Genes for improving salt tolerance and drought tolerance of plant and the uses thereof
    61.
    发明授权
    Genes for improving salt tolerance and drought tolerance of plant and the uses thereof 有权
    用于改善植物耐盐性和耐旱性的基因及其用途

    公开(公告)号:US08153861B2

    公开(公告)日:2012-04-10

    申请号:US12739168

    申请日:2007-11-09

    IPC分类号: A01H5/00 C12N15/82

    摘要: A gene comprising the nucleic acid sequence of SEQ ID NO:1 and another gene comprising the nucleic acid sequence of SEQ ID NO:2, the latter being artificially synthesized according to plant preferred codons. Both genes encode a protein having the amino acid sequence of SEQ ID NO:3. Also provided are recombinant vectors containing each of the genes and host cells transformed with the recombinant vectors. The host cells can be prokaryotic cells [[and]] or eukaryotic cells. The transgenic plants comprising the gene having the nucleic acid sequence of SEQ ID NO:2 show improved salt and drought tolerance after the [[said]] gene is expressed in the transgenic plants.

    摘要翻译: 包含SEQ ID NO:1的核酸序列的基因和包含SEQ ID NO:2的核酸序列的另一个基因,后者是根据植物优选的密码子人工合成的。 两种基因都编码具有SEQ ID NO:3的氨基酸序列的蛋白质。 还提供了含有用重组载体转化的每个基因和宿主细胞的重组载体。 宿主细胞可以是原核细胞[和]或真核细胞。 包含具有SEQ ID NO:2的核酸序列的基因的转基因植物在转基因植物中表达[[所述]]基因后显示改善的盐和耐旱性。

    System and Method for SSS Detection Under Carrier Frequency Offset in an Orthogonal Frequency-Division Multiple Access Downlink Channel
    63.
    发明申请
    System and Method for SSS Detection Under Carrier Frequency Offset in an Orthogonal Frequency-Division Multiple Access Downlink Channel 有权
    正交频分多址下行链路信道载波频偏下的SSS检测系统与方法

    公开(公告)号:US20110255394A1

    公开(公告)日:2011-10-20

    申请号:US12763482

    申请日:2010-04-20

    IPC分类号: H04J11/00 H04K1/10

    摘要: A system and method for SSS detection under carrier frequency offset in an orthogonal frequency-division multiple access (OFDMA) downlink channel. A processor receives a signal sample that includes a transmission on a primary synchronization signal (PSS) and a transmission on a one secondary synchronization signal (SSS). The processor determines a correlation “P” of a first symbol transmitted in the PSS of the signal sample to a first known symbol at each time “t” of time increments k of the signal sample and a correlation “S” of a second symbol transmitted in the a SSS to a second known symbol at each time t-.5/7msecs. The processor receives a candidate phase rotation of θi from a set of “i” candidates and determines a correlation “Cmax” over the time increments k representing a maximum amplitude of a combined correlation of S and P, with P rotated by θi. The processor determines the cell identifier from the first and second known symbols that produced S and P of C max and an estimation of the frequency offset between a transmitter of the signal sample and a receiver of the signal sample.

    摘要翻译: 一种用于在正交频分多址(OFDMA)下行链路信道中的载波频率偏移下的SSS检测的系统和方法。 处理器接收包括主同步信号(PSS)上的传输和一个次同步信号(SSS)上的传输的信号样本。 处理器在信号样本的时间增量k的每个时间“t”处确定在信号样本的PSS中发送的第一符号与第一已知符号的相关“P”,并且发送的第二符号的相关“S” 在SSS到第二个已知的符号,每次t-.5 / 7msecs。 处理器从一组“i”候选者接收候选相位旋转; i从一组“i”个候选中接收相对“Cmax”,并且确定S表示S和P的组合相关的最大振幅的时间增量k与P旋转的相关“Cmax”。 一世。 处理器根据产生C max的S和P的第一和第二已知符号以及信号样本的发射机与信号样本的接收机之间的频率偏移的估计来确定小区标识符。

    Reference circuit with reduced current startup
    64.
    发明授权
    Reference circuit with reduced current startup 有权
    具有降低电流启动的参考电路

    公开(公告)号:US08022686B2

    公开(公告)日:2011-09-20

    申请号:US12436344

    申请日:2009-05-06

    IPC分类号: G05F3/16 G05F1/46

    CPC分类号: G05F3/30 Y10S323/901

    摘要: An apparatus is provided. The apparatus comprises a reference circuit and a startup circuit. The reference circuit is adapted to provide a startup current, while the startup circuit receives the startup current and outputs an output voltage. The startup circuit includes a current mirror, a first NMOS transistor, a second NMOS transistor, diodes, and a third NMOS transistor, and a control circuit. The first and second NMOS transistors are coupled to the current mirror at their sources and are coupled to one another and to the reference circuit at their gates. The diodes are coupled between the gate of the second NMOS transistor and the source of the second NMOS transistor, and the third NMOS transistor is coupled to the source of the second NMOS transistor at its gate (which also provides the output voltage at its source). The control circuit is then coupled to the drains of the first and second NMOS transistors.

