Element structure, inertia sensor, and electronic device
    31.
    发明授权
    Element structure, inertia sensor, and electronic device 有权
    元件结构,惯性传感器和电子设备

    公开(公告)号:US08950259B2

    公开(公告)日:2015-02-10

    申请号:US13115580

    申请日:2011-05-25

    申请人: Shigekazu Takagi

    发明人: Shigekazu Takagi

    摘要: The manufacturing of an element structure including two or more sensor element is to be facilitated. An element structure includes a first substrate including a first support layer and a first sensor element disposed on the first support layer and a second substrate including a second support layer and a second sensor element disposed on the second support layer, wherein the second substrate is disposed on the first substrate via a spacer member in a state in which the first sensor element and the second sensor element are disposed to face each other.

    摘要翻译: 促进包括两个或更多个传感器元件的元件结构的制造。 元件结构包括第一衬底,其包括第一支撑层和设置在第一支撑层上的第一传感器元件,以及第二衬底,其包括第二支撑层和设置在第二支撑层上的第二传感器元件,其中第二衬底被布置 在第一传感器元件和第二传感器元件彼此相对配置的状态下经由间隔件在第一基板上。

    Accelerometer with Low Sensitivity to Thermo-Mechanical Stress
    32.
    发明申请
    Accelerometer with Low Sensitivity to Thermo-Mechanical Stress 有权
    对热机械应力灵敏度低的加速度计

    公开(公告)号:US20140230550A1

    公开(公告)日:2014-08-21

    申请号:US13770726

    申请日:2013-02-19

    IPC分类号: G01P15/125

    CPC分类号: G01P15/125 G01P2015/0814

    摘要: The invention relates to a microelectro-mechanical structure (MEMS), and more particularly, to systems, devices and methods of compensating effect of thermo-mechanical stress on a micro-machined accelerometer by incorporating and adjusting elastic elements to couple corresponding sensing electrodes. The sensing electrodes comprise moveable electrodes and stationary electrodes that are respectively coupled on a proof mass and a substrate. At least one elastic element is incorporated into a coupling structure that couples two stationary electrodes or couples a stationary electrode to at least one anchor. More than one elastic element may be incorporated. The number, locations, configurations and geometries of the elastic elements are adjusted to compensate an output offset and a sensitivity drift that are induced by the thermo-mechanical stress accumulated in the MEMS device.

    摘要翻译: 本发明涉及微电子机械结构(MEMS),更具体地说,涉及通过结合并调整弹性元件以耦合对应的检测电极来补偿热机械应力对微加工加速度计的影响的系统,装置和方法。 感测电极包括分别耦合在检测质量块和基板上的可移动电极和固定电极。 至少一个弹性元件被结合到联接结构中,耦合结构耦合两个固定电极或将固定电极耦合到至少一个锚。 可以并入多于一个的弹性元件。 调整弹性元件的数量,位置,构造和几何形状以补偿由MEMS器件中积累的热机械应力引起的输出偏移和灵敏度漂移。

    Temperature-compensated micro-electromechanical device, and method of temperature compensation in a micro-electromechanical device
    33.
    发明授权
    Temperature-compensated micro-electromechanical device, and method of temperature compensation in a micro-electromechanical device 有权
    温度补偿微机电装置,以及微机电装置中的温度补偿方法

    公开(公告)号:US08733170B2

    公开(公告)日:2014-05-27

    申请号:US12683888

    申请日:2010-01-07

    IPC分类号: G01P15/08 G01P21/00

    摘要: A micro-electromechanical device includes a semiconductor substrate, in which a first microstructure and a second microstructure of reference are integrated. The first microstructure and the second microstructure are arranged in the substrate so as to undergo equal strains as a result of thermal expansions of the substrate. Furthermore, the first microstructure is provided with movable parts and fixed parts with respect to the substrate, while the second microstructure has a shape that is substantially symmetrical to the first microstructure but is fixed with respect to the substrate. By subtracting the changes in electrical characteristics of the second microstructure from those of the first, variations in electrical characteristics of the first microstructure caused by changes in thermal expansion or contraction can be compensated for.

    摘要翻译: 微机电装置包括半导体衬底,其中第一微结构和第二参考微结构被集成。 第一微结构和第二微结构被布置在基板中,以便由于基板的热膨胀而产生相等的应变。 此外,第一微结构相对于基板设置有可移动部件和固定部件,而第二微结构具有与第一微结构基本对称的形状,但是相对于基板固定。 通过从第一微结构的电特性减去第一微结构的电特性的变化,可以补偿由热膨胀或收缩的变化引起的第一微结构的电特性的变化。

    Composite sensor and electronic device
    34.
    发明授权
    Composite sensor and electronic device 有权
    复合传感器和电子装置

    公开(公告)号:US08733169B2

    公开(公告)日:2014-05-27

    申请号:US13687575

    申请日:2012-11-28

    发明人: Masahiro Oshio

    IPC分类号: G01P1/02

    摘要: A composite sensor includes: a package including a container and a lid; a plurality of spaces that is partitioned by at least the container and the lid, and has different pressures, the plurality of the spaces including a first space sealed at around an atmospheric pressure and a second space sealed at a depressurized state; an acceleration sensor element disposed in the first space; and a vibration type angular velocity sensor element disposed in the second space. In the sensor, the first space has a volume smaller than a volume of the second space.

