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公开(公告)号:US20160211267A1
公开(公告)日:2016-07-21
申请号:US15083364
申请日:2016-03-29
Applicant: Semiconductor Energy Laboratory Co., Ltd.
Inventor: Tomoaki ATSUMI , Takashi OKUDA
IPC: H01L27/112 , H01L27/06 , H01L29/78 , H01L27/12 , H01L29/16 , H01L29/786 , H01L27/108
CPC classification number: H01L21/76801 , H01L21/76826 , H01L27/0688 , H01L27/10805 , H01L27/1085 , H01L27/10873 , H01L27/10897 , H01L27/112 , H01L27/1156 , H01L27/1207 , H01L27/1225 , H01L29/16 , H01L29/78 , H01L29/7869
Abstract: Probability of malfunction of a semiconductor storage device is reduced. A shielding layer is provided between a memory cell array (e.g., a memory cell array including a transistor formed using an oxide semiconductor material) and a peripheral circuit (e.g., a peripheral circuit including a transistor formed using a semiconductor substrate), which are stacked. With this structure, the memory cell array and the peripheral circuit can be shielded from radiation noise generated between the memory cell array and the peripheral circuit. Thus, probability of malfunction of the semiconductor storage device can be reduced.
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42.
公开(公告)号:US20160094236A1
公开(公告)日:2016-03-31
申请号:US14862284
申请日:2015-09-23
Applicant: Semiconductor Energy Laboratory Co., LTD.
Inventor: Yutaka SHIONOIRI , Kiyoshi KATO , Tomoaki ATSUMI
CPC classification number: H03M1/002 , G11C27/02 , H03M1/1245 , H03M1/466
Abstract: An object is to reduce power consumption of an analog-digital converter circuit. An analog potential obtained in a sensor or the like is held in a sample-and-hold circuit including a transistor with an extremely low off-state current. In the sample-and-hold circuit, the analog potential is held in a node which is able to hold a charge by turning off the transistor. Then, power supply to a buffer circuit or the like included in the sample-and-hold circuit is stopped to reduce power consumption. In a structure where a potential is held in each node, power consumption can be further reduced when a transistor with an extremely low off-state current is connected to a node holding a potential of a comparator, a successive approximation register, a digital-analog converter circuit, or the like, and power supply to these circuits is stopped.
Abstract translation: 目的是减少模数转换器电路的功耗。 在传感器等中获得的模拟电位保持在包括极低截止电流的晶体管的采样保持电路中。 在采样保持电路中,模拟电位保持在能够通过关断晶体管来保持电荷的节点。 然后,停止对包含在取样保持电路中的缓冲电路等的电力供给,以降低功耗。 在每个节点中保持电位的结构中,当具有非常低的截止电流的晶体管连接到保持比较器的电位的节点,逐次逼近寄存器,数字模拟 转换器电路等,停止对这些电路的供电。
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公开(公告)号:US20150349131A1
公开(公告)日:2015-12-03
申请号:US14723630
申请日:2015-05-28
Applicant: Semiconductor Energy Laboratory Co., Ltd.
Inventor: Tomoaki ATSUMI , Yoshiyuki KOBAYASHI , Yutaka SHIONOIRI , Yuto YAKUBO , Shuhei NAGATSUKA , Shunpei YAMAZAKI
IPC: H01L29/786 , H01L27/12 , H01L29/04 , H01L29/24
CPC classification number: H01L29/7869 , G05F3/262 , H01L27/085 , H01L27/0886 , H01L27/1211 , H01L27/1225 , H01L27/124 , H01L29/045 , H01L29/0673 , H01L29/1606 , H01L29/2003 , H01L29/24 , H01L29/66439 , H01L29/66795 , H01L29/7782 , H01L29/785 , H01L29/78648 , H01L29/78696
Abstract: A semiconductor device which occupies a small area is provided. A semiconductor device includes a resistor. The resistor includes a transistor. The increase rate of a drain current of the transistor with a 0.1 V change in drain voltage is preferably higher than or equal to 1% when the drain voltage is higher than a difference between a gate voltage and a threshold voltage of the transistor. The semiconductor device has a function of generating a voltage based on the resistance of the resistor.
