Programmable pulse generator using inverter chain
    83.
    发明授权
    Programmable pulse generator using inverter chain 有权
    可编程脉冲发生器采用逆变链

    公开(公告)号:US08669784B1

    公开(公告)日:2014-03-11

    申请号:US13448176

    申请日:2012-04-16

    Applicant: Kai Wu

    Inventor: Kai Wu

    CPC classification number: H03K5/05

    Abstract: In one embodiment, a method includes generating a first signal based on a clock signal and generating a second signal based on a programmable delayed clock signal. The method then generates a reset signal based on the first signal and the second signal. The clock signal is delayed using an inverter chain to generate a delayed version of the clock signal. An output signal is generated based on the delayed version of the clock signal and the reset signal. When a pulse width of the output signal is greater than a data duration determined from the clock signal, the pulse width of the output signal is reset to the pulse width of the data duration.

    Abstract translation: 在一个实施例中,一种方法包括基于时钟信号产生第一信号并基于可编程延迟时钟信号产生第二信号。 该方法然后基于第一信号和第二信号产生复位信号。 使用反相器链延迟时钟信号以产生时钟信号的延迟版本。 基于延迟版本的时钟信号和复位信号产生输出信号。 当输出信号的脉冲宽度大于从时钟信号确定的数据持续时间时,输出信号的脉冲宽度被重置为数据持续时间的脉冲宽度。

    ENZYMATIC SIGNAL GENERATION AND DETECTION OF BINDING COMPLEXES IN STATIONARY FLUIDIC CHIP
    84.
    发明申请
    ENZYMATIC SIGNAL GENERATION AND DETECTION OF BINDING COMPLEXES IN STATIONARY FLUIDIC CHIP 有权
    固定信号生成和检测固定液流芯片中的结合复合物

    公开(公告)号:US20120322683A1

    公开(公告)日:2012-12-20

    申请号:US13543488

    申请日:2012-07-06

    Abstract: An embodiment of the invention relates to a device for detecting an analyte in a sample. The device comprises a fluidic network and an integrated circuitry component. The fluidic network comprises a sample zone, a cleaning zone and a detection zone. The fluidic network contains a magnetic particle and/or a signal particle. A sample containing an analyte is introduced, and the analyte interacts with the magnetic particle and/or the signal particle through affinity agents. A microcoil array or a mechanically movable permanent magnet is functionally coupled to the fluidic network, which are activatable to generate a magnetic field within a portion of the fluidic network, and move the magnetic particle from the sample zone to the detection zone. A detection element is present which detects optical or electrical signals from the signal particle, thus indicating the presence of the analyte.

    Abstract translation: 本发明的一个实施例涉及用于检测样品中的分析物的装置。 该装置包括流体网络和集成电路部件。 流体网络包括样品区,清洁区和检测区。 流体网络包含磁性颗粒和/或信号颗粒。 引入含有分析物的样品,并且分析物通过亲和试剂与磁性颗粒和/或信号颗粒相互作用。 微线圈阵列或机械可移动永磁体在功能上耦合到流体网络,流体网络可激活以在流体网络的一部分内产生磁场,并将磁性颗粒从样品区域移动到检测区域。 存在检测元件,其检测来自信号颗粒的光学或电信号,从而指示分析物的存在。

    Atomic layer deposition of tungsten materials
    86.
    发明授权
    Atomic layer deposition of tungsten materials 有权
    原子层沉积钨材料

    公开(公告)号:US08211799B2

    公开(公告)日:2012-07-03

    申请号:US13160378

    申请日:2011-06-14

    Abstract: Embodiments of the invention provide a method for depositing tungsten-containing materials. In one embodiment, a method includes forming a tungsten nucleation layer over an underlayer disposed on the substrate while sequentially providing a tungsten precursor and a reducing gas into a process chamber during an atomic layer deposition (ALD) process and depositing a tungsten bulk layer over the tungsten nucleation layer, wherein the reducing gas contains hydrogen gas and a hydride compound (e.g., diborane) and has a hydrogen/hydride flow rate ratio of about 500:1 or greater. In some examples, the method includes flowing the hydrogen gas into the process chamber at a flow rate within a range from about 1 slm to about 20 slm and flowing a mixture of the hydride compound and a carrier gas into the process chamber at a flow rate within a range from about 50 sccm to about 500 sccm.

