Under voltage lock-out circuit
    1.
    发明授权

    公开(公告)号:US12132470B2

    公开(公告)日:2024-10-29

    申请号:US17548765

    申请日:2021-12-13

    摘要: An integrated circuit includes a substrate, a GaN FET power switch disposed on the substrate, and a totally-GaN-based driver disposed on the substrate and coupled to the GaN FET power switch. The totally-GaN-based driver has an input terminal for receiving a supply voltage and includes an under-voltage detector having an output terminal. The under-voltage detector outputs a UVLO signal when the supply voltage is below a low-to-high threshold value, and does not output the UVLO signal when the supply voltage is above the low-to-high threshold value. The totally-GaN-based driver includes a pulse stretcher having an input terminal coupled to the output terminal of the under-voltage detector, and an output terminal for outputting a stretched_UVLO signal for a predetermined amount of time after the supply voltage first rises above the low-to-high threshold value.

    Short-circuit protection circuitry

    公开(公告)号:US12068742B2

    公开(公告)日:2024-08-20

    申请号:US17864430

    申请日:2022-07-14

    摘要: A short-circuit protection circuitry is adapted for a power transistor. The short-circuit protection circuitry includes a first diode, a first resistor, a voltage dividing circuit, a gate voltage generator, a pull-down circuit, and a control signal generator. The first diode is coupled to a drain of the power transistor. The first resistor is coupled between the first diode and the power transistor. The voltage dividing circuit is coupled between a gate and a source of the power transistor to generate a dividing voltage. The gate voltage generator provides a gate voltage to the gate of the power transistor according to a first driving signal and a second driving signal. The pull-down circuit pulls down the gate voltage according to a control signal. The control signal generator generates the control signal according to the first driving signal, a voltage on the anode of the first diode and the dividing voltage.

    Semiconductor device
    5.
    再颁专利

    公开(公告)号:USRE50035E1

    公开(公告)日:2024-07-09

    申请号:US17688267

    申请日:2022-03-07

    IPC分类号: H01L23/62 H01L23/525

    摘要: By stably separating a melting location of a fuse (3) from conductive layers (5A, 5B), reliable melting of the fuse (3) is enabled. A fuse (3) including a fuse body (3A) and two pads (3Ba, 3Bb) connected by this and two conductive layers (5A, 5B) individually connected to the two pads (3Ba, 3Bb) are formed in a multilayer structure on a semiconductor substrate (1). A length of the fuse body (3A) is defined so that the melting location of the fuse (3) becomes positioned in the fuse body (3A) away from the region overlapped on the conductive layer (5A or 5B) when an electrical stress is applied between two conductive layers (5A, 5B) and the fuse (3) is melted.