Pen input device with battery and operating method thereof

    公开(公告)号:US11526218B2

    公开(公告)日:2022-12-13

    申请号:US16978915

    申请日:2020-08-06

    Abstract: A pen input device is provided, including a housing including a front opening and a rear opening; a pen input generator including a pen tip disposed in the front opening, the pen input generator generating a position signal and a pen pressure signal of the pen input device; a battery; a PCB; a support on which at least a part of the pen input generator, the battery, and the PCB are disposed; a conductive member electrically connecting the PCB and the battery; a buffer disposed in the rear opening; and a polymer that fills in an inner space of the housing. The support includes a support plate extended in a direction toward the rear opening from the front opening of the housing, and a first partition, a second partition, and a third partition, which protrude from the support plate and are sequentially spaced.

    THREE DIMENSIONAL SEMICONDUCTOR MEMORY DEVICES AND METHODS OF FORMING THE SAME
    38.
    发明申请
    THREE DIMENSIONAL SEMICONDUCTOR MEMORY DEVICES AND METHODS OF FORMING THE SAME 有权
    三维半导体存储器件及其形成方法

    公开(公告)号:US20140099761A1

    公开(公告)日:2014-04-10

    申请号:US14061304

    申请日:2013-10-23

    Abstract: Provided are three-dimensional semiconductor memory devices and methods of forming the same. The device includes a substrate, conductive patterns stacked on the substrate, and an active pattern penetrating the conductive patterns to be connected to the substrate. The active pattern may include a first doped region provided in an upper portion of the active pattern, and a diffusion-resistant doped region overlapped with at least a portion of the first doped region. The diffusion-resistant doped region may be a region doped with carbon.

    Abstract translation: 提供三维半导体存储器件及其形成方法。 该器件包括衬底,堆叠在衬底上的导电图案,以及穿透要连接到衬底的导电图案的有源图案。 有源图案可以包括设置在有源图案的上部的第一掺杂区域和与第一掺杂区域的至少一部分重叠的扩散阻抗掺杂区域。 扩散阻止掺杂区域可以是掺杂有碳的区域。

    INTEGRATED CIRCUIT DEVICE
    39.
    发明申请

    公开(公告)号:US20250169152A1

    公开(公告)日:2025-05-22

    申请号:US18796604

    申请日:2024-08-07

    Abstract: An integrated circuit device includes a substrate provided with a fin-type active region which is disposed at a first surface of the substrate, a plurality of nanosheets disposed on a top surface of the fin-type active region and separated from the top surface of the fin-type active region, a gate line disposed on the fin-type active region, the gate line surrounding each of the plurality of nanosheets, a source/drain region disposed on the fin-type active region, a sidewall of the source/drain region being adjacent to the gate line and in contact with the plurality of nanosheets, a backside contact extending from a second surface of the substrate toward a lower portion of the source/drain region, and a high-concentration doped layer disposed in the lower portion of the source/drain region. The high-concentration doped layer has a dopant concentration greater than a dopant concentration of the source/drain region.

    Semiconductor device including air gap regions below source/drain regions

    公开(公告)号:US12268022B2

    公开(公告)日:2025-04-01

    申请号:US17714695

    申请日:2022-04-06

    Abstract: A semiconductor device includes a substrate having an active region extending in a first direction; a gate structure disposed on the substrate, intersecting the active region, and extending in a second direction; channel layers disposed on the active region to be spaced apart from each other in a third direction, perpendicular to an upper surface of the substrate, and to be surrounded by the gate structure; source/drain regions disposed on both sides of the gate structure and connected to the channel layers; air gap regions located between the source/drain regions and the active region and spaced apart from each other in the third direction; and semiconductor layers alternately disposed with the air gap regions in the third direction and defining the air gap regions, wherein lower ends of the source/drain regions are located on a level lower than an uppermost air gap region.

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