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公开(公告)号:US12021073B2
公开(公告)日:2024-06-25
申请号:US17656011
申请日:2022-03-23
Applicant: SAMSUNG ELECTRONICS CO., LTD.
Inventor: Juhyeon Kim , Hyoeun Kim , Sunkyoung Seo
IPC: H01L21/768 , H01L21/78 , H01L23/00 , H01L25/00 , H01L25/065
CPC classification number: H01L25/50 , H01L21/76898 , H01L21/78 , H01L24/03 , H01L24/80 , H01L24/94 , H01L24/97 , H01L24/08 , H01L24/13 , H01L25/0657 , H01L2224/0401 , H01L2224/08146 , H01L2224/80001 , H01L2225/06541
Abstract: A method of manufacturing a semiconductor package includes preparing a wafer structure having a first semiconductor substrate and a plurality of first front surface connection pads. A lower semiconductor chip having a preliminary semiconductor substrate and a plurality of second front surface connection pads are attached to the wafer structure such that the plurality of first front surface connection pads and the plurality of second front surface connection pads correspond to each other. A plurality of bonding pads is formed by bonding together the plurality of first front surface connection pads and the plurality of second front surface connection pads corresponding to each other. A second semiconductor substrate having a horizontal width that is less than that of the second wiring structure is formed by removing a portion of the preliminary semiconductor substrate.
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公开(公告)号:US11942446B2
公开(公告)日:2024-03-26
申请号:US17165429
申请日:2021-02-02
Applicant: SAMSUNG ELECTRONICS CO., LTD.
Inventor: Hyoeun Kim , Sunkyoung Seo , Seunghoon Yeon , Chajea Jo
IPC: H01L23/31 , H01L23/00 , H01L23/538 , H01L25/065
CPC classification number: H01L24/14 , H01L23/3157 , H01L23/5384 , H01L23/5386 , H01L25/0657 , H01L2224/14181
Abstract: A semiconductor package includes at least one second semiconductor chip stacked on a first semiconductor chip. An underfill layer is interposed between the first semiconductor chip and the at least one second semiconductor chip. The first semiconductor chip includes a first substrate, a first passivation layer disposed on the first substrate. The first passivation layer includes a first recess region. A first pad covers a bottom surface and sidewalls of the first recess region. The at least one second semiconductor chip includes a second substrate, a second passivation layer disposed adjacent to the first substrate, a conductive bump protruding outside the second passivation layer towards the first semiconductor chip and an inter-metal compound pattern disposed in direct contact with both the conductive bump and the first pad. The underfill layer is in direct contact with both the conductive bump and the inter-metal compound pattern.
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公开(公告)号:US11776941B2
公开(公告)日:2023-10-03
申请号:US17357378
申请日:2021-06-24
Applicant: Samsung Electronics Co., Ltd.
Inventor: Yonghoe Cho , Sunkyoung Seo , Chajea Jo
IPC: H01L23/498 , H01L25/16 , H01L23/14 , H01L23/00 , H01L23/538
CPC classification number: H01L25/167 , H01L23/147 , H01L23/49811 , H01L23/49822 , H01L23/5383 , H01L24/16 , H01L2224/16227
Abstract: A semiconductor package includes a package substrate, a connection substrate on the package substrate, a first image sensor chip on the connection substrate, a second image sensor chip on the connection substrate, the second image sensor chip being horizontally spaced apart from the first image sensor chip, and a memory chip disposed on the package substrate and electrically connected to the first image sensor chip through the connection substrate. A distance between the first image sensor chip and the second image sensor chip is less than a thickness of the first image sensor chip.
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公开(公告)号:US11735566B2
公开(公告)日:2023-08-22
申请号:US17375511
申请日:2021-07-14
Applicant: SAMSUNG ELECTRONICS CO., LTD.