    Abstract translation: 本发明的实施方案提供了一种沉积含钨材料的方法。 在一个实施例中,一种方法包括在设置在衬底上的底层上形成钨成核层,同时在原子层沉积(ALD)工艺期间依次提供钨前体和还原气体到处理室中,并在其上沉积钨体积层 钨成核层,其中所述还原气体包含氢气和氢化物化合物(例如乙硼烷),并且具有约500:1或更高的氢/氢化物流速比。 在一些实例中,该方法包括以约1slm至约20slm的流速将氢气流入处理室,并将氢化物化合物和载气的混合物以流速流动到处理室中 在约50sccm至约500sccm的范围内。

    METHOD FOR MONITORING THIN FILM DEPOSITION USING DYNAMIC INTERFEROMETER
    87.
    发明申请
    METHOD FOR MONITORING THIN FILM DEPOSITION USING DYNAMIC INTERFEROMETER 审中-公开
    使用动态干涉仪监测薄膜沉积的方法

    公开(公告)号:US20120140239A1

    公开(公告)日:2012-06-07

    申请号:US13152979

    申请日:2011-06-03

    Abstract: A method for real-time monitoring thin film deposition using a dynamic interferometer is revealed. An optical monitoring extracting the temporal phase change of the reflection coefficient of the deposition film stacks. The dynamic interferometer, which gets rid of the influence of vibration and air turbulence, was used in the method to directly detect fluctuating phase of a deposition film stack. Combing with the reflectance or transmittance measurements, the real-time reflection coefficient under normal incidence of monitoring light can be found as well as optical admittance for enhancing the error compensation of the thin film deposition.

    Abstract translation: 揭示了使用动态干涉仪实时监测薄膜沉积的方法。 提取沉积膜堆叠的反射系数的时间相位变化的光学监测。 用于直接检测沉积膜叠层波动相位的方法中,摆脱了振动和空气湍流影响的动态干涉仪。 配合反射率或透射率测量,可以发现在监控光的正常入射下的实时反射系数以及用于增强薄膜沉积的误差补偿的光学导纳。

    METHOD FOR MEASURING THE FILM ELEMENT USING OPTICAL MULTI-WAVELENGTH INTERFEROMETRY
    88.
    发明申请
    METHOD FOR MEASURING THE FILM ELEMENT USING OPTICAL MULTI-WAVELENGTH INTERFEROMETRY 审中-公开
    使用光学多波长干涉测量薄膜元件的方法

    公开(公告)号:US20120140235A1

    公开(公告)日:2012-06-07

    申请号:US13152902

    申请日:2011-06-03

    CPC classification number: G01B11/0675

    Abstract: A method for measuring the film element using optical multi-wavelength interferometry is revealed. The invention uses reflection coefficients of thin films at different wavelengths to measure the thickness and optical constants of thin films. The phase difference coming from the phase difference between test and reference surfaces is distinguished from the phase difference from the spatial path difference between reference and test beams by doing measurements on different wavelengths, because they change in different ways as the measuring wavelength changes. The phase is then acquired. Combining with the measured reflectance of thin film, the reflection coefficient of thin film is obtained. Collecting the reflection coefficients of each point, the thin film thickness and optical constants distribution in 2 dimensions are calculated. The surface profile is known through the spatial path differences between reference and test beams. These can be measured in a interferometer to avoid the vibration influence.

    Abstract translation: 揭示了使用光学多波长干涉测量法测量薄膜元件的方法。 本发明使用不同波长的薄膜的反射系数来测量薄膜的厚度和光学常数。 来自测试和参考表面之间的相位差的相位差通过对不同波长进行测量而与参考和测试光束之间的空间路径差的相位差进行区分,因为它们随着测量波长的变化而以不同的方式变化。 然后获得相位。 结合薄膜的测量反射率,得到薄膜的反射系数。 收集每个点的反射系数,计算二维的薄膜厚度和光学常数分布。 通过参考和测试光束之间的空间路径差异已知表面轮廓。 这些可以在干涉仪中测量,以避免振动的影响。

    BACKSHEET OF A SOLAR CELL
    90.
    发明申请
    BACKSHEET OF A SOLAR CELL 有权
    太阳能电池的背板

    公开(公告)号:US20100288342A1

    公开(公告)日:2010-11-18

    申请号:US12768125

    申请日:2010-04-27

    Applicant: Kai WU

    Inventor: Kai WU

    Abstract: The present invention discloses a backsheet of a solar cell. The backsheet of a solar cell comprises, sequentially from bottom to top, a bottom plastic layer, at least a first insulating layer, a conductive water-proof layer, at least a second insulating layer formed on the conductive water-proof layer, and a weather-resistant layer formed on the second insulating layer. The voltage-resistant ability of the weather-resistant layer is usually about one-third of that of the ordinary insulating layer and the weather-resistant layer is usually has the problem of pinhole which usually results in the defect of arc fail. Therefore, the second insulating layer, in the present invention, deposited between the conductive water-proof layer and the weather-resistant layer, can increase the voltage-resistant ability of the weather-resistant layer and to prevent the pinhole and the arc fail problem.

    Abstract translation: 本发明公开了一种太阳能电池的背板。 太阳能电池的底片从底部到顶部依次包括底部塑料层,至少第一绝缘层,导电防水层,至少形成在导电防水层上的第二绝缘层,以及 形成在第二绝缘层上的耐候层。 耐候层的耐电压性通常为普通绝缘层的约三分之一,耐候层通常存在针孔问题,这通常导致电弧缺陷的缺陷。 因此,本发明中的第二绝缘层沉积在导电性防水层与耐候层之间,能够提高耐候层的耐电压能力,防止针孔及电弧失效 。

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