    摘要翻译: 提供了一种装置。 该装置包括参考电路和启动电路。 参考电路适于提供启动电流,而启动电路接收启动电流并输出输出电压。 启动电路包括电流镜,第一NMOS晶体管,第二NMOS晶体管,二极管和第三NMOS晶体管,以及控制电路。 第一和第二NMOS晶体管在其源极处耦合到电流镜,并在它们的栅极处彼此耦合到参考电路。 二极管耦合在第二NMOS晶体管的栅极和第二NMOS晶体管的源极之间,并且第三NMOS晶体管在其栅极处耦合到第二NMOS晶体管的源极(其也在其源极处提供输出电压) 。 然后将控制电路耦合到第一和第二NMOS晶体管的漏极。

    Integrated circuit system employing sacrificial spacers
    66.
    发明授权
    Integrated circuit system employing sacrificial spacers 有权
    采用牺牲间隔物的集成电路系统

    公开(公告)号:US07892900B2

    公开(公告)日:2011-02-22

    申请号:US12098751

    申请日:2008-04-07

    摘要: An integrated circuit system that includes: providing a substrate including a first device and a second device; configuring the first device and the second device to include a first spacer, a first liner made from a first dielectric layer, and a second spacer made from a sacrificial spacer material; forming a second dielectric layer over the integrated circuit system; forming a first device source/drain and a second device source/drain adjacent the second spacer and through the second dielectric layer; removing the second spacer without damaging the substrate; forming a third dielectric layer over the integrated circuit system before annealing; and forming a fourth dielectric layer over the integrated circuit system that promotes stress within the channel of the first device, the second device, or a combination thereof.

    摘要翻译: 一种集成电路系统,包括:提供包括第一装置和第二装置的基板; 配置第一器件和第二器件以包括第一间隔物,由第一介电层制成的第一衬垫和由牺牲间隔物材料制成的第二间隔物; 在所述集成电路系统上形成第二电介质层; 形成第一器件源极/漏极和邻近第二间隔物并通过第二介电层的第二器件源极/漏极; 去除所述第二间隔物而不损坏所述基底; 在退火之前在集成电路系统上形成第三电介质层; 以及在所述集成电路系统上形成促进所述第一装置,所述第二装置或其组合的通道内的应力的第四电介质层。

    Method and Apparatus for Improving SIP Parse Performance
    69.
    发明申请
    Method and Apparatus for Improving SIP Parse Performance 有权
    提高SIP解析性能的方法和装置

    公开(公告)号:US20100070633A1

    公开(公告)日:2010-03-18

    申请号:US12446982

    申请日:2007-10-23

    IPC分类号: G06F15/16

    摘要: The present invention discloses a method and an apparatus for improving SIP parse performance. The method comprising the steps of: receiving a text-based SIP message to be sent to a SIP server; according to a SIP message filter table, determining whether the text-based SIP message needs to be transformed to a token-based message; and in the case that the text-based SIP message needs to be transformed to a token-based message, performing the transformation and sending the transformed token-based message to said SIP server, otherwise directly sending the text-based SIP message to said SIP server. According to the present invention, larger SIP message throughput in a SIP server and better utilization of resources of a front end device can be achieved.

    摘要翻译: 本发明公开了一种改进SIP解析性能的方法和装置。 该方法包括以下步骤:接收要发送到SIP服务器的基于文本的SIP消息; 根据SIP消息过滤表,确定是否需要将基于文本的SIP消息转换为基于令牌的消息; 并且在基于文本的SIP消息需要被转换为基于令牌的消息的情况下,执行变换并将所变换的基于令牌的消息发送到所述SIP服务器,否则直接将基于文本的SIP消息发送到所述SIP 服务器。 根据本发明,可以实现SIP服务器中更大的SIP消息吞吐量以及更好地利用前端设备的资源。

    DUAL CARBON NANOTUBES FOR CRITICAL DIMENSION METROLOGY ON HIGH ASPECT RATIO SEMICONDUCTOR WAFER PATTERNS
    70.
    发明申请
    DUAL CARBON NANOTUBES FOR CRITICAL DIMENSION METROLOGY ON HIGH ASPECT RATIO SEMICONDUCTOR WAFER PATTERNS 失效
    用于高比例半导体波形图的关键尺寸方程的双碳纳米管

    公开(公告)号:US20090113739A1

    公开(公告)日:2009-05-07

    申请号:US11933619

    申请日:2007-11-01

    申请人: Wei Lu

    发明人: Wei Lu

    IPC分类号: G01B5/14 D01F9/12 H01J37/30

    CPC分类号: G01Q60/38 G01Q70/12

    摘要: A probe capable of measuring recesses in features such as apertures and/or trench-like structures of very small size is comprised of one or more carbon nanotubes (CNTs) which is oriented at an angle and, if two or more CNTs are employed, such that they cross (with or without touching each other) at a location separated from ends of the carbon nanotubes which approximates the depth of the aperture or trench-like structure and at an angle such that the ends of the carbon nanotubes extends by a lateral distance greater than a dimension of a recess of a feature to be measured or in excess of a sidewall angle or an angle of a crystal lattice of a material in which a feature to be measured is formed.

    摘要翻译: 能够测量诸如孔和/或非常小尺寸的沟槽状结构的特征中的凹部的探针由一个或多个碳纳米管(CNT)构成,其一角度定向,并且如果采用两个或更多个CNT,则 它们在与碳纳米管的端部分开的位置处交叉(有或者没有彼此接触),其接近孔径或沟槽状结构的深度并且以一定角度使得碳纳米管的端部延伸横向距离 大于要测量的特征的凹部的尺寸或超过其中形成要测量的特征的材料的晶格的侧壁角或角度的尺寸。