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公开(公告)号:US20250068861A1
公开(公告)日:2025-02-27
申请号:US18385344
申请日:2023-10-30
Applicant: Silicon Storage Technology, Inc.
Inventor: Hieu Van Tran , Stephen Trinh , Hoa Vu , Stanley Hong , Thuan Vu
IPC: G06J1/00
Abstract: Numerous examples are disclosed of input blocks for an array of non-volatile memory cells and associated methods. In one example, a system comprises a vector-by-matrix multiplication array comprising non-volatile memory cells arranged into rows and columns; and an input block comprising a plurality of row circuits and a global digital-to-analog converter generator to generate 2m different analog voltages, where m is an integer; wherein the row circuits in the plurality of row circuits respectively apply one of the 2m different analog voltages to an associated row in the array.
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公开(公告)号:US12200926B2
公开(公告)日:2025-01-14
申请号:US17949962
申请日:2022-09-21
Applicant: Silicon Storage Technology, Inc.
Inventor: Hieu Van Tran , Steven Lemke , Vipin Tiwari , Nhan Do , Mark Reiten
IPC: H10B41/42 , G06N3/08 , G11C16/04 , H01L29/788
Abstract: Numerous examples of an input function circuit block and an output neuron circuit block coupled to a vector-by-matrix multiplication (VMM) array in an artificial neural network are disclosed. In one example, an artificial neural network comprises a vector-by-matrix multiplication array comprising a plurality of non-volatile memory cells organized into rows and columns; an input function circuit block to receive digital input signals, convert the digital input signals into analog signals, and apply the analog signals to control gate terminals of non-volatile memory cells in one or more rows of the array during a programming operation; and an output neuron circuit block to receive analog currents from the columns of the array during a read operation and generate an output signal.
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公开(公告)号:US12176039B2
公开(公告)日:2024-12-24
申请号:US18140103
申请日:2023-04-27
Applicant: Silicon Storage Technology, Inc.
Inventor: Hieu Van Tran , Stanley Hong , Stephen Trinh , Thuan Vu , Steven Lemke , Vipin Tiwari , Nhan Do
Abstract: In one example, a method comprises determining a program resolution current value; and setting levels for a programming operation of a plurality of non-volatile memory cells in a neural network array such that a delta current between levels of each pair of adjacent cells in the plurality is a multiple of the program resolution current value.
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公开(公告)号:US20240339136A1
公开(公告)日:2024-10-10
申请号:US18206488
申请日:2023-06-06
Applicant: Silicon Storage Technology, Inc.
Inventor: Kha Nguyen , Anh Ly , Hieu Van Tran , Hien Pham , Henry Tran
CPC classification number: G11C7/1039 , G11C7/12
Abstract: Numerous examples are disclosed of a row address decoding scheme. In one example, a memory system comprises m banks of non-volatile memory cells, the m banks respectively comprising n or fewer sectors and the sectors respectively comprising p rows, and a row decoder to receive a row address comprising r bits and to identify (i) a row using the least significant t bits in the r bits, (ii) a bank using the next u least significant bits, and (iii) a sector using the next v least significant bits, where m≤2u, n≤2v, and p≤2t.
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355.
公开(公告)号:US20240312517A1
公开(公告)日:2024-09-19
申请号:US18419079
申请日:2024-01-22
Applicant: Silicon Storage Technology, Inc.
Inventor: Hieu Van Tran , Thuan Vu , Stephen Trinh , Stanley Hong , Anh Ly , Steven Lemke , Vipin Tiwari , Nhan Do
CPC classification number: G11C11/54 , G06N3/065 , G11C16/0483 , G11C16/08 , G11C16/10 , G11C16/16 , G11C16/3418 , G11C2216/04
Abstract: In one example, a method comprises erasing at the same time a word of non-volatile memory cells in an array of non-volatile memory cells arranged into rows and columns, each non-volatile memory cell comprising a word line terminal, a bit line terminal, and an erase gate terminal, by turning on an erase gate enable transistor coupled to erase gate terminals of the word of non-volatile memory cells.
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公开(公告)号:US12080355B2
公开(公告)日:2024-09-03
申请号:US17481225
申请日:2021-09-21
Applicant: Silicon Storage Technology, Inc.
Inventor: Viktor Markov , Alexander Kotov
CPC classification number: G11C16/26 , G11C16/0425 , G11C16/14 , G11C16/3431
Abstract: A memory device and method for a non-volatile memory cell having a gate that includes programming the memory cell to an initial program state corresponding to a target read current and a threshold voltage, including applying a program voltage having a first value to the gate, storing the first value in a memory, reading the memory cell in a first read operation using a read voltage applied to the gate that is less than the target threshold voltage to generate a first read current, and subjecting the memory cell to additional programming in response to determining that the first read current is greater than the target read current. The additional programming includes retrieving the first value from the memory, determining a second value greater than the first value, and programming the selected non-volatile memory cell that includes applying a program voltage having the second value to the gate.
