CMOS-compatible InP/InGaAs digital photoreceiver
    31.
    发明授权
    CMOS-compatible InP/InGaAs digital photoreceiver 失效
    CMOS兼容InP / InGaAs数字光电接收器

    公开(公告)号:US5684308A

    公开(公告)日:1997-11-04

    申请号:US601904

    申请日:1996-02-15

    IPC分类号: H01L27/144 H01L31/0232

    CPC分类号: H01L27/1443

    摘要: A digital photoreceiver is formed monolithically on an InP semiconductor substrate and comprises a p-i-n photodetector formed from a plurality of InP/InGaAs layers deposited by an epitaxial growth process and an adjacent heterojunction bipolar transistor (HBT) amplifier formed from the same InP/InGaAs layers. The photoreceiver amplifier operates in a large-signal mode to convert a detected photocurrent signal into an amplified output capable of directly driving integrated circuits such as CMOS. In combination with an optical transmitter, the photoreceiver may be used to establish a short-range channel of digital optical communications between integrated circuits with applications to multi-chip modules (MCMs). The photoreceiver may also be used with fiber optic coupling for establishing longer-range digital communications (i.e. optical interconnects) between distributed computers or the like. Arrays of digital photoreceivers may be formed on a common substrate for establishing a plurality of channels of digital optical communication, with each photoreceiver being spaced by less than about 1 mm and consuming less than about 20 mW of power, and preferably less than about 10 mW. Such photoreceiver arrays are useful for transferring huge amounts of digital data between integrated circuits at bit rates of up to about 1000 Mb/s or more.

    摘要翻译: 数字光接收器在InP半导体衬底上单片形成,并且包括由通过外延生长工艺沉积的多个InP / InGaAs层和由相同InP / InGaAs层形成的相邻异质结双极晶体管(HBT)放大器形成的p-i-n光电检测器。 光接收放大器工作在大信号模式,以将检测到的光电流信号转换成能够直接驱动诸如CMOS的集成电路的放大输出。 结合光发射机,光接收器可用于建立集成电路与多芯片模块(MCM)应用之间的数字光通信的短距离通道。 光接收器还可以与光纤耦合一起使用,用于在分布式计算机之间建立较长范围的数字通信(即光学互连)等。 数字光接收器的阵列可以形成在公共衬底上,用于建立多个数字光通信通道,每个光接收器间隔小于约1mm,消耗小于约20mW的功率,优选小于约10mW 。 这样的光接收器阵列可用于以高达约1000Mb / s或更高的比特率在集成电路之间传送大量的数字数据。

    Symmetric self-aligned processing
    32.
    发明授权
    Symmetric self-aligned processing 失效
    对称自对准处理

    公开(公告)号:US5318916A

    公开(公告)日:1994-06-07

    申请号:US923254

    申请日:1992-07-31

    摘要: A method of manufacturing a semiconductor device using simplified processing and eliminating and/or minimizing the extrinsic parasitic elements of the device. The method is particularly suited for manufacturing heterojunction bipolar transistors where the extrinsic parasitic base resistance and the extrinsic parasitic base-collector and base-emitter capacitances can be virtually eliminated and the base contact resistance can be greatly reduced. The method includes formming symmetric emitter and collector portions using front and backside processing of the wafer, respectively. The symmetric emitter and collector virtually eliminates the extrinsic collector and emitter regions of the device thereby virtually eliminating the extrinsic base-collector and base-emitter capacitance. The extrinsic base contact region may also be increased to minimize the base contact resistance without increasing parasitic capacitive elements of the device. Self-aligned processing features are also included to form self-aligned contacts to the base layer thereby virtually eliminating the extrinsic base resistance. The method may include building up the collector and emitter contacts to separate the emitter and collector interconnections from the base layer to avoid increasing the emitter-base and collector-base extrinsic parasitic capacitances and to minimize associated resistances and inductances. The method may further include forming etch stop layers to facilitate removing of the substrate to perform the backside processing and to accurately etch through the collector layer without etching the base layer.

    摘要翻译: 使用简化处理制造半导体器件的方法,并且消除和/或最小化器件的外在寄生元件。 该方法特别适用于制造异质结双极晶体管,其中可以实际上消除外部寄生基极电阻和外部寄生基极集电极和基极 - 发射极电容,并且可大大降低基极接触电阻。 该方法包括分别使用晶片的正面和背面处理来形成对称的发射极和集电极部分。 对称发射极和集电极实际上消除了器件的非本征集电极和发射极区域,从而实际上消除了外部基极集电极和基极 - 发射极电容。 也可以增加非本征基极接触区域以使基极接触电阻最小化,而不增加器件的寄生电容元件。 还包括自对准处理特征以形成与基层的自对准接触,从而实际上消除了外部基极电阻。 该方法可以包括建立集电极和发射极触点以将发射极和集电极互连与基极层分离,以避免增加发射极 - 基极和集电极 - 基极外部寄生电容并且使相关联的电阻和电感最小化。 该方法还可以包括形成蚀刻停止层以便于去除衬底以执行背面处理,并且在不蚀刻基底层的情况下精确地蚀刻通过集电极层。