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    Carrier and system for testing bumped semiconductor components
    14.
    发明授权
    Carrier and system for testing bumped semiconductor components 失效
    用于测试碰撞半导体元件的载体和系统

    公开(公告)号：US06313651B1

    公开(公告)日：2001-11-06

    申请号：US09322724

    申请日：1999-05-28

    申请人： David R. Hembree ,  Warren M. Farnworth ,  Alan G. Wood ,  Derek Gochnour ,  Salman Akram

    发明人： David R. Hembree ,  Warren M. Farnworth ,  Alan G. Wood ,  Derek Gochnour ,  Salman Akram

    IPC分类号： G01R3102

    CPC分类号： G01R1/0483 ,  H01L2224/0401 ,  H01L2224/05552 ,  H01L2224/48091 ,  H01L2224/81385 ,  H01L2924/01021 ,  H01L2924/01087 ,  H01L2924/09701 ,  H01L2924/10155 ,  H01L2924/15311 ,  H01L2924/00014

    摘要： A semiconductor carrier and system for testing bumped semiconductor components, such as dice and packages, having contact bumps are provided. The carrier includes a base, an interconnect, and a force applying mechanism. The interconnect includes patterns of contact members adapted to electrically contact the contact bumps. The interconnect can include a substrate having contact members formed as recesses, or as projections, covered with conductive layers. Alternately, the interconnect can be a multi layered tape bonded directly to a base of the carrier. In addition to providing electrical connections, the contact members perform an alignment function by self centering the contact bumps within the contact members. The carrier can also include an alignment member configured to align the components with the interconnect. The system can include the carrier, a socket, and a testing apparatus such as a burn-in board in electrical communication with test circuitry.

    摘要翻译： 提供了一种半导体载体和系统，用于测试具有接触凸块的凸起的半导体部件，例如芯片和封装。 载体包括基底，互连和力施加机构。 互连包括适于电接触接触凸块的接触构件的图案。 互连可以包括具有形成为凹陷的接触构件的衬底，或者作为突出部的覆盖有导电层的衬底。 或者，互连可以是直接结合到载体的基底的多层带。 除了提供电连接之外，接触构件通过使接触构件内的接触凸块自对中来执行对准功能。 载体还可以包括配置成将部件与互连对准的对准部件。 该系统可以包括载体，插座和诸如与测试电路电连接的老化板的测试装置。

    Method for testing semiconductor dice and chip scale packages
    15.
    发明授权
    Method for testing semiconductor dice and chip scale packages 失效
    半导体芯片和芯片级封装的测试方法

    公开(公告)号：US06255833B1

    公开(公告)日：2001-07-03

    申请号：US09098594

    申请日：1998-06-17

    申请人： Salman Akram ,  Alan G. Wood ,  David R. Hembree ,  Warren M. Farnworth

    发明人： Salman Akram ,  Alan G. Wood ,  David R. Hembree ,  Warren M. Farnworth

    IPC分类号： G01R3102

    CPC分类号： G01R1/0483 ,  H01L2224/48091 ,  H01L2924/01078 ,  H01L2924/01079 ,  H01L2924/01087 ,  H01L2924/30107 ,  H01L2924/00014

    摘要： A method and carrier for testing semiconductor dice such as bare dice or chip scale packages are provided. The carrier includes a base for retaining a single die, an interconnect for establishing temporary electrical communication with the die, and a force applying mechanism for biasing the die and interconnect together. In an illustrative embodiment the base includes conductors arranged in a universal pattern adapted to electrically connect to different sized interconnects. Interconnects are thus interchangeable on a base for testing different types of dice using the same base. The conductors on the base can be formed on a planar active surface of the base or on a stepped active surface having different sized cavities for mounting different sized interconnects. In an alternate embodiment the carrier includes an interposer. In a first interposer embodiment, the interposer connects directly to external test circuitry and can be changed to accommodate different sized interconnects. In a second interposer embodiment, the interposer connects to conductors on the base and adapts the base for use with different sized interconnects.

    摘要翻译： 提供了用于测试半导体裸片（例如裸裸片或芯片级封装）的方法和载体。 载体包括用于保持单个管芯的基座，用于建立与管芯的临时电连通的互连件，以及用于偏压管芯并互连在一起的施力机构。 在说明性实施例中，底座包括以适于电连接到不同尺寸的互连件的通用图案布置的导体。 因此，互连在基座上可以互换，用于使用相同的基底测试不同类型的骰子。 基座上的导体可以形成在基座的平面有源表面上或具有不同尺寸的空腔的阶梯式有源表面上，用于安装不同尺寸的互连。在替代实施例中，载体包括插入器。 在第一插入器实施例中，插入器直接连接到外部测试电路，并且可以改变以适应不同尺寸的互连。 在第二插入器实施例中，插入器连接到基座上的导体，并使基座适配于不同大小的互连使用。

