Plasma Uniformity Control By Gas Diffuser Hole Design
    22.
    发明申请
    Plasma Uniformity Control By Gas Diffuser Hole Design 有权
    通过气体扩散器孔设计的等离子体均匀性控制

    公开(公告)号:US20110290183A1

    公开(公告)日:2011-12-01

    申请号:US13207227

    申请日:2011-08-10

    IPC分类号: C23C16/455

    摘要: Embodiments of a gas diffuser plate for distributing gas in a processing chamber are provided. The gas distribution plate includes a diffuser plate having an upstream side and a downstream side, and a plurality of gas passages passing between the upstream and downstream sides of the diffuser plate. The gas passages include hollow cathode cavities at the downstream side to enhance plasma ionization. The depths, the diameters, the surface area and density of hollow cathode cavities of the gas passages that extend to the downstream end can be gradually increased from the center to the edge of the diffuser plate to improve the film thickness and property uniformity across the substrate. The increasing diameters, depths and surface areas from the center to the edge of the diffuser plate can be created by bending the diffuser plate toward downstream side, followed by machining out the convex downstream side. Bending the diffuser plate can be accomplished by a thermal process or a vacuum process. The increasing diameters, depths and surface areas from the center to the edge of the diffuser plate can also be created computer numerically controlled machining. Diffuser plates with gradually increasing diameters, depths and surface areas of the hollow cathode cavities from the center to the edge of the diffuser plate have been shown to produce improved uniformities of film thickness and film properties.

    摘要翻译: 提供了用于在处理室中分配气体的气体扩散板的实施例。 气体分配板包括具有上游侧和下游侧的扩散板,以及在扩散板的上游侧和下游侧之间通过的多个气体通路。 气体通道包括在下游侧的中空阴极腔,以增强等离子体电离。 延伸到下游端的气体通道的空心阴极腔的深度,直径,表面积和密度可以从扩散板的中心到边缘逐渐增加,以改善衬底上的膜厚度和性能均匀性 。 从扩散板的中心到边缘的直径,深度和表面积的增加可以通过向下游侧弯曲扩散板,然后在凸出的下游侧加工出来。 扩散板的弯曲可以通过热处理或真空工艺来实现。 从扩散板的中心到边缘的直径,深度和表面积的增加也可以用计算机数字控制加工。 具有从扩散板的中心到边缘的中空阴极腔的直径逐渐增加,深度和表面积逐渐增大的扩散板已被证明可以产生改善的膜厚度和膜性质的均匀性。

    CHAMBER IDLE PROCESS FOR IMPROVED REPEATABILITY OF FILMS
    23.
    发明申请
    CHAMBER IDLE PROCESS FOR IMPROVED REPEATABILITY OF FILMS 审中-公开
    改进膜片可重复性的室内空白过程

    公开(公告)号:US20080292811A1

    公开(公告)日:2008-11-27

    申请号:US11753571

    申请日:2007-05-25

    IPC分类号: C23C16/00 H05H1/24

    摘要: Methods and apparatus for improving the substrate-to-substrate uniformity of silicon-containing films deposited by vapor deposition of precursors vaporized from a liquid source on substrates in a chamber are provided. The methods include exposing a chamber to a processing step at a predetermined time that is after one substrate is processed in the chamber and is before the next substrate is processed in the chamber. In one aspect, the processing step includes introducing a flow of a silicon-containing precursor into the chamber for a period of time. In another aspect, the processing step includes exposing the chamber to a gas in the presence or absence of a plasma for a period of time.

    摘要翻译: 提供了用于改善通过气相沉积从液体源在室中的基板上蒸发的前体沉积的含硅膜的基板到基板均匀性的方法和装置。 所述方法包括在室中处理一个衬底之后的预定时间并且在腔室中处理下一个衬底之前将腔室暴露于处理步骤。 在一个方面,处理步骤包括将含硅前体的流动引入室中一段时间​​。 在另一方面,所述处理步骤包括在存在或不存在等离子体的情况下将所述室暴露于气体一段时间。

    APPARATUS AND METHOD FOR DEPOSITION OVER LARGE AREA SUBSTRATES
    24.
    发明申请
    APPARATUS AND METHOD FOR DEPOSITION OVER LARGE AREA SUBSTRATES 审中-公开
    大面积沉积物沉积的装置和方法

    公开(公告)号:US20080282982A1

    公开(公告)日:2008-11-20

    申请号:US12039613

    申请日:2008-02-28

    IPC分类号: C23C16/50

    摘要: The present invention generally relates to an inductively coupled plasma apparatus. When depositing utilizing a plasma generated from a showerhead, the plasma may not be evenly distributed to the edge of the substrate. By inductively coupling plasma to the chamber in an area corresponding to the chamber walls, the plasma distribution within the chamber may be evenly distributed and deposition upon the substrate may be substantially even. By vaporizing the processing gas prior to entry into the processing chamber, the plasma may also be even and thus contribute to an even deposition on the substrate.

