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公开(公告)号：US20160008115A1
公开(公告)日：2016-01-14
申请号：US14859546
申请日：2015-09-21
Applicant: Ivoclar Vivadent AG
Inventor： Bruno Senn , Wolfgang Plank , Gottfried Rohner
CPC classification number: A61C19/004 , A61B1/0684 , A61B1/24 , A61B5/0088 , A61B5/7246 , A61B5/7445 , A61C1/0015 , G01B11/026 , G01J1/0247 , G01J1/4228 , G01J2001/4252 , G01N21/55 , G01N2201/062
Abstract: The invention relates to an apparatus for irradiating an object, in particular for light-curing a dental object by means of a first radiation, the apparatus comprising at least one radiation source for emitting the first radiation, the apparatus further comprising at least one radiation sensor for measuring at least a second radiation, and the apparatus further comprising a housing. The second radiation is the first radiation reelected by the object.
Abstract translation: 本发明涉及一种用于照射物体的装置，特别是用于通过第一辐射光固化牙科物体的装置，该装置包括用于发射第一辐射的至少一个辐射源，该装置还包括至少一个辐射传感器 用于测量至少第二辐射，并且所述设备还包括壳体。 第二个辐射是物体重新选择的第一个辐射。
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公开(公告)号：US09229065B2
公开(公告)日：2016-01-05
申请号：US13836181
申请日：2013-03-15
Applicant: GENESIS PHOTONICS INC
Inventor： Tai-Wei Wu , Tai-Cheng Tsai , Hsin-Hung Lin , Ping-Tsung Tsai , Pei-Yi Huang , Gwo-Jiun Sheu , Shou-Wen Hsu , Yun-Li Li
CPC classification number: G01R31/44 , G01J2001/4252 , G01R31/2635
Abstract: A detection apparatus for light-emitting diode chip comprising a substrate with the function of photoelectric conversion and a probing device is disclosed. The substrate is designed to bear at least one light-emitting diode chip. The probing device comprises a power supply and at least two conductive elements. The two ends of the conductive elements are respectively electrically connected to the light-emitting diode chip and the power supply to enable the light-emitting diode chip to emit light beams. Some of the light beams are emitted from the light-emitting diode chip toward the substrate such that the light beams emitted by the light-emitting diode chip are converted into an electric signal by the substrate.
Abstract translation: 公开了一种包括具有光电转换功能的基板和探测装置的发光二极管芯片的检测装置。 基板被设计成承载至少一个发光二极管芯片。 探测装置包括电源和至少两个导电元件。 导电元件的两端分别电连接到发光二极管芯片和电源，以使得发光二极管芯片能够发射光束。 一些光束从发光二极管芯片朝向基板发射，使得由发光二极管芯片发射的光束被基板转换成电信号。
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143.发明申请Illumination Device and Method for Calibrating an Illumination Device over Changes in Temperature, Drive Current, and Time 有权照明装置和照明装置的温度，驱动电流和时间变化的校准方法公开(公告)号：US20150377699A1
公开(公告)日：2015-12-31
申请号：US14314451
申请日：2014-06-25
Applicant: Ketra, Inc.
Inventor： Horace C. Ho , Jason E. Lewis , David J. Knapp
IPC: G01J1/44
CPC classification number: H05B33/0851 , G01J1/0252 , G01J1/32 , G01J1/42 , G01J3/0286 , G01J3/465 , G01J3/505 , G01J2001/4252 , G01J2001/444 , G01R31/44 , H05B33/0866 , H05B33/0869 , H05B37/02 , H05B37/0227
Abstract: An illumination device and method is provided herein for calibrating individual LEDs in the illumination device, so as to obtain a desired luminous flux and a desired chromaticity of the device over changes in drive current, temperature, and over time as the LEDs age. The calibration method may include subjecting the illumination device to a first ambient temperature, successively applying at least three different drive currents to a first LED to produce illumination at three or more different levels of brightness, obtaining a plurality of optical measurements from the illumination produced by the first LED at each of the at least three different drive currents, obtaining a plurality of electrical measurements from the photodetector and storing results of the obtaining steps within the illumination device to calibrate the first LED at the first ambient temperature. The plurality of optical measurements may generally include luminous flux and chromaticity, the plurality of electrical measurements may generally include induced photocurrents and forward voltages, and the calibration method steps may be repeated for each LED included within the illumination device and upon subjecting the illumination device to a second ambient temperature.
Abstract translation: 本文提供一种用于校准照明装置中的各个LED的照明装置和方法，以便随着LED寿命而获得期望的光通量和装置的驱动电流，温度和随时间的变化的期望色度。 校准方法可以包括使照明装置经受第一环境温度，连续地向第一LED施加至少三个不同的驱动电流以产生三个或更多个不同亮度级别的照明，从由以下的照明产生的照明获得多个光学测量值 在所述至少三个不同驱动电流中的每一个处的所述第一LED，从所述光电检测器获得多个电测量值，并且存储所述照明装置内的所述获得步骤的结果，以在所述第一环境温度下校准所述第一LED。 多个光学测量通常可以包括光通量和色度，多个电测量通常可以包括感应光电流和正向电压，并且可以针对包括在照明装置内的每个LED重复校准方法步骤，并且对照明装置 第二个环境温度。
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公开(公告)号：US20150357250A1
公开(公告)日：2015-12-10
申请号：US14606954
申请日：2015-01-27
Applicant: SAMSUNG ELECTRONICS CO., LTD.