Abstract translation: 提供占据小面积的半导体器件。 半导体器件包括电阻器。 电阻器包括晶体管。 当漏极电压高于晶体管的栅极电压和阈值电压之间的差时,漏极电压的0.1V变化的晶体管的漏极电流的增加率优选地高于或等于1%。 半导体器件具有基于电阻器的电阻产生电压的功能。
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公开(公告)号:US20150255139A1
公开(公告)日:2015-09-10
申请号:US14637542
申请日:2015-03-04
Applicant: Semiconductor Energy Laboratory Co., Ltd.
Inventor: Tomoaki ATSUMI , Shuhei NAGATSUKA , Tamae MORIWAKA , Yuta ENDO
IPC: G11C11/24 , H01L27/115 , H01L27/12 , H01L29/24 , H01L29/786
CPC classification number: H01L27/115 , G11C7/16 , G11C8/14 , G11C11/24 , G11C11/403 , G11C11/4085 , H01L27/0688 , H01L27/11551 , H01L27/1156 , H01L29/24 , H01L29/7869
Abstract: [Problem] To provide a semiconductor device suitable for miniaturization. To provide a highly reliable semiconductor device. To provide a semiconductor device with improved operating speed.[Solving Means] A semiconductor device including a memory cell including first to cth (c is a natural number of 2 or more) sub memory cells, wherein: the jth sub memory cell includes a first transistor, a second transistor, and a capacitor; a first semiconductor layer included in the first transistor and a second semiconductor layer included in the second transistor include an oxide semiconductor; one of terminals of the capacitor is electrically connected to a gate electrode included in the second transistor; the gate electrode included in the second transistor is electrically connected to one of a source electrode and a drain electrode which are included in the first transistor; and when j≧2, the jth sub memory cell is arranged over the j−1th sub memory cell.
Abstract translation: 提供适于小型化的半导体器件。 提供高度可靠的半导体器件。 提供具有改善的操作速度的半导体器件。 [解决方案]一种半导体器件,包括第一至第C(c是2个或更多个的自然数)子存储单元的存储单元,其中:第j子存储单元包括第一晶体管,第二晶体管和电容器; 包括在第一晶体管中的第一半导体层和包括在第二晶体管中的第二半导体层包括氧化物半导体; 电容器的端子之一电连接到包括在第二晶体管中的栅电极; 包括在第二晶体管中的栅电极电连接到包括在第一晶体管中的源电极和漏极之一; 并且当j≥2时,第j个子存储单元布置在第j-1个子存储单元上。
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公开(公告)号:US20240164166A1
公开(公告)日:2024-05-16
申请号:US18279925
申请日:2022-02-28
Applicant: Semiconductor Energy Laboratory Co., Ltd.
Inventor: Daisuke KUBOTA , Taisuke KAMADA , Akio YAMASHITA , Kenichi OKAZAKI , Koji KUSUNOKI , Tomoaki ATSUMI
IPC: H10K59/35 , G09G3/3225 , H10K39/34
CPC classification number: H10K59/353 , G09G3/3225 , H10K39/34 , G09G2300/0452 , G09G2300/0842 , G09G2310/08
Abstract: A semiconductor device having a light detection function and including a high-resolution display portion is provided. The semiconductor device is a display apparatus including a light-emitting device, a light-receiving device, and a substrate. The light-emitting device includes a first electrode, a light-emitting layer, a first electron-transport layer, an electron-injection layer, and a second electrode stacked in this order over the substrate. The light-receiving device includes a third electrode, an active layer, a first hole-transport layer, the electron-injection layer, and the second electrode stacked in this order over the substrate. The first electrode is supplied with a first potential. The second electrode is preferably supplied with a second potential lower than the first potential. The third electrode is preferably supplied with a third potential higher than the second potential.
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公开(公告)号:US20240088162A1
公开(公告)日:2024-03-14
申请号:US18519294
申请日:2023-11-27
Applicant: Semiconductor Energy Laboratory Co., Ltd.
Inventor: Shunpei YAMAZAKI , Kiyoshi KATO , Tomoaki ATSUMI
CPC classification number: H01L27/1225 , H01L27/1255 , H10B12/20
Abstract: A novel semiconductor device formed with single-polarity circuits using OS transistors is provided. Thus, connection between different layers in a memory circuit is unnecessary. This can reduce the number of connection portions and improve the flexibility of circuit layout and the reliability of the OS transistors. In particular, many memory cells are provided; thus, the memory cells are formed with single-polarity circuits, whereby the number of connection portions can be significantly reduced. Further, by providing a driver circuit in the same layer as the cell array, many wirings for connecting the driver circuit and the cell array can be prevented from being provided between layers, and the number of connection portions can be further reduced. An interposer provided with a plurality of integrated circuits can function as one electronic component.