    Apparatus for testing semiconductor wafers
    16.
    发明授权
    Apparatus for testing semiconductor wafers 有权
    半导体晶片测试装置

    公开(公告)号：US6064216A

    公开(公告)日：2000-05-16

    申请号：US241553

    申请日：1999-02-01

    申请人： Warren M. Farnworth ,  Salman Akram ,  Alan G. Wood ,  David R. Hembree ,  James M. Wark ,  John O. Jacobson

    发明人： Warren M. Farnworth ,  Salman Akram ,  Alan G. Wood ,  David R. Hembree ,  James M. Wark ,  John O. Jacobson

    IPC分类号： G01R1/04 ,  G01R31/28 ,  G01R31/02

    CPC分类号： G01R1/0491 ,  G01R31/2886

    摘要： A method, apparatus and system for testing semiconductor wafers are provided. The method includes providing a wafer carrier to provide an electrical path for receiving and transmitting test signals to the wafer. The wafer carrier includes a base for retaining the wafer, and an interconnect having contact members configured to establish electrical communication with contact locations on the wafer. The wafer carrier can include one or more compressible spring members configured to bias the wafer and interconnect together in the assembled carrier. The wafer carrier can be assembled, with the wafer in alignment with the interconnect, using optical alignment techniques, and an assembly tool similar to aligner bonder tools used for flip chip bonding semiconductor dice. A system for use with the carrier can include a testing apparatus configured to apply test signals through the carrier to the wafer while the wafer is subjected to temperature cycling.

    摘要翻译： 提供了一种用于测试半导体晶片的方法，装置和系统。 该方法包括提供晶片载体以提供用于接收和传输测试信号到晶片的电路径。 晶片载体包括用于保持晶片的基座和具有被配置为与晶片上的接触位置建立电连通的接触构件的互连。 晶片载体可以包括被配置为偏置晶片并在组装的载体中互连在一起的一个或多个可压缩弹簧构件。 可以使用光学对准技术来组装晶片载体，其中晶片与互连对准，以及类似于用于倒装芯片接合半导体晶片的对准器焊接工具的组装工具。 与载体一起使用的系统可以包括测试装置，其被配置为在晶片受到温度循环的同时将测试信号通过载体施加到晶片。

    System and interconnect for making temporary electrical connections with bumped semiconductor components
    17.
    发明授权
    System and interconnect for making temporary electrical connections with bumped semiconductor components 有权
    用于与凸起的半导体部件进行临时电连接的系统和互连

    公开(公告)号：US5915977A

    公开(公告)日：1999-06-29

    申请号：US138612

    申请日：1998-08-24

    申请人： David R. Hembree ,  John O. Jacobson ,  James M. Wark ,  Warren M. Farnworth ,  Salman Akram ,  Alan G. Wood

    发明人： David R. Hembree ,  John O. Jacobson ,  James M. Wark ,  Warren M. Farnworth ,  Salman Akram ,  Alan G. Wood

    IPC分类号： G01R1/04 ,  H01L21/00 ,  H01R12/04 ,  H05K3/32 ,  H01R9/09

    CPC分类号： H01L21/67144 ,  G01R1/0408 ,  H05K3/326 ,  H01L2224/1601 ,  H01L2224/16237 ,  H01L2224/81141 ,  H01L2224/81191 ,  H01L2224/81385

    摘要： An interconnect and system for establishing temporary electrical communication with semiconductor components having contact bumps are provided. The interconnect includes a substrate with patterns of contact members adapted to electrically contact the contact bumps. The substrate can be formed of a material such as ceramic, silicon, FR-4, or photo-chemically machineable glass. The contact members can be formed as recesses covered with conductive layers in electrical communication with conductors and terminal contacts on the substrate. Alternately, the contact members can be formed as projections adapted to penetrate the contact bumps, as microbumps with a rough textured surface, or as a deposited layer formed with recesses. The interconnect can be employed in a wafer level test system for testing dice contained on a wafer, or in a die level test system for testing bare bumped dice or bumped chip scale packages.

    摘要翻译： 提供了一种用于与具有接触凸块的半导体部件建立临时电连通的互连和系统。 互连包括具有适于电接触接触凸块的接触部件图案的基板。 衬底可由诸如陶瓷，硅，FR-4或光刻化学可加工玻璃的材料形成。 接触构件可以形成为覆盖有与衬底上的导体和端子触点电连通的导电层的凹陷。 或者，接触构件可以形成为适于穿透接触凸块的突起，作为具有粗糙纹理表面的微胶囊，或者形成为具有凹陷的沉积层。 互连可以用于晶片级测试系统中，用于测试包含在晶片上的骰子，或者用于测试裸露的骰子或凸起的芯片级封装的芯片级测试系统。