Inventor： Min Ki KIM , Jung Jin KIM , Yong Min KWON
CPC classification number: H01L33/005 , G01J2001/4252 , G01J2003/466 , G01R31/2635 , H01L24/97 , H01L33/0095 , H01L33/486 , H01L33/62 , H01L2224/14 , H01L2224/16225 , H01L2933/0033 , H01L2933/0041
Abstract: A method of manufacturing a light emitting device package includes forming a plurality of light emitting devices by growing a plurality of semiconductor layers on a wafer, and measuring color characteristics of light emitted from each of the plurality of light emitting devices. For each of the plurality of light emitting devices, a type and an amount of wavelength conversion material is determined for color compensating the light emitting device based on a difference between the measured color characteristics and target color characteristics. A wavelength conversion layer is formed on at least two light emitting devices among the plurality of light emitting devices, the wavelength conversion layer having the type and the amount of wavelength conversion material determined for the at least two light emitting devices. The plurality of light emitting devices is then divided into individual light emitting device packages.
Abstract translation: 制造发光器件封装的方法包括通过在晶片上生长多个半导体层来形成多个发光器件，并测量从多个发光器件中的每一个发射的光的颜色特性。 对于多个发光器件中的每一个，基于测量的颜色特性和目标颜色特性之间的差异，确定波长转换材料的类型和量用于对发光器件进行颜色补偿。 波长转换层形成在多个发光器件中的至少两个发光器件上，波长转换层具有为至少两个发光器件确定的类型和波长转换材料的量。 然后将多个发光器件分成单独的发光器件封装。
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145.发明授权Apparatus and method for evaluating optical properties of LED and method for manufacturing LED device 有权用于评估LED光学特性的装置和方法及其制造方法公开(公告)号：US09190335B2
公开(公告)日：2015-11-17
申请号：US14057855
申请日：2013-10-18
Applicant: SAMSUNG ELECTRONICS CO., LTD.
Inventor： Jong Rak Sohn , Il Woo Park
CPC classification number: H01L22/10 , G01J1/04 , G01J1/0488 , G01J3/0251 , G01J2001/4252 , H01L33/50 , H01L2224/48091 , H01L2924/00014
Abstract: An optical property evaluation apparatus includes: a light conversion filter converting light emitted from an LED chip or a bare LED package, which is to be evaluated, into a different wavelength of light, and emitting a specific color of light; and an optical property measurement unit receiving the specific color of light emitted from the light conversion filter and measuring the optical properties of the received light.
Abstract translation: 光学特性评估装置包括：光转换滤波器，将要评估的LED芯片或裸LED封装件发射的光转换成不同波长的光，并发射特定颜色的光; 以及光学性质测量单元，接收从光转换滤光器发射的光的特定颜色并测量接收光的光学特性。
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Patent Agency Ranking
公开(公告)号：US09161828B2
公开(公告)日：2015-10-20
申请号：US12454482
申请日：2009-05-19
Applicant: Bruno Senn , Wolfgang Plank , Gottfried Rohner
Inventor： Bruno Senn , Wolfgang Plank , Gottfried Rohner
CPC classification number: A61C19/004 , G01B11/026 , G01J1/4228 , G01J2001/4252 , G01N21/55 , G01N2201/062
Abstract: The invention relates to an apparatus for irradiating an object, in particular for light-curing a dental object by means of a first radiation, the apparatus comprising at least one radiation source for emitting the first radiation, the apparatus further comprising at least one radiation sensor for measuring at least a second radiation, and the apparatus further comprising a housing. The second radiation is the first radiation reelected by the object.
Abstract translation: 本发明涉及一种用于照射物体的装置，特别是用于通过第一辐射光固化牙科物体的装置，该装置包括用于发射第一辐射的至少一个辐射源，该装置还包括至少一个辐射传感器 用于测量至少第二辐射，并且所述设备还包括壳体。 第二个辐射是物体重新选择的第一个辐射。
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公开(公告)号：US20150204718A1
公开(公告)日：2015-07-23
申请号：US14423695
申请日：2013-08-22
Applicant: OSRAM Opto Semiconductors GmbH
Inventor： Simeon Katz , Holger Specht , Alexander Linkov , Christopher Koelper
CPC classification number: G01J1/0425 , G01J1/0474 , G01J1/42 , G01J2001/4252 , G01M11/30
Abstract: The invention relates to a method for measuring a light radiation (300) emitted by a light-emitting diode (210). In the method, an end (121) of an optical fibre (120) which is connected to a measuring device (130) is irradiated with the light radiation (300), which is emitted by the light-emitting diode (210), through an optical device (140), so that a portion of the light radiation (300) is coupled into the optical fibre (120) and is guided to the measuring device (130). The optical device (140) causes the light radiation (300) passing through the optical device (140) to be emitted in diffuse form in the direction of the end (121) of the optical fibre (120). The invention also relates to an apparatus (100) for measuring a light radiation (300) emitted by a light-emitting diode (210).
