Abstract:
An integrated circuit (IC) may include a semiconductor substrate, and a semiconductor resistor. The semiconductor resistor may include a well in the semiconductor substrate and having a first conductivity type, a first resistive region in the well having an L-shape and a second conductivity type, and a tuning element associated with the first resistive region. The IC may also include a resistance compensation circuit on the semiconductor substrate. The resistance compensation circuit may be configured to measure an initial resistance of the first resistive region, and generate a voltage at the tuning element to tune an operating resistance of the first resistive region based upon the measured initial resistance.
Abstract:
An electric contact structure includes a first structural layer; a second structural layer made of dielectric material extending over the first structural layer; and an intermediate layer made of conductive material extending between the first structural layer and the second structural layer. A trench extends in the second structural layer delimited laterally by a wall of the second structural layer and at the bottom by a surface region of the intermediate layer. A diffusion barrier extends in the trench covering the surface region of the intermediate layer and the wall of the second structural layer. The diffusion barrier is a TiW—TiN—TiW tri-layer.
Abstract:
A drive transistor is connected to a resonant load in a low-side drive configuration. The voltage across the conduction terminals of the drive transistor is sensed and compared to an over-voltage threshold. An over-voltage signal is asserted in response to the comparison. The drive transistor is controlled by a PWM control signal in normal mode. In response to the assertion of the over-voltage signal, the drive transistor is forced to turn on (irrespective of the PWM control signal) to relieve the over-voltage condition. Operation of the circuit may be disabled or forced into soft start mode in response to the assertion of the over-voltage signal. Additionally, the pulse width of the PWM control signal may be reduced in response to the assertion of the over-voltage signal.
Abstract:
An electrical check executed on wafer tests for the correct positioning or alignment of the probes of a probe card on the pads or bumps of the electronic devices integrated on the wafer. A signal is applied to cause a current to circulate in at least part of a seal ring of at least one of the electronic devices. In a case where the current flows between and through multiple electronic devices, the seal rings of those electronic devices are suitably interconnected to each other by electronic structures that extend through the scribe line between electronic devices.
Abstract:
An IGBT transistor includes a drift region, at least one body region housed in the drift region and having a first type of conductivity, and a conduction region, which crosses the body region in a direction perpendicular to a surface of the drift region and has the first type of conductivity and a lower resistance than the body region. The conduction region includes a plurality of implant regions, arranged at respective depths from the surface of the drift region.
Abstract:
A method of interfacing a LC sensor with a control unit is provided. The control unit may include first and second contacts, where the LC sensor is connected between the first and the second contact. A capacitor is connected between the first contact and a ground. To start the oscillation of the LC sensor, the method may include during a first phase, connecting the first contact to a supply voltage and placing the second contact in a high impedance state such that the capacitor is charged through the supply voltage. During a second phase, the first contact may be placed in a high impedance state, and the second contact connected to the ground such that the capacitor transfers charge towards the LC sensor. During a third phase, the first contact and the second contact may be placed in a high impedance state so the LC sensor is able to oscillate.
Abstract:
A Class-G amplifier including a first and second driving transistor configured to receive an input voltage; a first supplying terminal connected to the first driving transistor to supply a first supplying voltage. The amplifier also comprises: a second supplying terminal connected to the second driving transistor to supply a second supplying voltage in absolute value higher than said first voltage; a first power transistor connected to the first driving transistor to form a first Sziklai pair structured to be activated by a first input voltage lower in absolute value than the first supplying voltage; a second power transistor connected to the second driving transistor to form a second Sziklai pair structured to be activated by an input signal comprised between the first supplying voltage and the second supplying voltage.
Abstract:
A SIM card adapter assembly is to adapt a SIM card to a SIM slot. The adapter assembly includes a SIM card plastic support including a first portion of a predetermined thickness. The SIM card is removably attached and a second portion has an increased thickness wherein at least one adapter is removably attached.
Abstract:
An electronic system includes an electronic device of through-hole mounting type comprising an insulating body for embedding at least a chip on which electronic components are integrated, a plurality of conductive leads projecting from the insulating body for said mounting, and a dissipation plate exposed from the insulating body for transferring heat from said electronic component in operation towards the outside of the insulating body. The electronic system includes a heat sink in contact with said dissipation plate for dissipating said heat. The heat sink comprises a first dissipation element, a second dissipation element, and clamping means for clamping the first dissipation element and the second dissipation element together against the insulating body of said electronic device.
Abstract:
An embodiment of a non-volatile memory device includes: a memory array, having a plurality of non-volatile logic memory cells arranged in at least one logic row, the logic row including a first row and a second row sharing a common control line; and a plurality of bit lines. Each logic memory cell has a direct memory cell, for storing a logic value, and a complementary memory cell, for storing a second logic value, which is complementary to the first logic value in the corresponding direct memory cell. The direct memory cell and the complementary memory cell of each logic memory cell are coupled to respective separate bit lines and are placed one in the first row and the other in the second row of the respective logic row.