Inventor: Ohguk Kwon , Namhoon Kim , Hyoeun Kim , Sunkyoung Seo
IPC: H01L25/065 , H01L23/538
CPC classification number: H01L25/0657 , H01L23/5384 , H01L23/5385 , H01L23/5386
Abstract: A semiconductor package including a substrate; a first semiconductor chip on the substrate; a second semiconductor chip on the first semiconductor chip; and at least one connection terminal between the first semiconductor chip and the second semiconductor chip, wherein the first semiconductor chip includes a first semiconductor chip body; and at least one upper pad on a top surface of the first semiconductor chip body and in contact with the at least one connection terminal, the at least one upper pad includes a recess that is downwardly recessed from a top surface thereof, and a depth of the recess is less than a thickness of the at least one upper pad.
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公开(公告)号:US11710757B2
公开(公告)日:2023-07-25
申请号:US17227650
申请日:2021-04-12
Applicant: SAMSUNG ELECTRONICS CO., LTD.
Inventor: Ohguk Kwon , Hyoeun Kim , Sunkyoung Seo , Sang-Uk Han
IPC: H01L27/146 , H01L23/00 , H01L23/48
CPC classification number: H01L27/14634 , H01L23/481 , H01L24/08 , H01L24/73 , H01L24/89 , H01L27/1469 , H01L27/14627 , H01L2224/08146 , H01L2224/73204 , H01L2224/80895 , H01L2224/80896
Abstract: Disclosed are semiconductor packages and methods of fabricating the same. The semiconductor package comprises a molding layer, a silicon layer on the molding layer, a glass upwardly spaced apart from the silicon layer, and a connection dam coupled to the silicon layer and connecting the silicon layer to the glass. The silicon layer includes a silicon layer body, a silicon layer via extending vertically in the silicon layer body, and a micro-lens array on a top surface of the silicon layer body. A bottom surface of the silicon layer body contacts a top surface of the molding layer. The molding layer includes a molding layer body, a molding layer via that extends vertically in the molding layer body and has electrical connection with the silicon layer via, and a connection ball connected to a bottom surface of the molding layer via.
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公开(公告)号:US20220216186A1
公开(公告)日:2022-07-07
申请号:US17705872
申请日:2022-03-28
Applicant: Samsung Electronics Co., Ltd.
Inventor: Sanguk Han , Chajea Jo , Hyoeun Kim , Sunkyoung Seo
IPC: H01L25/065 , H01L23/00 , H01L23/31
Abstract: A package-on-package type package includes a lower semiconductor package and an upper semiconductor package. The lower semiconductor package includes a first semiconductor device including a through electrode, a second semiconductor device disposed on the first semiconductor device and including a second through electrode electrically connected to the first through electrode, a first molding member covering a sidewall of at least one of the first semiconductor device and the second semiconductor device, a second molding member covering a sidewall of the first molding member, and an upper redistribution layer disposed on the second semiconductor device and electrically connected to the second through electrode.
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公开(公告)号:US11222873B2
公开(公告)日:2022-01-11
申请号:US16936882
申请日:2020-07-23
Applicant: Samsung Electronics Co., Ltd.
Inventor: Joonho Jun , Un-Byoung Kang , Sunkyoung Seo , Jongho Lee , Young Kun Jee
IPC: H01L25/065 , H01L23/00
Abstract: A semiconductor package may include first and second substrates, which are vertically stacked, a semiconductor device layer on a bottom surface of the second substrate to face a top surface of the first substrate, upper chip pads and an upper dummy pad on the top surface of the first substrate, penetration electrodes, which each penetrate the first substrate and are connected to separate, respective upper chip pads, lower chip pads on a bottom surface of the semiconductor device layer and electrically connected to separate, respective upper chip pads, and a lower dummy pad on the bottom surface of the semiconductor device layer and electrically isolated from the upper dummy pad. A distance between the upper and lower dummy pads in a horizontal direction that is parallel to the first substrate may be smaller than a diameter of the lower dummy pad.
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公开(公告)号:US20240128236A1
公开(公告)日:2024-04-18
申请号:US18359031
申请日:2023-07-26
Applicant: Samsung Electronics Co., Ltd.