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公开(公告)号:US20240282369A1
公开(公告)日:2024-08-22
申请号:US18645184
申请日:2024-04-24
Applicant: Silicon Storage Technology, Inc.
Inventor: Hieu Van Tran , Steven Lemke , Vipin Tiwari , Nhan Do , Mark Reiten
IPC: G11C11/54 , G06N3/045 , G11C16/04 , G11C16/10 , G11C16/14 , H01L29/423 , H01L29/788 , H10B41/30
CPC classification number: G11C11/54 , G06N3/045 , G11C16/0483 , G11C16/10 , G11C16/14 , H01L29/42324 , H01L29/42328 , H01L29/7883 , H10B41/30
Abstract: A neural network device with synapses having memory cells each having a floating gate and a first gate over first and second portions of a channel region disposed between source and drain regions, and a second gate over the floating gate or the source region. First lines each electrically connect the first gates in one of the memory cell rows, second lines each electrically connect the second gates in one of the memory cell rows, third lines each electrically connect the source regions in one of the memory cell rows, and fourth lines each electrically connect the drain regions in one of the memory cell columns. The synapses receive a first plurality of inputs as electrical voltages on the fourth lines, and provide a first plurality of outputs as electrical currents on the third lines.
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公开(公告)号:US20240274591A1
公开(公告)日:2024-08-15
申请号:US18110318
申请日:2023-02-15
Applicant: Silicon Storage Technology, Inc.
Inventor: Jinho KIM , CYNTHIA FUNG , PARVIZ GHAZAVI , JEAN FRANCOIS THIERY , CATHERINE DECOBERT , GILLES FESTES , BRUNO VILLARD , YURI TKACHEV , XIAN LIU , NHAN DO
CPC classification number: H01L27/0207 , H01L21/38 , H01L23/585
Abstract: A semiconductor device includes a semiconductor substrate, a first module of circuitry formed on the semiconductor substrate, a second module of circuitry formed on the semiconductor substrate, and a communication ring that encircles the first module of circuitry. The communication ring includes an insulation material disposed over the semiconductor substrate, a plurality of electrical connectors disposed over the semiconductor substrate and extending across a width of the communication ring, and a conductive diffusion in the semiconductor substrate that encircles the first module of circuitry.
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359.
公开(公告)号:US12056601B2
公开(公告)日:2024-08-06
申请号:US16830733
申请日:2020-03-26
Applicant: Silicon Storage Technology, Inc.
Inventor: Hieu Van Tran , Steven Lemke , Vipin Tiwari , Nhan Do , Mark Reiten
IPC: G06F1/03 , G06F7/78 , G06F11/16 , G06F17/16 , G06N3/065 , G11C11/54 , G11C11/56 , G11C13/00 , G11C29/44
CPC classification number: G06N3/065 , G06F1/03 , G06F7/78 , G06F11/1666 , G06F17/16 , G11C11/54 , G11C11/5635 , G11C13/0021 , G11C29/44
Abstract: Numerous embodiments are provided for compensating for drift error in non-volatile memory cells within a VMM array in an analog neuromorphic memory system. For example, in one embodiment, a circuit is provided for compensating for drift error during a read operation, the circuit comprising a data drift monitoring circuit coupled to the array for generating an output indicative of data drift; and a bitline compensation circuit for generating a compensation current in response to the output from the data drift monitoring circuit and injecting the compensation current into one or more bitlines of the array.
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360.
公开(公告)号:US11968829B2
公开(公告)日:2024-04-23
申请号:US17834746
申请日:2022-06-07
Applicant: Silicon Storage Technology, Inc.
Inventor: Zhuoqiang Jia , Leo Xing , Xian Liu , Serguei Jourba , Nhan Do
IPC: H10B41/42 , H01L21/28 , H01L29/423 , H01L29/66 , H01L29/788
CPC classification number: H10B41/42 , H01L29/40114 , H01L29/42328 , H01L29/66825 , H01L29/7883
Abstract: A method includes recessing an upper surface of a substrate in first and second areas relative to a third area, forming a first conductive layer in the first area, forming a second conductive layer in the three areas, selectively removing the first and second conductive layers in the first area, while maintaining the second conductive layer in the second and third areas, leaving pairs of stack structures in the first area respectively having a control gate of the second conductive layer and a floating gate of the first conductive layer, forming a third conductive layer in the three areas, recessing the upper surface of the third conductive layer below tops of the stack structures and removing the third conductive layer from the second and third areas, removing the second conductive layer from the second and third areas, and forming blocks of metal material in the second and third areas.
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