    摘要翻译: 复合传感器包括:包括容器和盖子的包装件; 多个空间,其至少由所述容器和所述盖分隔,并且具有不同的压力,所述多个空间包括在大气压附近密封的第一空间和在减压状态下密封的第二空间; 设置在所述第一空间中的加速度传感器元件; 以及设置在所述第二空间中的振动型角速度传感器元件。 在传感器中,第一空间的体积小于第二空间的体积。

    TRI-AXIAL MEMS INERTIAL SENSOR
    35.
    发明申请
    TRI-AXIAL MEMS INERTIAL SENSOR 审中-公开
    三轴MEMS惯性传感器

    公开(公告)号:US20140090468A1

    公开(公告)日:2014-04-03

    申请号:US13844956

    申请日:2013-03-16

    发明人: Yee-Chung Fu

    IPC分类号: B81B3/00 G01P15/14

    摘要: A micro-electromechanical systems (MEMS) inertial sensor includes first, second, and third fixed electrodes, a first translational element to translate along a first direction, first mobile electrodes extending from the first translation element and being interdigitated with the first fixed electrodes to form first sensor assemblies, a second translation element to translate along a second direction, second mobile electrodes extending from the second translation element and being interdigitated with the second fixed electrodes to form second sensor assemblies, and a rotation element to rotate about the second direction, the rotation element having a surface opposite the third fixed electrodes to form third sensor assemblies, wherein the third fixed electrode being displaced from the surface of the rotation element along a third direction.

    摘要翻译: 微机电系统(MEMS)惯性传感器包括第一固定电极,第二固定电极和第三固定电极,沿着第一方向平移的第一平移元件,从第一平移元件延伸并与第一固定电极交叉的第一移动电极,以形成 第一传感器组件,沿着第二方向平移的第二平移元件,从第二平移元件延伸并与第二固定电极交叉的第二移动电极,以形成第二传感器组件;以及围绕第二方向旋转的旋转元件, 旋转元件具有与第三固定电极相对的表面,以形成第三传感器组件,其中第三固定电极沿着第三方向从旋转元件的表面移位。

    MEMS INERTIAL SENSOR AND FORMING METHOD THEREFOR
    36.
    发明申请
    MEMS INERTIAL SENSOR AND FORMING METHOD THEREFOR 有权
    MEMS惯性传感器及其形成方法

    公开(公告)号:US20130340526A1

    公开(公告)日:2013-12-26

    申请号:US14004838

    申请日:2012-02-23

    申请人: Lianjun Liu

    发明人: Lianjun Liu

    IPC分类号: G01P15/125 B81C1/00

    摘要: A MEMS inertial sensor, may include a movable sensitive element; and second substrate and a third substrate. The movable sensitive element may be formed by using a first substrate which may be formed of a monocrystalline semiconductor material. The first substrate may include a first surface and a second surface which are opposite to each other. One or more conductive layers may be formed on the first surface of the first substrate The second substrate may be coupled to a surface of the one or more conductive layer on the first substrate. The third substrate may be coupled to the second surface of the first substrate. The third substrate and the second substrate are respectively arranged on two opposite sides of the movable sensitive element.

    摘要翻译: MEMS惯性传感器可以包括可移动敏感元件; 第二基板和第三基板。 可移动敏感元件可以通过使用可以由单晶半导体材料形成的第一衬底来形成。 第一基板可以包括彼此相对的第一表面和第二表面。 一个或多个导电层可以形成在第一衬底的第一表面上。第二衬底可以耦合到第一衬底上的一个或多个导电层的表面。 第三衬底可以耦合到第一衬底的第二表面。 第三基板和第二基板分别布置在可移动敏感元件的两个相对侧上。

    Method and structure for forming a gyroscope and accelerometer
    37.
    发明授权
    Method and structure for forming a gyroscope and accelerometer 失效
    用于形成陀螺仪和加速度计的方法和结构

    公开(公告)号:US08530259B2

    公开(公告)日:2013-09-10

    申请号:US13480351

    申请日:2012-05-24

    IPC分类号: H01L21/00

    摘要: A method for fabricating a micro electromechanical device includes providing a first substrate including control circuitry. The first substrate has a top surface and a bottom surface. The method also includes forming an insulating layer on the top surface of the first substrate, removing a first portion of the insulating layer so as to form a plurality of standoff structures, and bonding a second substrate to the first substrate. The method further includes thinning the second substrate to a predetermined thickness and forming a plurality of trenches in the second substrate. Each of the plurality of trenches extends to the top surface of the first substrate. Moreover, the method includes filling at least a portion of each of the plurality of trenches with a conductive material, forming the micro electromechanical device in the second substrate, and bonding a third substrate to the second substrate.