Inventor: Hyoeun Kim , Dohyun Kim , Sunkyoung Seo
IPC: H01L25/065 , H01L21/66 , H01L23/00
CPC classification number: H01L25/0657 , H01L22/32 , H01L24/05 , H01L24/06 , H01L24/08 , H01L24/09 , H01L24/16 , H01L24/32 , H01L24/73 , H01L24/80 , H01L2224/05073 , H01L2224/05124 , H01L2224/05147 , H01L2224/0603 , H01L2224/08059 , H01L2224/08145 , H01L2224/09055 , H01L2224/09515 , H01L2224/16227 , H01L2224/32225 , H01L2224/73204 , H01L2224/80203 , H01L2224/80895 , H01L2224/80896 , H01L2225/06517 , H01L2225/06541 , H01L2924/37001
Abstract: A semiconductor package includes a first semiconductor chip and a second semiconductor chip on the first semiconductor chip. The first semiconductor chip includes a first wiring layer on a first substrate, and a first passivation layer on the first wiring layer and that exposes at least portions of first bonding pads and a first test pad that are on the second wiring layer. The second semiconductor chip includes a second wiring layer on a second substrate and a second passivation layer on the second wiring layer and that exposes at least portions of third bonding pads and second test pad that are provided on the second wiring layer. The first bonding pads and respective ones of the third bonding pads are directly bonded to each other. The first passivation layer and the second passivation layer are directly bonded to each other.
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公开(公告)号:US11948851B2
公开(公告)日:2024-04-02
申请号:US17332471
申请日:2021-05-27
Applicant: Samsung Electronics Co., Ltd.
Inventor: Sunjae Kim , Eunsil Kang , Daehyun Kim , Sunkyoung Seo
IPC: H01L23/31 , H01L23/00 , H01L23/29 , H01L23/498 , H01L25/065 , H01L25/18 , H01L21/56
CPC classification number: H01L23/3192 , H01L23/295 , H01L23/3128 , H01L23/3185 , H01L23/49827 , H01L24/16 , H01L24/17 , H01L24/73 , H01L24/94 , H01L24/97 , H01L25/0657 , H01L25/18 , H01L21/561 , H01L24/02 , H01L24/05 , H01L24/13 , H01L2224/02331 , H01L2224/02372 , H01L2224/02381 , H01L2224/0557 , H01L2224/06519 , H01L2224/13024 , H01L2224/16145 , H01L2224/16146 , H01L2224/16235 , H01L2224/17181 , H01L2224/17519 , H01L2224/2929 , H01L2224/29386 , H01L2224/29499 , H01L2224/73204 , H01L2225/06513 , H01L2225/06541 , H01L2225/06568 , H01L2225/06589 , H01L2924/181 , H01L2924/1815 , H01L2924/18161
Abstract: A semiconductor package includes a first semiconductor chip on a wiring structure, a plurality of internal terminals between the wiring structure and the first semiconductor chip; a high thermal conductivity layer is between the wiring structure and the first semiconductor chip; and an encapsulator on the high thermal conductivity layer and contacting the second semiconductor chip. Sidewalls of at least the wiring structure and the encapsulator are substantially coplanar.
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公开(公告)号:US11935873B2
公开(公告)日:2024-03-19
申请号:US18176058
申请日:2023-02-28
Applicant: Samsung Electronics Co., Ltd.
Inventor: Joonho Jun , Un-Byoung Kang , Sunkyoung Seo , Jongho Lee , Young Kun Jee
IPC: H01L25/065 , H01L23/00
CPC classification number: H01L25/0657 , H01L24/06 , H01L24/14 , H01L2224/0401 , H01L2224/06181 , H01L2224/06515 , H01L2225/06513
Abstract: A semiconductor package may include first and second substrates, which are vertically stacked, a semiconductor device layer on a bottom surface of the second substrate to face a top surface of the first substrate, upper chip pads and an upper dummy pad on the top surface of the first substrate, penetration electrodes, which each penetrate the first substrate and are connected to separate, respective upper chip pads, lower chip pads on a bottom surface of the semiconductor device layer and electrically connected to separate, respective upper chip pads, and a lower dummy pad on the bottom surface of the semiconductor device layer and electrically isolated from the upper dummy pad. A distance between the upper and lower dummy pads in a horizontal direction that is parallel to the first substrate may be smaller than a diameter of the lower dummy pad.
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