01L2224/16145 , H01L2224/16225 , H01L2224/32145 , H01L2224/32225 , H01L2224/48091 , H01L2224/48227 , H01L2224/73204 , H01L2224/73265 , H01L2225/06513 , H01L2225/06517 , H01L2225/06541 , H01L2225/1023 , H01L2225/1058 , H01L2225/1076 , H01L2924/15151 , H01L2924/15311 , H01L2924/18161 , H01L2924/18301 , H01L2924/00014 , H01L2924/00
Abstract: Semiconductor packages are disclosed. In a semiconductor package, a package board may include a hole. A mold layer may cover an upper portion of the package board and extend through the hole to cover at least a portion of a bottom surface of the package board. Each of the sidewalls of a lower mold portion may have a symmetrical structure with respect to the hole penetrating the package board, such that a warpage phenomenon of the semiconductor package may be reduced.
Abstract translation: 公开了半导体封装。 在半导体封装中,封装板可以包括孔。 模具层可以覆盖封装板的上部并且延伸穿过孔以覆盖封装板的底表面的至少一部分。 下模具部分的每个侧壁可以具有相对于穿过封装板的孔的对称结构,从而可以减少半导体封装的翘曲现象。
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