    摘要翻译: 一种用于制造微机电装置的方法包括提供包括控制电路的第一基板。 第一衬底具有顶表面和底表面。 该方法还包括在第一衬底的顶表面上形成绝缘层,去除绝缘层的第一部分以形成多个间隔结构,并将第二衬底接合到第一衬底。 该方法还包括将第二衬底稀薄至预定厚度,并在第二衬底中形成多个沟槽。 多个沟槽中的每一个延伸到第一衬底的顶表面。 此外,该方法包括用导电材料填充多个沟槽中的每一个的至少一部分,在第二衬底中形成微机电器件,以及将第三衬底接合到第二衬底。

    SUSPENDED MASSES IN MICRO-MECHANICAL DEVICES
    38.
    发明申请
    SUSPENDED MASSES IN MICRO-MECHANICAL DEVICES 有权
    微机械装置中的悬挂质量

    公开(公告)号:US20130205901A1

    公开(公告)日:2013-08-15

    申请号:US13370555

    申请日:2012-02-10

    申请人: Brian D. Homeijer

    发明人: Brian D. Homeijer

    IPC分类号: G01P15/12 H01L21/02

    摘要: The micro-mechanical device includes a substrate with an internal cavity, a first surface, and an opposing second surface. A first trench is formed from the first surface of the substrate into the internal cavity. The first trench at least partially defines flexures. A second trench is formed from the second surface of the substrate into the internal cavity and at least partially defines a suspended mass. The suspended mass is connected by the flexures to the substrate.

    摘要翻译: 微机械装置包括具有内腔的基板,第一表面和相对的第二表面。 第一沟槽从衬底的第一表面形成到内腔中。 第一沟槽至少部分地限定弯曲。 第二沟槽从衬底的第二表面形成到内部空腔中并且至少部分地限定悬浮质量。 悬浮质量通过挠曲件连接到基底。

    Micromechanical structure and method for manufacturing a micromechanical structure
    39.
    发明授权
    Micromechanical structure and method for manufacturing a micromechanical structure 有权
    微机械结构的微机械结构和制造方法

    公开(公告)号:US08443671B2

    公开(公告)日:2013-05-21

    申请号:US12924641

    申请日:2010-10-01

    IPC分类号: G01P15/125

    摘要: A micromechanical structure includes: a substrate; a seismic mass movable relative to the substrate along a first direction parallel to a main plane of extension of the substrate; a first electrode structure is connected to the substrate; and a second electrode structure connected to the substrate. The seismic mass includes a counterelectrode structure having finger electrodes situated between first finger electrodes of the first electrode structure and second finger electrodes of the second electrode structure, along the first direction. The first electrode structure is fastened to the substrate by a first anchoring element in a central region of the micromechanical structure, and the second electrode structure is anchored to the substrate by a second anchoring element situated in the central region.

    摘要翻译: 微机械结构包括:基板; 沿着平行于所述基板的延伸主平面的第一方向相对于所述基板移动的地震质量块; 第一电极结构连接到基板; 以及与基板连接的第二电极结构。 地震质量包括沿着第一方向具有位于第一电极结构的第一指状电极和第二电极结构的第二指状电极之间的指状电极的反电极结构。 第一电极结构通过微机电结构的中心区域中的第一锚定元件紧固到基板,并且第二电极结构通过位于中心区域中的第二锚定元件锚定到基板。

    MEMS TUNNELING ACCELEROMETER
    40.
    发明申请
    MEMS TUNNELING ACCELEROMETER 有权
    MEMS隧道式加速度计

    公开(公告)号:US20130118257A1

    公开(公告)日:2013-05-16

    申请号:US13736853

    申请日:2013-01-08

    申请人: TiaLinx, Inc.

    IPC分类号: G01P15/08

    摘要: A tunneling accelerometer includes a proof mass that moves laterally with respect to a cap wafer. Either the proof mass or the cap wafer includes a plurality of tunneling tips such that the remaining one of proof mass and the cap wafer includes a corresponding plurality of counter electrodes. The tunneling current flowing between the tunneling tips and the counter electrodes will thus vary as the proof mass laterally displaces in response to an applied acceleration.

    摘要翻译: 隧道加速度计包括相对于盖晶片横向移动的检验质量块。 检测质量块或盖片晶片都包括多个隧道尖端,使得剩余的一个检测质量块和盖片晶片包括相应的多个对电极。 因此,隧道尖端和对置电极之间流动的隧穿电流将随着检测质量响应于所施加的加速度而横向移位而变化。