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47.
公开(公告)号:US20220035980A1
公开(公告)日:2022-02-03
申请号:US17299654
申请日:2019-11-20
Applicant: SEMICONDUCTOR ENERGY LABORATORY CO., LTD.
Inventor: Hitoshi KUNITAKE , Kazuki TSUDA , Tatsuki KOSHIDA , Takeya HIROSE , Tomoaki ATSUMI
IPC: G06F30/367
Abstract: A transistor model that achieves precise approximation of transistor electrical characteristics is provided. The transistor model is a field-effect transistor model. A first capacitor is provided between a gate and a source. A second capacitor is provided between the gate and a drain. Each of the first capacitor and the second capacitor is a non-linear capacitor whose capacitance value is determined depending on a gate voltage. The first capacitor may be composed of a plurality of variable capacitors. The second capacitor may be composed of a plurality of variable capacitors. When CV characteristics of the first capacitor and CV characteristics of the second capacitor are adjusted, more precise simulation data is obtained.
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公开(公告)号:US20210384228A1
公开(公告)日:2021-12-09
申请号:US17400264
申请日:2021-08-12
Applicant: Semiconductor Energy Laboratory Co., Ltd.
Inventor: Shunpei YAMAZAKI , Kiyoshi KATO , Tomoaki ATSUMI
IPC: H01L27/12 , H01L27/108
Abstract: A novel semiconductor device formed with single-polarity circuits using OS transistors is provided. Thus, connection between different layers in a memory circuit is unnecessary. This can reduce the number of connection portions and improve the flexibility of circuit layout and the reliability of the OS transistors. In particular, many memory cells are provided; thus, the memory cells are formed with single-polarity circuits, whereby the number of connection portions can be significantly reduced. Further, by providing a driver circuit in the same layer as the cell array, many wirings for connecting the driver circuit and the cell array can be prevented from being provided between layers, and the number of connection portions can be further reduced. An interposer provided with a plurality of integrated circuits can function as one electronic component.
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公开(公告)号:US20210367078A1
公开(公告)日:2021-11-25
申请号:US16975309
申请日:2019-02-21
Applicant: SEMICONDUCTOR ENERGY LABORATORY CO., LTD.
Inventor: Shunpei YAMAZAKI , Kiyoshi KATO , Tomoaki ATSUMI , Shuhei NAGATSUKA , Hitoshi KUNITAKE , Yoko TSUKAMOTO
IPC: H01L29/786 , H01L29/24 , H01L29/66
Abstract: A semiconductor device in which an electrification phenomenon that leads to characteristic fluctuations, element deterioration, abnormality in shape, or dielectric breakdown is inhibited is provided.
The semiconductor device includes a first region and a second region over the same plane. The first region includes a transistor. The second region includes a dummy transistor. The transistor includes a first wiring layer, a semiconductor layer including an oxide and provided above the first wiring layer, a second wiring layer provided above the semiconductor layer, and a third wiring layer provided above the second wiring layer. The dummy transistor has the same area as one or more selected from the first wiring layer, the second wiring layer, the semiconductor layer, and the third wiring layer.-
公开(公告)号:US20200336066A1
公开(公告)日:2020-10-22
申请号:US16849339
申请日:2020-04-15
Applicant: Semiconductor Energy Laboratory Co., Ltd.
Inventor: Shunpei YAMAZAKI , Tatsuji NISHIJIMA , Hidetomo KOBAYASHI , Tomoaki ATSUMI , Kiyoshi KATO
IPC: H02M3/156 , G05B19/048 , G06F1/32 , G01R19/00 , G08B26/00 , G08B29/18 , H04L12/28 , H02M3/158 , G01D4/00 , H04B1/16 , G05B15/02
Abstract: Provided is a structure which is capable of central control of an electric device and a sensor device and a structure which can reduce power consumption of an electric device and a sensor device. A central control system includes at least a central control device, an output unit, and an electric device or a sensor device. The central control device performs arithmetic processing on information transmitted from the electric device or the sensor device and makes the output unit output information obtained by the arithmetic processing. It is possible to know the state of the electric device or the sensor device even apart from the electric device or the sensor device. The electric device or the sensor device includes a transistor which includes an activation layer using a semiconductor with the band gap wider than that of single crystal silicon.
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