Abstract translation: 本发明涉及一种用于测量由发光二极管（210）发射的光辐射（300）的方法。 在该方法中，连接到测量装置（130）的光纤（120）的端部（121）被由发光二极管（210）发射的光辐射（300）照射通过 光学装置（140），使得光辐射（300）的一部分耦合到光纤（120）中并被引导到测量装置（130）。 光学装置（140）使通过光学装置（140）的光辐射沿着光纤（120）的端部（121）的方向以漫射形式发射。 本发明还涉及一种用于测量由发光二极管（210）发射的光辐射（300）的装置（100）。
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公开(公告)号：US08970835B2
公开(公告)日：2015-03-03
申请号：US13670397
申请日：2012-11-06
Applicant: Otsuka Electronics Co., Ltd.
Inventor： Kazuaki Ohkubo , Hisashi Shiraiwa
CPC classification number: G02B17/00 , G01J1/0214 , G01J1/04 , G01J1/0407 , G01J1/0425 , G01J3/0218 , G01J3/0254 , G01J3/0262 , G01J3/505 , G01J2001/0481 , G01J2001/4252 , G02B5/08
Abstract: An optical characteristic measuring apparatus includes a hemispheric portion having a reflective surface on its inner wall, and a plane portion arranged to close an opening of the hemispheric portion and having a reflective surface on an inner-wall side of the hemispheric portion. The plane portion includes a first window occupying a range including a substantial center of curvature of the hemispheric portion for attaching a light source to the first window. At least one of the hemispheric portion and the plane portion includes a plurality of second windows arranged in accordance with a predetermined rule for extracting light from inside the hemispheric portion.
Abstract translation: 光学特性测量装置包括在其内壁上具有反射表面的半球形部分和布置成关闭半球形部分的开口并且在半球形部分的内壁侧上具有反射表面的平面部分。 平面部分包括占据包括半球部分的基本曲率中心的范围的第一窗口，用于将光源附接到第一窗口。 半球部分和平面部分中的至少一个包括根据用于从半球部分内部提取光的预定规则布置的多个第二窗口。
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公开(公告)号：US08896824B2
公开(公告)日：2014-11-25
申请号：US13861377
申请日：2013-04-12
Applicant: Otsuka Electronics Co., Ltd.
Inventor： Kazuaki Ohkubo , Hisashi Shiraiwa
CPC classification number: G02B17/00 , G01J1/0214 , G01J1/04 , G01J1/0407 , G01J1/0425 , G01J3/0218 , G01J3/0254 , G01J3/0262 , G01J3/505 , G01J2001/0481 , G01J2001/4252 , G02B5/08
Abstract: An optical characteristic measuring apparatus includes a hemispheric portion having a reflective surface on its inner wall, and a plane portion arranged to close an opening of the hemispheric portion and having a reflective surface on an inner-wall side of the hemispheric portion. The plane portion includes a first window occupying a range including a substantial center of curvature of the hemispheric portion for attaching a light source to the first window. At least one of the hemispheric portion and the plane portion includes a plurality of second windows arranged in accordance with a predetermined rule for extracting light from inside the hemispheric portion.
Abstract translation: 光学特性测量装置包括在其内壁上具有反射表面的半球形部分和布置成关闭半球形部分的开口并且在半球形部分的内壁侧上具有反射表面的平面部分。 平面部分包括占据包括半球部分的基本曲率中心的范围的第一窗口，用于将光源附接到第一窗口。 半球部分和平面部分中的至少一个包括根据用于从半球部分内部提取光的预定规则布置的多个第二窗口。
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公开(公告)号：US20140268152A1
公开(公告)日：2014-09-18
申请号：US14204113
申请日：2014-03-11
Applicant: Sof-Tek Integrators, Inc. dba as Op-Test
Inventor： Daniel C. MORROW , Jonathan DUMMER , Stanley Curtis DODDS
CPC classification number: G01N21/66 , G01J3/501 , G01J3/505 , G01J2001/4252 , G01N21/21 , G01N21/8422 , G01N21/9501 , G01R31/2635
Abstract: Embodiments as disclosed herein provide a method and system that characterizes physical properties, such as thickness, uniformity, polarization, and/or sizes and locations of defect (e.g. defect density distribution) of crystalline structures grown on or thin films deposited on a substrate of a solid state light emitting device. The embodiments disclosed herein generally include exciting the light emitting device with an energy source and analyze optical energy emitted by the crystalline structures grown on or the thin films deposited on the substrate.
Abstract translation: 本文公开的实施方案提供了一种方法和系统，其特征在于物理性质，例如厚度，均匀性，极化，和/或尺寸和位于生长在沉积在基底上的薄膜上的晶体结构的缺陷（例如，缺陷密度分布） 固态发光器件。 本文公开的实施例通常包括用能量源激发发光器件并分析由沉积在衬底上的薄膜上生长的晶体结构发射的光能。
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