    摘要翻译: 本发明一般涉及电感耦合等离子体装置。 当利用从喷头产生的等离子体进行沉积时,等离子体可能不均匀地分布到基板的边缘。 通过在对应于室壁的区域中将等离子体电感耦合到腔室,室内的等离子体分布可以均匀分布,并且在衬底上的沉积可以基本上均匀。 通过在进入处理室之前汽化处理气体,等离子体也可以是均匀的并且因此有助于在衬底上的均匀沉积。

    Shadow frame with cross beam for semiconductor equipment
    27.
    发明授权
    Shadow frame with cross beam for semiconductor equipment 有权
    用于半导体设备的横梁的阴影框架

    公开(公告)号:US08002896B2

    公开(公告)日:2011-08-23

    申请号:US11248385

    申请日:2005-10-11

    摘要: A shadow frame and framing system for semiconductor fabrication equipment comprising a rectangular frame having four edges, the edges forming an interior lip with a top surface and an bottom engagement surface; and a cross beam disposed between at least two edges of the frame, the cross beam having a top surface and a bottom engagement surface, the engagement surface of the cross beam configured to be flush with the engagement surface of the lip; wherein one or more of the engagement surfaces are configured to cover metal interconnect bonding areas on a carrier disposed below the frame. The shadow frame is particularly useful in plasma enhanced chemical vapor deposition (PECVD) applications used to make active matrix liquid crystal displays (AMLCDs) and solar cells.

    摘要翻译: 一种用于半导体制造设备的阴影框架和框架系统,包括具有四个边缘的矩形框架,所述边缘形成具有顶部表面和底部接合表面的内部唇部; 以及设置在所述框架的至少两个边缘之间的横梁,所述横梁具有顶表面和底部接合表面,所述横梁的接合表面被配置为与所述唇缘的接合表面齐平; 其中所述接合表面中的一个或多个构造成覆盖设置在所述框架下方的载体上的金属互连结合区域。 阴影框架在用于制造有源矩阵液晶显示器(AMLCD)和太阳能电池的等离子体增强化学气相沉积(PECVD)应用中特别有用。

    Methods and apparatus for reducing arcing during plasma processing
    28.
    发明授权
    Methods and apparatus for reducing arcing during plasma processing 失效
    在等离子体处理期间减少电弧的方法和装置

    公开(公告)号:US07501161B2

    公开(公告)日:2009-03-10

    申请号:US10858267

    申请日:2004-06-01

    IPC分类号: H05H1/24 C23C16/50

    摘要: In a first aspect, a method is provided for use during plasma processing. The first method includes the steps of (1) placing a substrate on a substrate holder of a plasma chamber; (2) positioning a cover frame adjacent and below a perimeter of the substrate; and (3) employing the cover frame to reduce arcing during plasma processing within the plasma chamber. Numerous other aspects are provided.

    摘要翻译: 在第一方面,提供了一种在等离子体处理期间使用的方法。 第一种方法包括以下步骤:(1)将衬底放置在等离子体室的衬底保持器上; (2)将盖框架定位在所述基板的周边附近和下方; 和(3)采用盖框架来减小等离子体室内的等离子体处理期间的电弧。 提供了许多其他方面。

    Shadow frame with cross beam for semiconductor equipment
    29.
    发明授权
    Shadow frame with cross beam for semiconductor equipment 有权
    用于半导体设备的横梁的阴影框架

    公开(公告)号:US06960263B2

    公开(公告)日:2005-11-01

    申请号:US10136249

    申请日:2002-04-25

    摘要: A shadow frame and framing system for semiconductor fabrication equipment comprising a rectangular frame having four edges, the edges forming an interior lip with a top surface and an bottom engagement surface; and a cross beam disposed between at least two edges of the frame, the cross beam having a top surface and a bottom engagement surface, the engagement surface of the cross beam configured to be flush with the engagement surface of the lip; wherein one or more of the engagement surfaces are configured to cover metal interconnect bonding areas on a carrier disposed below the frame. The shadow frame is particularly useful in plasma enhanced chemical vapor deposition (PECVD) applications used to make active matrix liquid crystal displays (AMLCDs) and solar cells.

    摘要翻译: 一种用于半导体制造设备的阴影框架和框架系统,包括具有四个边缘的矩形框架,所述边缘形成具有顶部表面和底部接合表面的内部唇部; 以及设置在所述框架的至少两个边缘之间的横梁,所述横梁具有顶表面和底部接合表面,所述横梁的接合表面被配置为与所述唇缘的接合表面齐平; 其中所述接合表面中的一个或多个构造成覆盖设置在所述框架下方的载体上的金属互连结合区域。 阴影框架在用于制造有源矩阵液晶显示器(AMLCD)和太阳能电池的等离子体增强化学气相沉积(PECVD)应用中特别有用。